ThePh.D. Schoolof the SIE (“Società Italianadi Elettronica”– “ItalianElectronics Society”) is an importantevent linked to the SIEAnnualMeeting,which isannouncedforthe50thyear.TheSchoolwillbefocusedonthereliabilityinelectronicdevices,circuits,andsystems,aswellasonrelatedsubjects.Theaimistoexplainthereliabilitybasicsinallthefieldsofelectronics,todescribethemonitoring,simulation,measurementstrategiesavailableintherecentliterature,andtooffersomedesignguidelinestoalleviatethepotentialreliabilityreduction.Thetalkswillcover:degradationinSiGeHBTandVDMOSinducedbyhot-carriereffects,advancedhigh-efficiencyelectrothermalsimulation;reliabilityissuesinPVplants;failureanalysisinoptoelectronicdevices;degradationinpowerelectronics;reliabilityproblemsindigitalcircuits,withemphasisonnanoscaletransistorsandmemories;uncertaintyquantificationforrobustdesignofelectronicsystems;powerGaNdevices.ThePh.D.studentswillhavetheuniqueopportunitytofollowlecturesgivenbythemostrelevantEuropeanexperts,andwillalsoenjoy15-minutes-longQ&Asessionsaftereachtalk,whichwillallowthemtohonetheirunderstandingofthetopic.TheSchoolwillbeheldintheprestigiouslecture-hall“Spinelli”oftheDepartmentofPoliticalScienceofUniversityFedericoII,viaRodinò,LargoSanMarcellino,Naples.Giventhecrosscuttingrelevanceofthetopic,theSchoolisexpectedtobeofgreatinterestnotonlyforPh.D.studentsdealingwithelectronics,butalsoforthoseinvolvedinsimilarfields,likebiomedical,electrical,industrial,andtelecommunicationengineering.TheofficiallanguageisEnglish.
LECTURESHCdegradationinSiGeHBTs:Measurements,modeling,andphysicalexplanation
GerhardG.FischerIHP,FrankfurtOder
AdvancedsimulationofHCdegradationofSiGeHBTsandVDMOSFETs
ChristophJungemannUniversityofAachen
Recentadvancesofcompactthermalmodelingofintegratedcircuits
LorenzoCodecasaPolitecnicodiMilano
Reliabilityissuesinphotovoltaicsystems GiovanniSpagnuoloUniversityofSalerno
Diagnosticsofelectrondevices:Arealshortcuttoreliabilityimprovement
GiovannaMuraUniversityofCagliari
Anintroductiontothereliabilityofsemiconductormulti-chippowermodules
Real-timemonitoringofpowermodulesdegradationinactualapplications
AlbertoCastellazziUniversityofNottingham
ReliabilityofCMOSnanodevices FeliceCrupiUniversityofCalabria
ReliabilitychallengesinVLSIcircuitsandsystems
CeciliaMetraUniversityofBologna
Advancedsimulationofreliabilityissuesinlogicandmemorydevices
LucaLarcherUniversityofModenaeReggioEmilia
Uncertaintyquantificationforrobustdesignofelectronicsystems
FrancescoFerrantiInstitutMines-TélécomAtlantique,Brest
RecentadvancementsinpowerGaNreliability
GaudenzioMeneghessoUniversityofPadova
sie2018.dieti.unina.itWelookforwardtoseeingyouinthebeautifulNapoli!
Prof.NiccolòRinaldiProf.GiovanniBreglioProf.Vincenzod’Alessandro
Ph.D.SchoolChairsCONTACTS
ForinforegardingSubmission,Registration,SponsorshipandAccommodation:
Ph.D. students and recent graduates are warmly invited toparticipate to this unique experience. Young researchers,doctors,andcompany’sR&Dstaffcanalsoparticipate.Pleasevisittheannualmeetingwebsiteforsubmissionsandupdatedinformationat:
ReliabilityinElectronics
Coordinator Giovanni Breglio
Ph.D. School Chairs
Niccolò Rinaldi, Giovanni Breglio, Vincenzo d’Alessandro
General Chair Andrea Lacaita Organizing Chair
Giovanni Breglio Publication Chair
Ettore Napoli
Giovanni Breglio Antonio Strollo Niccolò Rinaldi
Santolo Daliento Andrea Irace
Ettore Napoli Vincenzo d’Alessandro
Davide De Caro Nicola Petra
Michele Riccio Pierluigi Guerriero
Luca Maresca Darjn Esposito
Antonio Pio Catalano Ilaria Matacena
Vincenzo Romano Marrazzo
LOCAL ORGANIZING COMMITTEE
PHD SCHOOL OF THE SOCIETÀ ITALIANA DI ELETTRONICA