TOOLS & TECHNIQUES UPDATE

Fluorescence lifetimes in a flash

HORIBA Jobin Yvon’s Fluorolog®-3 spectrofluorometer

accepts many types of detectors and gratings,

enabling automatic collection of excitation/emission

spectral matrices in the infrared (up to 1700 nm).

With the unification of SPEX® and IBH products,

frequency-domain data acquisition can now be

supplemented by time-domain acquisition in the

form of time-correlated single-photon counting

(TCSPC). This allows not just steady-state

measurements but also standard lifetime scans.

The standard photomultiplier tube is replaced with an

IBH TBX-04 detector. Besides the NanoLED series of

pulsed light-emitting diodes and laser sources

available in wavelengths from 375 nm to 830 nm,

an intense, broadband 450 W continuous-wave Xe

lamp and an IBH 5000F coaxial nanosecond flashlamp

can be attached to detect single-photon fluorescence.

Lifetimes can be obtained in seconds to minutes with

megahertz repetition rates.

Contact: www.jobinyvon.com

X-ray detectors bridge the MikroGap

Bruker AXS has launched the VÅNTEC series of

detectors for X-ray analytical applications. The

detectors use MikroGap™ technology, which

combines the advantages of gaseous detectors with

the benefits of solid-state detectors to provide low

detector noise with high dynamic range and spatial

resolution.

The VÅNTEC-1’s 50 mm x 16 mm active area gives

large angular coverage, allowing measurement in a

snap-shot rather than a classical diffractometer scan.

Single-photon counting gives a resolution of 100 ms.

The VÅNTEC-2000 has a 140 mm x 140 mm active

area. Featuring real-time data display, it suits

nondestructive nanotechnology investigations by

X-ray diffraction (XRD). It will sharpen the data in

applications such as small-angle X-ray scattering,

thin film investigations, and micro-XRD, where either

the X-rays are weakly scattered or a high dynamic

range needs to be covered and resolution is critical.

Contact: www.bruker-axs.de

Double-spectrograph spectrometer

The échelle spectrometer ARYELLE-Butterfly has been

introduced by LTB Lasertechnik Berlin for

simultaneous elemental analysis using laser-induced

plasma spectroscopy (LIPS). The instrument is based

on the compact échelle spectrograph ARYELLE, which

can generate spectra of relatively arbitrary

dimensions with high wavelength stability, spectral

resolution, and radiation throughput.

Spectra from two symmetrically arranged

spectrographs of similar design illuminate a shared

detector. The double-spectrograph spectrometer can

detect elements in the wavelength range

175-750 nm with spectral resolution of 35 000 in the

vacuum ultraviolet range and 15 000 in the

ultraviolet-visible-near-infrared range.

Contact: www.ltb-berlin.de

Particle analyzer shapes up

Building on its Sysmex FPIA-2100 flow cytometry-

based analyzer, Malvern Instruments’ new Sysmex

FPIA-3000 image-analysis system adds new features

and extends the range of applications for the fully

automated characterization of particle shape and size.

The standard configuration allows characterization of

particles in the range 1.5-160 µm. High- and low-

magnification options cover the ranges 0.8-80 µm

and 12-300 µm, respectively.

Sample volumes can be as low as 1 ml. Every particle

image is now stored for future reference and analysis.

The software allows access to new shape and size

parameters, such as particle width, length, aspect

ratio, and convexity, as well as improved threshold

control that allows more sensitive edge detection

(e.g. for transparent particles).

Contact: www.malvern.co.uk

April 2005 61

Nanolithography workbench

Raith has introduced the e-LiNE

electron-beam lithography system,

which can also expand into a virtual

‘nano-workbench’.

The field-emission electron optical

column, combined with a large

chamber and 4” laser

interferometer stage, provides high

resolution for imaging and ‘writing’

plus the ability to navigate and

place the beam with high accuracy.

The chamber has many ports and

feedthroughs for additional

instrumentation. Besides the basic

functions of imaging, lithography,

and metrology, options include gas

injectors for electron-beam induced

deposition (EBID), mechanical

probes for electrical test and

manipulation, X-ray microanalysis

(EDX), and an optical microscope.

Contact: www.raith.com

Upgrades for wafer analyzers

A series of upgrades is being

offered by PANalytical for its XRF

wafer analyzers. These include: a

new version of the SuperQ software

that enhances the user interface

and improves integration with

other metrology techniques; new

boron detection channels to boost

the gauge capability; and improved

embedded firmware for very thin or

flexible wafers.

Until the end of 2005, owners of

PW2800, PW2820, PW2830 and

PW2880 wafer analyzer systems

can obtain the upgrade packages at

a reduced price.

Contact: www.panalytical.com

Nanofocussing Z-stage

PI’s P-540 series of nanofocussing

closed-loop Z-stages are designed

for easy integration into high-

resolution microscopes and other

probe instruments. They are

available with a choice of sensors:

capacitive (high precision) or strain

gauge (low cost).

The stages provide fast motion with

subnanometer resolution over a

travel range of 100 µm in the

z-direction. Millisecond response

allows fast acquisition of images at

different focus positions. The stages

come in an ultralow-profile package

(16.5 mm). A large aperture of

80 mm x 80 mm accommodates

optical microscopy and inspection

tools.

Contact: www.pi-usa.us