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Reliability Report – 2SC3356
Silicon NPN Planar RF Transistor
CONTENTS:
Certificate of Conformance Process Flow Chart + Mechanical Test Results DC Static Test Results: Post Stabilization Bake at -55°C, 25°C, 125°C Post Acceleration at -55°C, 25°C, 125°C Post HTRB at -55°C, 25°C, 125°C Post Burn-In at -55°C, 25°C, 125°C Interim 250 hours & 500 hours Steady-State Life Test at 25°C Post Steady-State Life Test at -55°C, 25°C, 125°C Scanning Electron Microscopy (SEM) analysis including WLAT Dynamic Test Results: Preliminary at 25°C Post Stabilization Bake at 25°C Post Burn-In at 25°C Post Steady-State Life Test at 25°C
MIL-PRF-38534 CLASS K QUALIFICATION DATAPACK
Performed by Tandex Test Labs
15849 Business Center Drive, Irwindale, CA 91706, U.S.A. Phone (626) 962-7166, Fax (626) 960-6896
www.tandexlabs.com
www.siliconsupplies.com
MIL-PRF-38534 CLASS K DATAPACK
Certificate of Conformance
www.siliconsupplies.com
MIL-PRF-38534 CLASS K DATAPACK
Process Flow Chart + Mechanical Test Results
www.siliconsupplies.com
MIL-PRF-38534 CLASS K DATAPACK
Post Stabilization Bake Test Results at -55°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST STA BAKE,-55C,SEQ 12
4/29/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: HFE SAME
MAX LIMIT: 300
MIN LIMIT: 50
BIAS 1: 10.0 V 2
BIAS 2: 20.0mA 0
S/NO BIN T2 T3
7 1 129.7 129.7
8 1 123.0 123.0
9 1 123.2 123.2
10 1 113.6 113.6
11 1 128.2 128.2
12 1 124.7 124.7
13 1 125.0 125.0
14 1 123.6 123.6
15 1 118.3 118.3
16 1 125.7 125.7
17 1 126.9 126.9
18 1 126.5 126.5
19 1 125.2 125.2
21 1 127.3 127.3
22 1 125.3 125.3
23 1 120.5 120.5
24 1 123.9 123.9
25 1 119.6 119.6
26 1 123.1 123.1
27 1 122.6 122.6
28 1 122.1 122.1
29 1 123.5 123.5
MIL-PRF-38534 CLASS K DATAPACK
Post Stabilization Bake Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST STA BAKE,+25C,SEQ 12
4/29/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5
TEST ITEM: ICBO IEBO HFE SAME
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4
BIAS 2: 0 0 20.0mA 0
S/NO BIN T2 T3 T4 T5
7 1 64.00 pA 1.100 pA 190.8 190.8
8 1 31.90 pA 2.200 pA 186.3 186.3
9 1 15.90 pA 200.0 fA 189.5 189.5
10 1 63.90 pA 300.0 fA 191.9 191.9
11 1 23.90 pA 129.9 pA 193.7 193.7
12 1 32.00 pA 700.0 fA 191.0 191.0
13 1 64.00 pA 258.9 pA 191.5 191.5
14 1 15.90 pA 218.0 pA 195.3 195.3
15 1 48.00 pA 1.900 pA 183.6 183.6
16 1 73.00 pA 2.200 pA 194.9 194.9
17 1 15.90 pA 500.0 fA 193.2 193.2
18 1 32.00 pA 600.0 fA 193.6 193.6
19 1 48.00 pA 600.0 fA 194.9 194.9
21 1 13.90 pA 300.0 fA 191.9 191.9
22 1 64.00 pA 238.3 pA 192.3 192.3
23 1 47.90 pA 500.0 fA 186.9 186.9
24 1 64.00 pA 1.700 pA 193.6 193.6
25 1 47.90 pA 176.9 pA 191.3 191.3
26 1 13.90 pA 279.6 pA 192.3 192.3
27 1 12.90 pA 1.700 pA 191.3 191.3
28 1 48.00 pA 2.200 pA 191.3 191.3
29 1 55.90 pA 200.0 pA 190.2 190.2
MIL-PRF-38534 CLASS K DATAPACK
Post Stabilization Bake Test Results at 125°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST STA BAKE,+125C,SEQ 12
4/29/2020
DDS-107-01-A3.xls
TEST NUMBER: T2
TEST ITEM: ICBO
MAX LIMIT: 1.000uA
MIN LIMIT:
BIAS 1: 15.0 V
BIAS 2: 0
S/NO BIN T2
7 1 25.90 pA
8 1 16.20 pA
9 1 71.50 pA
10 1 31.90 pA
11 1 16.00 pA
12 1 47.90 pA
13 1 74.00 pA
14 1 64.00 pA
15 1 33.90 pA
16 1 47.90 pA
17 1 48.00 pA
18 1 74.00 pA
19 1 56.90 pA
21 1 47.90 pA
22 1 48.00 pA
23 1 54.90 pA
24 1 48.00 pA
25 1 33.90 pA
26 1 15.90 pA
27 1 27.90 pA
28 1 63.90 pA
29 1 16.20 pA
MIL-PRF-38534 CLASS K DATAPACK
Post Acceleration Test Results at -55°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST TC, ACCEL,-55C,SEQ 15
5/5/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: HFE SAME
MAX LIMIT: 300
MIN LIMIT: 50
BIAS 1: 10.0 V 2
BIAS 2: 20.0mA 0
S/NO BIN T2 T3
7 1 117.1 117.1
8 1 117.5 117.5
9 1 120.5 120.5
10 1 123.0 123.0
11 1 129.1 129.1
12 1 123.0 123.0
13 1 122.0 122.0
14 1 121.6 121.6
15 1 114.8 114.8
16 1 124.1 124.1
17 1 121.8 121.8
18 1 122.6 122.6
19 1 123.0 123.0
21 1 118.8 118.8
22 1 116.7 116.7
23 1 114.1 114.1
24 1 121.1 121.1
25 1 120.0 120.0
26 1 120.9 120.9
27 1 120.7 120.7
28 1 120.5 120.5
29 1 121.6 121.6
MIL-PRF-38534 CLASS K DATAPACK
Post Acceleration Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST TC, ACCEL,+25C,SEQ 15
5/5/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5
TEST ITEM: ICBO IEBO HFE SAME
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4
BIAS 2: 0 0 20.0mA 0
S/NO BIN T2 T3 T4 T5
7 1 700.0 fA 123.5 pA 190.6 190.6
8 1 600.0 fA 108.3 pA 185.8 185.8
9 1 700.0 fA 111.0 pA 189.3 189.3
10 1 600.0 fA 600.0 fA 191.9 191.9
11 1 500.0 fA 92.80 pA 193.4 193.4
12 1 500.0 fA 1.100 pA 190.6 190.6
13 1 700.0 fA 120.5 pA 191.3 191.3
14 1 500.0 fA 93.40 pA 194.3 194.3
15 1 600.0 fA 131.0 pA 182.8 182.8
16 1 600.0 fA 146.2 pA 193.6 193.6
17 1 800.0 fA 71.10 pA 192.3 192.3
18 1 500.0 fA 134.0 pA 193.0 193.0
19 1 500.0 fA 67.60 pA 194.5 194.5
21 1 700.0 fA 60.90 pA 191.2 191.2
22 1 600.0 fA 64.00 pA 191.7 191.7
23 1 500.0 fA 47.00 pA 185.8 185.8
24 1 500.0 fA 147.7 pA 192.8 192.8
25 1 400.0 fA 109.9 pA 191.2 191.2
26 1 700.0 fA 157.3 pA 192.3 192.3
27 1 600.0 fA 1.100 pA 178.5 178.5
28 1 600.0 fA 156.4 pA 191.0 191.0
29 1 600.0 fA 700.0 fA 190.4 190.4
MIL-PRF-38534 CLASS K DATAPACK
Post Acceleration Test Results at 125°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST TC, ACCEL,+125C,SEQ 15
5/5/2020
DDS-107-01-A3.xls
TEST NUMBER: T2
TEST ITEM: ICBO
MAX LIMIT: 1.000uA
MIN LIMIT:
BIAS 1: 15.0 V
BIAS 2: 0
S/NO BIN T2
7 1 700.0 fA
8 1 600.0 fA
9 1 500.0 fA
10 1 700.0 fA
11 1 500.0 fA
12 1 700.0 fA
13 1 500.0 fA
14 1 400.0 fA
15 1 700.0 fA
16 1 400.0 fA
17 1 600.0 fA
18 1 600.0 fA
19 1 500.0 fA
21 1 700.0 fA
22 1 500.0 fA
23 1 600.0 fA
24 1 500.0 fA
25 1 700.0 fA
26 1 700.0 fA
27 1 500.0 fA
28 1 600.0 fA
29 1 500.0 fA
MIL-PRF-38534 CLASS K DATAPACK
Post HTRB Test Results at -55°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST HTRB,-55C,SEQ 17
5/11/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: HFE SAME
MAX LIMIT: 300
MIN LIMIT: 50
BIAS 1: 10.0 V 2
BIAS 2: 20.0mA 0
S/NO BIN T2 T3
7 1 119.6 119.6
8 1 116.9 116.9
9 1 118.2 118.2
10 1 120.0 120.0
11 1 121.0 121.0
12 1 121.2 121.2
13 1 121.9 121.9
14 1 123.4 123.4
15 1 115.1 115.1
16 1 123.6 123.6
17 1 123.3 123.3
18 1 123.6 123.6
19 1 122.3 122.3
21 1 122.0 122.0
22 1 120.6 120.6
23 1 115.6 115.6
24 1 122.3 122.3
25 1 119.5 119.5
26 1 120.5 120.5
27 1 119.2 119.2
28 1 119.7 119.7
29 1 120.4 120.4
MIL-PRF-38534 CLASS K DATAPACK
Post HTRB Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST HTRB,+25C,SEQ 17
5/11/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5 T6
TEST ITEM: ICBO IEBO HFE SAME VBEON
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V
BIAS 2: 0 0 20.0mA 0 5.00mA
S/NO BIN T2 T3 T4 T5 T6 mV/degC
7 1 47.90 pA 1.700 pA 191.7 191.7 752.3 mV 588.0 mV -164.3 -1.643
8 1 31.90 pA 1.800 pA 187.0 187.0 750.6 mV 588.7 mV -161.9 -1.619
9 1 68.00 pA 1.200 pA 190.4 190.4 752.1 mV 588.0 mV -164.1 -1.641
10 1 15.90 pA 1.500 pA 192.8 192.8 752.5 mV 586.0 mV -166.5 -1.665
11 1 32.00 pA 154.2 pA 194.5 194.5 750.3 mV 579.5 mV -170.8 -1.708
12 1 16.00 pA 400.0 fA 191.9 191.9 751.9 mV 584.6 mV -167.3 -1.673
13 1 12.90 pA 700.0 fA 192.3 192.3 752.2 mV 586.8 mV -165.4 -1.654
14 1 12.90 pA 800.0 fA 195.8 195.8 752.3 mV 580.6 mV -171.7 -1.717
15 1 13.90 pA 500.0 fA 184.1 184.1 752.5 mV 583.7 mV -168.8 -1.688
16 1 47.90 pA 500.0 fA 194.9 194.9 748.2 mV 583.3 mV -164.9 -1.649
17 1 64.00 pA 900.0 fA 193.6 193.6 747.1 mV 572.4 mV -174.7 -1.747
18 1 63.90 pA 3.000 pA 194.3 194.3 749.5 mV 593.5 mV -156.0 -1.560
19 1 32.00 pA 56.00 pA 196.0 196.0 751.8 mV 586.5 mV -165.3 -1.653
21 1 15.90 pA 800.0 fA 193.0 193.0 751.3 mV 587.7 mV -163.6 -1.636
22 1 63.90 pA 900.0 fA 193.9 193.9 750.8 mV 589.3 mV -161.5 -1.615
23 1 63.90 pA 700.0 fA 188.1 188.1 750.0 mV 587.8 mV -162.2 -1.622
24 1 15.90 pA 800.0 fA 194.7 194.7 750.0 mV 586.6 mV -163.4 -1.634
25 1 31.90 pA 68.40 pA 192.6 192.6 752.1 mV 587.4 mV -164.7 -1.647
26 1 47.90 pA 1.200 pA 193.4 193.4 752.4 mV 594.8 mV -157.6 -1.576
27 1 64.00 pA 600.0 fA 185.0 185.0 751.3 mV 584.7 mV -166.6 -1.666
28 1 63.90 pA 100.0 fA 192.3 192.3 752.8 mV 592.6 mV -160.2 -1.602
29 1 16.00 pA 600.0 fA 191.3 191.3 751.8 mV 591.6 mV -160.2 -1.602
MIL-PRF-38534 CLASS K DATAPACK
Post HTRB Test Results at 125°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST HTRB,+125C,SEQ 17
5/11/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: ICBO VBEON
MAX LIMIT: 1.000uA
MIN LIMIT:
BIAS 1: 15.0 V 10.0 V
BIAS 2: 0 5.00mA
S/NO BIN T2 T3
7 1 68.00 pA 588.0 mV
8 1 13.90 pA 588.7 mV
9 1 64.00 pA 588.0 mV
10 1 16.00 pA 586.0 mV
11 1 32.00 pA 579.5 mV
12 1 72.00 pA 584.6 mV
13 1 32.00 pA 586.8 mV
14 1 47.90 pA 580.6 mV
15 1 31.90 pA 583.7 mV
16 1 27.90 pA 583.3 mV
17 1 68.00 pA 572.4 mV
18 1 48.00 pA 593.5 mV
19 1 16.10 pA 586.5 mV
21 1 47.90 pA 587.7 mV
22 1 64.00 pA 589.3 mV
23 1 16.10 pA 587.8 mV
24 1 16.00 pA 586.6 mV
25 1 63.90 pA 587.4 mV
26 1 72.00 pA 594.8 mV
27 1 23.90 pA 584.7 mV
28 1 23.90 pA 592.6 mV
29 1 31.90 pA 591.6 mV
MIL-PRF-38534 CLASS K DATAPACK
Post Burn-In Test Results at -55°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST BURN-IN,-55C,SEQ 19
5/26/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: HFE SAME
MAX LIMIT: 300
MIN LIMIT: 50
BIAS 1: 10.0 V 2
BIAS 2: 20.0mA 0
S/NO BIN T2 T3
7 1 127.4 127.4
8 1 118.3 118.3
9 1 120.4 120.4
10 1 121.7 121.7
11 1 124.9 124.9
12 1 122.7 122.7
13 1 122.1 122.1
14 1 125.4 125.4
15 1 114.3 114.3
16 1 124.3 124.3
17 1 119.9 119.9
18 1 123.9 123.9
19 1 125.0 125.0
21 1 119.4 119.4
22 1 119.9 119.9
23 1 113.8 113.8
24 1 122.1 122.1
25 1 120.0 120.0
26 1 120.3 120.3
27 1 119.0 119.0
28 1 117.4 117.4
29 1 116.9 116.9
MIL-PRF-38534 CLASS K DATAPACK
Post Burn-In Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST BURN-IN,+25C,SEQ 19
5/26/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5 T6
TEST ITEM: ICBO IEBO HFE SAME VBEON
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V
BIAS 2: 0 0 20.0mA 0 5.00mA
S/NO BIN T2 T3 T4 T5 T6
7 1 32.00 pA 100.0 fA 189.9 189.9 755.6 mV
8 1 72.00 pA 600.0 fA 185.3 185.3 753.9 mV
9 1 68.00 pA 1.000 pA 188.6 188.6 755.6 mV
10 1 16.00 pA 700.0 fA 191.2 191.2 755.8 mV
11 1 68.00 pA 900.0 fA 192.8 192.8 753.7 mV
12 1 68.00 pA 500.0 fA 190.4 190.4 755.4 mV
13 1 64.00 pA 600.0 fA 190.8 190.8 755.4 mV
14 1 32.00 pA 1.000 pA 194.1 194.1 755.5 mV
15 1 48.00 pA 500.0 fA 182.6 182.6 755.6 mV
16 1 15.90 pA 900.0 fA 193.2 193.2 750.9 mV
17 1 47.90 pA 12.70 pA 191.5 191.5 749.9 mV
18 1 68.00 pA 800.0 fA 193.0 193.0 751.8 mV
19 1 72.00 pA 600.0 fA 194.3 194.3 754.8 mV
21 1 16.10 pA 900.0 fA 191.2 191.2 754.5 mV
22 1 63.90 pA 700.0 fA 191.9 191.9 754.4 mV
23 1 32.00 pA 900.0 fA 186.0 186.0 753.5 mV
24 1 64.00 pA 500.0 fA 192.6 192.6 753.5 mV
25 1 31.90 pA 600.0 fA 191.0 191.0 755.2 mV
26 1 16.10 pA 800.0 fA 191.5 191.5 756.6 mV
27 1 64.00 pA 1.200 pA 188.6 188.6 754.7 mV
28 1 68.00 pA 600.0 fA 190.8 190.8 756.3 mV
29 1 32.00 pA 600.0 fA 189.9 189.9 755.0 mV
MIL-PRF-38534 CLASS K DATAPACK
Post Burn-In Test Results at +125°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST BURN-IN,+125C,SEQ 19
5/26/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: ICBO VBEON
MAX LIMIT: 1.000uA
MIN LIMIT:
BIAS 1: 15.0 V 10.0 V
BIAS 2: 0 5.00mA
S/NO BIN T2 T3
7 1 47.90 pA 589.7 mV
8 1 64.00 pA 581.0 mV
9 1 23.90 pA 591.0 mV
10 1 31.90 pA 584.2 mV
11 1 23.90 pA 585.6 mV
12 1 47.90 pA 589.2 mV
13 1 31.90 pA 585.6 mV
14 1 124.0 pA 584.2 mV
15 1 31.90 pA 584.0 mV
16 1 15.90 pA 582.5 mV
17 1 31.90 pA 581.3 mV
18 1 16.10 pA 585.2 mV
19 1 117.0 pA 582.3 mV
21 1 32.00 pA 588.0 mV
22 1 48.00 pA 585.9 mV
23 1 63.90 pA 581.4 mV
24 1 71.50 pA 586.0 mV
25 1 31.90 pA 588.3 mV
26 1 63.90 pA 591.8 mV
27 1 31.90 pA 591.0 mV
28 1 68.00 pA 593.9 mV
29 1 32.00 pA 584.4 mV
MIL-PRF-38534 CLASS K DATAPACK
Interim Steady-State Life Test Results
250 hours 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
250HR CHECK,+25C,SEQ 20
6/8/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5 T6
TEST ITEM: ICBO IEBO HFE SAME VBEON
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V
BIAS 2: 0 0 20.0mA 0 5.00mA
S/NO BIN T2 T3 T4 T5 T6
7 1 48.00 pA 600.0 fA 189.5 189.5 748.8 mV
8 1 47.90 pA 400.0 fA 185.1 185.1 751.2 mV
9 1 32.00 pA 1.000 pA 188.5 188.5 742.4 mV
10 1 32.00 pA 800.0 fA 190.8 190.8 749.3 mV
11 1 31.90 pA 600.0 fA 192.6 192.6 747.9 mV
12 1 55.90 pA 600.0 fA 190.4 190.4 732.6 mV
13 1 64.00 pA 500.0 fA 191.0 191.0 747.6 mV
14 1 63.90 pA 1.300 pA 193.0 193.0 745.3 mV
15 1 63.90 pA 1.000 pA 182.9 182.9 750.9 mV
16 1 63.90 pA 1.100 pA 191.5 191.5 733.1 mV
17 1 24.00 pA 500.0 fA 191.5 191.5 743.0 mV
18 1 63.90 pA 400.0 fA 192.4 192.4 751.6 mV
19 1 31.90 pA 700.0 fA 194.1 194.1 748.8 mV
21 1 32.00 pA 500.0 fA 190.8 190.8 746.8 mV
22 1 64.00 pA 700.0 fA 191.3 191.3 746.9 mV
23 1 47.90 pA 400.0 fA 185.8 185.8 753.7 mV
24 1 64.00 pA 700.0 fA 192.4 192.4 746.0 mV
25 1 64.00 pA 600.0 fA 190.8 190.8 755.3 mV
26 1 31.90 pA 800.0 fA 191.2 191.2 744.1 mV
27 1 16.20 pA 900.0 fA 190.1 190.1 751.6 mV
28 1 47.90 pA 500.0 fA 190.4 190.4 752.5 mV
29 1 32.00 pA 500.0 fA 189.5 189.5 754.1 mV
MIL-PRF-38534 CLASS K DATAPACK
Interim Steady-State Life Test Results
500 hours 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
500HR CHECK,+25C,SEQ 20
6/18/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5 T6
TEST ITEM: ICBO IEBO HFE SAME VBEON
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V
BIAS 2: 0 0 20.0mA 0 5.00mA
S/NO BIN T2 T3 T4 T5 T6
7 1 31.90 pA 800.0 fA 189.9 189.9 748.2 mV
8 1 32.00 pA 700.0 fA 185.0 185.0 750.2 mV
9 1 63.90 pA 400.0 fA 188.3 188.3 747.6 mV
10 1 64.00 pA 5.500 pA 190.6 190.6 753.1 mV
11 1 31.90 pA 300.0 fA 189.9 189.9 754.6 mV
12 1 16.00 pA 41.70 pA 190.2 190.2 753.6 mV
13 1 15.90 pA 800.0 fA 193.2 193.2 754.7 mV
14 1 23.90 pA 400.0 fA 192.1 192.1 750.9 mV
15 1 63.90 pA 600.0 fA 182.1 182.1 756.5 mV
16 1 16.50 pA 1.200 pA 192.4 192.4 744.9 mV
17 1 64.00 pA 123.0 pA 190.2 190.2 749.0 mV
18 1 47.90 pA 500.0 fA 191.3 191.3 752.2 mV
19 1 16.00 pA 100.0 fA 193.0 193.0 754.7 mV
21 1 74.00 pA 50.10 pA 190.1 190.1 750.6 mV
22 1 24.00 pA 1.100 pA 190.6 190.6 753.0 mV
23 1 63.90 pA 800.0 fA 185.1 185.1 754.5 mV
24 1 63.90 pA 800.0 fA 191.5 191.5 748.1 mV
25 1 15.90 pA 500.0 fA 189.9 189.9 751.9 mV
26 1 15.90 pA 33.80 pA 190.2 190.2 754.9 mV
27 1 47.90 pA 200.0 fA 189.5 189.5 752.3 mV
28 1 31.90 pA 700.0 fA 189.5 189.5 759.5 mV
29 1 40.00 pA 700.0 fA 189.0 189.0 752.8 mV
MIL-PRF-38534 CLASS K DATAPACK
Post Steady-State Life Test Results at -55°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST SSL,-55C,SEQ 21
7/13/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: HFE SAME
MAX LIMIT: 300
MIN LIMIT: 50
BIAS 1: 10.0 V 2
BIAS 2: 20.0mA 0
S/NO BIN T2 T3
7 1 118.6 118.6
8 1 115.2 115.2
9 1 117.9 117.9
10 1 119.4 119.4
11 1 121.4 121.4
12 1 118.3 118.3
13 1 120.1 120.1
14 1 122.0 122.0
15 1 112.1 112.1
16 1 121.5 121.5
17 1 122.9 122.9
18 1 124.6 124.6
19 1 120.7 120.7
21 1 118.4 118.4
22 1 120.5 120.5
23 1 116.8 116.8
24 1 123.8 123.8
25 1 122.3 122.3
26 1 122.4 122.4
27 1 121.5 121.5
28 1 120.7 120.7
29 1 121.2 121.2
MIL-PRF-38534 CLASS K DATAPACK
Post Steady-State Life Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST SSL,+25C,SEQ 21
7/13/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3 T4 T5 T6
TEST ITEM: ICBO IEBO HFE SAME VBEON
MAX LIMIT: 1.000uA 1.000uA 300
MIN LIMIT: 50
BIAS 1: 15.0 V 1.00 V 10.0 V 4 10.0 V
BIAS 2: 0 0 20.0mA 0 5.00mA
S/NO BIN T2 T3 T4 T5 T6
7 1 51.70 pA 59.00 pA 193.4 193.4 751.9 mV
8 1 8.00 pA 135.00 pA 188.6 188.6 750.1 mV
9 1 40.00 pA 76.00 pA 191.9 191.9 751.7 mV
10 1 32.00 pA 48.00 pA 194.5 194.5 749.9 mV
11 1 31.90 pA 91.00 pA 196.2 196.2 749.9 mV
12 1 24.00 pA 166.00 pA 193.6 193.6 751.8 mV
13 1 110.50 pA 78.00 pA 194.3 194.3 751.3 mV
14 1 16.00 pA 529.00 pA 197.4 197.4 752.2 mV
15 1 16.00 pA 122.00 pA 186.0 186.0 756.1 mV
16 1 50.50 pA 57.00 pA 196.2 196.2 747.6 mV
17 1 48.00 pA 57.00 pA 194.3 194.3 746.0 mV
18 1 15.90 pA 241.00 pA 195.6 195.6 739.9 mV
19 1 64.00 pA 43.00 pA 197.4 197.4 751.7 mV
21 1 52.00 pA 220.00 pA 194.5 194.5 750.8 mV
22 1 47.90 pA 111.00 pA 194.9 194.9 751.0 mV
23 1 11.90 pA 495.00 pA 189.3 189.3 750.0 mV
24 1 52.00 pA 156.00 pA 194.1 194.1 750.5 mV
25 1 7.90 pA 552.00 pA 194.3 194.3 751.9 mV
26 1 32.00 pA 118.00 pA 194.9 194.9 754.5 mV
27 1 32.00 pA 19.00 pA 193.7 193.7 751.1 mV
28 1 23.90 pA 151.00 pA 194.1 194.1 757.6 mV
29 1 11.90 pA 36.00 pA 193.4 193.4 746.9 mV
MIL-PRF-38534 CLASS K DATAPACK
Post Steady-State Life Test Results at 125°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST SSL,+125C,SEQ 21
7/13/2020
DDS-107-01-A3.xls
TEST NUMBER: T2 T3
TEST ITEM: ICBO VBEON
MAX LIMIT: 1.000uA
MIN LIMIT:
BIAS 1: 15.0 V 10.0 V
BIAS 2: 0 5.00mA
S/NO BIN T2 T3
7 1 32.00 pA 580.3 mV
8 1 39.90 pA 579.1 mV
9 1 43.50 pA 580.9 mV
10 1 53.50 pA 580.7 mV
11 1 15.90 pA 579.5 mV
12 1 8.00 pA 581.1 mV
13 1 7.90 pA 582.9 mV
14 1 4.70 pA 583.5 mV
15 1 8.00 pA 587.8 mV
16 1 40.00 pA 578.8 mV
17 1 5.90 pA 577.6 mV
18 1 15.90 pA 580.1 mV
19 1 15.90 pA 581.7 mV
21 1 43.90 pA 580.5 mV
22 1 4.90 pA 582.1 mV
23 1 40.00 pA 581.3 mV
24 1 5.90 pA 580.6 mV
25 1 39.90 pA 581.7 mV
26 1 32.00 pA 587.8 mV
27 1 5.50 pA 579.2 mV
28 1 7.90 pA 591.5 mV
29 1 23.90 pA 582.5 mV
MIL-PRF-38534 CLASS K DATAPACK
Preliminary Dynamic Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
PRELIMINARY,+25C,SEQ 9
3/17/2020
DDS-107-01-A4
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x
S21E (dB) From VNA 7 9 -- 7.9 8.0 8.0 8.0 8.0 8.0 8.0 8.0 8.0 7.9 7.9 7.8 7.8 7.9 8.0
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.6 6.6 6.7 6.6 6.7 6.8 6.7 6.7 6.7 6.7 6.7 6.6 6.6 6.6 6.7
S11 (dB) From VNA -- -- -- -3.9 -3.8 -4.0 -3.8 -3.9 -4.0 -4.0 -4.0 -3.9 -4.0 -3.8 -3.8 -3.9 -3.8 -4.0
S12 (dB) From VNA -- -- -- -18.7 -18.6 -18.7 -18.8 -18.8 -18.7 -18.6 -18.8 -18.7 -18.6 -18.8 -18.8 -18.7 -18.9 -18.9
S22 (dB) From VNA -- -- -- -6.0 -6.2 -6.1 -6.0 -6.1 -6.1 -6.1 -6.0 -6.0 -6.0 -6.0 -6.2 -6.1 -5.9 -6.1
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.1 10.1 10.1 10.2 10.2 10.2 10.1 10.2 10.2 10.2 10.3 10.1 10.1 10.2 10.1
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.4 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.3 13.2 13.1 13.1 13.3 13.4
2 S21 from VNA, 2 GHz (dB) -- -- -- 7.9 8.0 8.0 8.0 8.0 8.0 8.0 8.0 8.0 7.9 7.9 7.8 7.8 7.9 8.0
3 S21 from VNA, 3 GHz (dB) -- -- -- 5.0 4.8 4.8 4.7 4.8 4.9 4.8 4.8 4.8 4.8 4.7 4.6 4.6 4.7 4.9
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.9 4.5 4.6 4.6 4.6 4.7 4.5 4.6 4.6 4.7 4.5 4.2 4.4 4.5 4.6
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.2 2.0 2.2 2.1 2.1 2.3 2.0 2.2 2.1 2.0 2.1 1.7 1.8 2.1 2.2
6 S21 from VNA, 6 GHz (dB) -- -- -- 1.0 0.7 0.9 0.9 0.9 1.0 0.2 0.9 0.9 0.5 0.5 0.3 0.4 0.5 1.5
fT (GHz) Extrapolated -- 7 -- 6.8 6.7 6.8 6.8 6.8 7.0 6.5 6.8 6.8 6.6 6.6 6.4 6.4 6.6 7.1
NF Setup VCE=10V, IC=7mA -- -- --
NF (dB) f=1GHz, from NF meter -- 1.1 --
NF (dB) f=2GHz, from NF meter -- 2.1 --
16 17 18 1910 11 12 13 14 15
17-Mar-2020
UUT Serial No.
28 29 7 8 9
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
PRELIMINARY,+25C,SEQ 9
3/17/2020
DDS-107-01-A4
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- --
S21E (dB) From VNA 7 9 --
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- --
S21 (dB) From VNA -- -- --
S11 (dB) From VNA -- -- --
S12 (dB) From VNA -- -- --
S22 (dB) From VNA -- -- --
GA (dB)Calculated assuming ideal
input match-- 10 --
fT Setup VCE=10V, IC=20mA -- -- --
1 S21 from VNA, 1 GHz (dB) -- -- --
2 S21 from VNA, 2 GHz (dB) -- -- --
3 S21 from VNA, 3 GHz (dB) -- -- --
4 S21 from VNA, 4 GHz (dB) -- -- --
5 S21 from VNA, 5 GHz (dB) -- -- --
6 S21 from VNA, 6 GHz (dB) -- -- --
fT (GHz) Extrapolated -- 7 --
NF Setup VCE=10V, IC=7mA -- -- --
NF (dB) f=1GHz, from NF meter -- 1.1 --
NF (dB) f=2GHz, from NF meter -- 2.1 --
17-Mar-2020
x x x x x x x
7.9 8.0 8.0 8.0 8.0 8.0 8.0
x x x x x x x
6.7 6.7 6.7 6.7 6.7 6.7 6.7
-3.9 -4.1 -3.7 -4.0 -3.9 -3.9 -3.9
-18.8 -18.8 -18.9 -11.8 -18.9 -18.7 -18.7
-6.2 -6.1 -6.0 -6.1 -5.9 -6.0 -6.0
10.2 10.1 10.4 10.1 10.3 10.2 10.2
x x x x x x x
13.3 13.3 13.0 13.3 13.4 13.3 13.3
7.9 8.0 8.0 8.0 8.0 8.0 8.0
4.7 4.8 4.8 4.8 4.8 4.8 4.8
4.4 4.6 4.6 4.6 4.7 4.7 4.6
2.2 2.2 2.2 2.3 2.5 2.3 2.2
1.0 1.2 0.8 1.0 1.5 1.0 1.0
6.8 7.0 6.9 6.9 7.2 6.9 6.9
2723 24 25 2621 22
UUT Serial No.
MIL-PRF-38534 CLASS K DATAPACK
Post Stabilization Bake
Dynamic Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST STA BAKE,+25C,SEQ 12
5/1/2020
DDS-107-01-A4
(All data taken 4/30-5/1/2020)
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x
S21E (dB) From VNA 7 9 -- 8.3 8.0 8.1 8.0 8.0 8.1 8.0 8.1 8.1 8.0 8.1 8.2 8.3 8.0 8.1
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.9 6.7 6.8 6.8 6.7 6.8 6.8 6.8 6.8 6.8 6.7 6.9 7.0 6.7 6.8
S11 (dB) From VNA -- -- -- -4.3 -4.4 -4.3 -4.0 -4.4 -4.1 -4.5 -4.1 -4.5 -4.4 -4.3 -4.4 -4.1 -4.2 -4.3
S12 (dB) From VNA -- -- -- -19.1 -19.0 -19.2 -19.0 -19.0 -19.1 -19.0 -19.0 -19.2 -19.0 -19.3 -19.0 -19.2 -18.8 -19.0
S22 (dB) From VNA -- -- -- -6.1 -6.2 -6.1 -6.1 -6.1 -6.1 -6.2 -6.2 -6.1 -6.0 -6.0 -6.0 -6.1 -6.1 -6.2
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.1 9.9 10.0 10.2 9.9 10.2 9.9 10.1 9.9 10.0 10.0 10.1 10.4 10.0 10.0
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.6 13.3 13.4 13.3 13.4 13.5 13.3 13.4 13.4 13.4 13.4 13.5 13.6 13.3 13.4
2 S21 from VNA, 2 GHz (dB) -- -- -- 8.3 8.0 8.1 8.0 8.0 8.1 8.0 8.1 8.1 8.0 8.1 8.2 8.3 8.0 8.1
3 S21 from VNA, 3 GHz (dB) -- -- -- 5.2 5.0 5.0 4.9 5.0 5.1 5.0 5.0 5.0 5.0 5.0 5.3 5.4 4.9 5.0
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.8 3.7 3.7 3.6 3.6 3.7 3.7 3.6 3.7 3.7 3.7 3.8 3.8 3.5 3.7
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.1 1.9 2.0 1.6 1.9 1.8 2.0 1.8 2.0 2.0 2.0 1.9 2.1 1.8 2.0
6 S21 from VNA, 6 GHz (dB) -- -- -- 0.5 0.3 0.7 0.3 0.4 0.3 0.5 0.5 0.3 0.4 0.5 1.0 0.8 0.1 0.5
fT (GHz) Extrapolated -- 7 -- 6.5 6.4 6.5 6.2 6.4 6.3 6.5 6.4 6.4 6.4 6.5 6.7 6.7 6.2 6.5
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.43 2.47 2.43 2.45 2.45 2.42 2.43 2.43 2.38 2.42 2.45 2.46 2.56 2.44 2.41
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.46 3.52 3.45 3.49 3.48 3.44 3.44 3.46 3.65 3.45 3.50 3.48 3.58 3.45 3.44
17 18 1911 12 13 14 15 16
1-May-2020
UUT Serial No.
28 29 7 8 9 10
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST STA BAKE,+25C,SEQ 12
5/1/2020
DDS-107-01-A4
(All data taken 4/30-5/1/2020)
Symbol Conditions Min. Typ. Max. 27
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x
S21E (dB) From VNA 7 9 -- 8.1 8.1 7.8 8.1 8.1 8.1 8.1
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x
S21 (dB) From VNA -- -- -- 6.8 6.8 6.6 6.7 6.8 6.8 6.8
S11 (dB) From VNA -- -- -- -4.2 -4.3 -4.1 -4.1 -4.3 -4.3 -4.0
S12 (dB) From VNA -- -- -- -19.2 -19.1 -19.2 -18.9 -19.1 -19.2 -19.1
S22 (dB) From VNA -- -- -- -6.1 -6.1 -6.3 -6.2 -6.1 -6.1 -6.1
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.1 10.0 9.9 10.0 10.0 10.0 10.2
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.4 13.4 13.1 13.3 13.4 13.4 13.4
2 S21 from VNA, 2 GHz (dB) -- -- -- 8.1 8.1 7.8 8.1 8.1 8.1 8.1
3 S21 from VNA, 3 GHz (dB) -- -- -- 5.0 5.0 4.6 5.0 5.0 5.0 5.0
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.7 3.3 3.7 3.8 3.7 3.6
5 S21 from VNA, 5 GHz (dB) -- -- -- 1.8 2.1 1.5 2.0 2.0 2.1 1.9
6 S21 from VNA, 6 GHz (dB) -- -- -- 0.0 0.5 0.1 0.2 0.1 0.2 0.2
fT (GHz) Extrapolated -- 7 -- 6.2 6.5 6.1 6.4 6.3 6.4 6.3
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.43 2.43 2.35 2.43 2.41 2.43 2.43
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.48 3.47 4.00 3.46 3.45 3.47 3.45
1-May-2020
UUT Serial No.
21 2622 23 24 25
MIL-PRF-38534 CLASS K DATAPACK
Post Burn-In Dynamic Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST BURN-IN,+25C,SEQ 19
5/28/2020
DDS-107-01-A4
(All data taken 5/27-5/28/2020)
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x
S21E (dB) From VNA 7 9 -- 7.9 7.7 8.4 7.9 7.8 8.0 8.1 7.9 8.4 7.8 7.9 7.8 7.8
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.5 6.4 7.0 6.6 6.5 6.7 6.8 6.6 7.1 6.6 6.6 6.5 6.5
S11 (dB) From VNA -- -- -- -4.0 -4.3 -4.1 -4.0 -4.1 -3.9 -4.0 -4.0 -4.0 -4.0 -3.8 -3.9 -3.9
S12 (dB) From VNA -- -- -- -18.7 -18.8 -18.8 -19.1 -19.1 -19.1 -18.9 -18.9 -18.9 -18.9 -19.0 -19.0 -19.0
S22 (dB) From VNA -- -- -- -5.9 -5.9 -5.9 -5.9 -5.9 -6.0 -6.0 -5.9 -6.0 -5.9 -6.0 -6.4 -6.2
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.0 9.7 10.4 10.1 9.9 10.2 10.3 10.1 10.6 10.1 10.2 9.9 10.0
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.3 13.2 13.8 13.4 13.4 13.5 13.6 13.4 13.8 13.2 13.4 13.2 13.2
2 S21 from VNA, 2 GHz (dB) -- -- -- 7.9 7.7 8.4 7.9 7.8 8.0 8.1 7.9 8.4 7.8 7.9 7.8 7.8
3 S21 from VNA, 3 GHz (dB) -- -- -- 4.8 4.7 5.3 4.8 4.9 5.0 5.0 4.9 5.3 4.8 4.9 4.8 4.7
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.6 3.4 3.7 3.5 3.5 3.6 3.6 3.5 3.6 3.3 3.5 3.3 3.3
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.0 1.8 2.4 2.0 2.0 2.1 2.2 2.0 2.2 1.5 2.0 1.7 1.8
6 S21 from VNA, 6 GHz (dB) -- -- -- 0.7 0.5 1.1 0.7 0.8 0.9 1.0 0.7 0.9 -0.2 0.6 0.1 0.3
fT (GHz) Extrapolated -- 7 -- 6.5 6.3 6.8 6.4 6.5 6.6 6.6 6.5 6.6 6.0 6.4 6.1 6.2
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.54 2.45 2.46 2.45 2.43 2.44 2.45 2.36 2.43 2.46 2.47 2.39
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.47 3.60 3.47 3.49 3.48 3.46 3.44 3.47 3.71 3.46 3.50 3.51 3.83
16 1710 11 12 13 14 15
28-May-2020
UUT Serial No.
28 29 7 8 9
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST BURN-IN,+25C,SEQ 19
5/28/2020
DDS-107-01-A4
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x
S21E (dB) From VNA 7 9 -- 7.8 7.9 7.9 8.2 7.9 8.0 7.9 8.0 8.8
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.5 6.6 6.6 6.8 6.6 6.7 6.6 6.7 7.4
S11 (dB) From VNA -- -- -- -3.9 -4.0 -4.0 -4.0 -4.0 -3.9 -4.0 -3.9 -4.0
S12 (dB) From VNA -- -- -- -19.0 -19.0 -19.1 -19.4 -19.2 -19.0 -19.1 -18.9 -19.1
S22 (dB) From VNA -- -- -- -5.9 -6.0 -5.9 -5.8 -5.8 -6.3 -5.9 -5.9 -5.9
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.1 10.1 10.1 10.3 10.1 10.1 10.1 10.3 10.9
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.3 13.4 13.4 13.7 13.4 13.5 13.4 13.5 13.9
2 S21 from VNA, 2 GHz (dB) -- -- -- 7.8 7.9 7.9 8.2 7.9 8.0 7.9 8.0 8.8
3 S21 from VNA, 3 GHz (dB) -- -- -- 4.8 4.9 4.9 5.0 4.8 4.9 4.9 4.9 5.6
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.4 3.5 3.5 3.6 3.5 3.5 3.6 3.5 3.8
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.0 2.1 2.0 2.2 2.0 2.0 2.2 2.1 2.5
6 S21 from VNA, 6 GHz (dB) -- -- -- 0.6 0.8 0.6 0.8 0.6 0.6 0.8 0.8 1.1
fT (GHz) Extrapolated -- 7 -- 6.4 6.5 6.4 6.5 6.4 6.4 6.6 6.5 0.0
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.43 2.45 2.44 2.60 2.47 2.44 2.48 2.43
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.48 3.46 3.50 3.47 3.64 3.48 3.47 3.51 3.46
2723 24 25 26
28-May-2020
UUT Serial No.
18 19 21 22
MIL-PRF-38534 CLASS K DATAPACK
Post Steady-State Life
Dynamic Test Results at 25°C
www.siliconsupplies.com
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST SSL,+25C,SEQ 21
7/15/2020
DDS-107-01-A4
(All data taken 7/14-7/15/2020)
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x x x x x
S21E (dB) From VNA 7 9 -- 8.3 7.9 8.0 7.9 7.9 8.0 7.9 8.0 7.4 7.9 7.2 7.8 7.9
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.9 6.6 6.7 6.6 6.6 6.7 6.6 6.7 6.3 6.7 6.0 6.5 6.7
S11 (dB) From VNA -- -- -- -4.1 -4.1 -3.9 -4.0 -4.0 -4.1 -4.1 -3.9 -5.4 -4.0 -5.5 -4.1 -3.9
S12 (dB) From VNA -- -- -- -19.2 -19.0 -19.0 -18.9 -19.2 -19.0 -18.8 -19.0 -16.6 -19.2 -16.4 -18.9 -18.8
S22 (dB) From VNA -- -- -- -5.7 -6.0 -6.0 -6.0 -5.9 -6.0 -6.1 -6.1 -5.7 -5.7 -5.5 -5.9 -6.3
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.4 10.0 10.2 10.1 10.1 10.1 10.0 10.2 9.1 10.3 8.9 9.9 10.1
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.8 13.4 13.5 13.4 13.5 13.5 13.4 13.5 12.8 13.5 12.6 13.3 13.4
2 S21 from VNA, 2 GHz (dB) -- -- -- 8.3 7.9 8.0 7.9 7.9 8.0 7.9 8.0 7.4 7.9 7.2 7.8 7.9
3 S21 from VNA, 3 GHz (dB) -- -- -- 5.2 4.9 5.0 4.9 5.0 5.0 4.9 5.0 4.6 4.9 4.5 4.9 4.9
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.5 3.7 3.6 3.7 3.7 3.6 3.6 3.5 3.6 3.4 3.5 3.4
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.2 2.0 2.1 1.9 2.1 2.1 2.1 2.1 2.2 2.0 2.1 2.0 1.8
6 S21 from VNA, 6 GHz (dB) -- -- -- 1.1 0.8 1.0 0.9 0.9 0.9 1.0 0.9 1.2 0.8 1.0 0.7 0.6
fT (GHz) Extrapolated -- 7 -- 6.7 6.5 6.7 6.5 6.6 6.6 6.6 6.6 6.8 6.5 6.7 6.5 6.3
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.49 2.41 2.45 2.40 2.45 2.45 2.38 2.44 2.43 2.44 2.54 2.49 2.50
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.52 3.82 3.46 3.65 3.50 3.47 3.69 3.46 3.40 3.46 3.51 3.51 3.52
16 1710 11 12 13 14 15
15-Jul-2020
UUT Serial No.
28 29 7 8 9
DDS-107-01-A
PN 2SC3356
TANDEX TEST LABS
POST SSL,+25C,SEQ 21
7/15/2020
DDS-107-01-A4
(All data taken 7/14-7/15/2020)
Symbol Conditions Min. Typ. Max.
S21E Setup VCE=10V, IC=20mA, f=2GHz -- -- -- x x x x x x x x x
S21E (dB) From VNA 7 9 -- 8.1 7.9 7.9 7.9 9.0 7.9 8.1 7.8 8.0
GA Setup VCE=10V, IC=7mA, f=2GHz -- -- -- x x x x x x x x x
S21 (dB) From VNA -- -- -- 6.7 6.6 6.6 6.6 7.6 6.6 6.7 6.5 6.7
S11 (dB) From VNA -- -- -- -4.0 -4.1 -4.0 -4.0 -3.9 -4.0 -4.0 -4.0 -3.9
S12 (dB) From VNA -- -- -- -18.9 -19.4 -19.0 -18.9 -19.2 -18.8 -19.1 -18.9 -19.0
S22 (dB) From VNA -- -- -- -5.9 -5.7 -6.0 -6.0 -5.9 -6.0 -5.9 -5.7 -6.0
GA (dB)Calculated assuming ideal
input match-- 10 -- 10.2 10.1 10.1 10.1 11.2 10.1 10.2 10.1 10.2
fT Setup VCE=10V, IC=20mA -- -- -- x x x x x x x x x
1 S21 from VNA, 1 GHz (dB) -- -- -- 13.6 13.4 13.4 13.5 14.3 13.4 13.6 13.3 13.5
2 S21 from VNA, 2 GHz (dB) -- -- -- 8.1 7.9 7.9 7.9 9.0 7.9 8.1 7.8 8.0
3 S21 from VNA, 3 GHz (dB) -- -- -- 5.1 4.9 4.9 4.9 6.7 4.9 5.1 4.8 5.0
4 S21 from VNA, 4 GHz (dB) -- -- -- 3.7 3.6 3.5 3.6 4.1 3.6 3.7 3.5 3.6
5 S21 from VNA, 5 GHz (dB) -- -- -- 2.3 2.1 2.0 2.0 2.3 2.1 2.2 1.9 2.0
6 S21 from VNA, 6 GHz (dB) -- -- -- 1.5 1.0 0.7 0.9 1.5 1.0 1.0 0.8 0.8
fT (GHz) Extrapolated -- 7 -- 6.9 6.6 6.5 6.5 7.1 6.6 6.7 6.5 6.5
NF Setup VCE=10V, IC=7mA -- -- -- x x x x x x x x x
NF (dB) f=1GHz, from NF meter -- 1.1 -- 2.46 2.44 2.46 2.45 2.46 2.45 2.45 2.54 2.44
NF (dB) f=2GHz, from NF meter -- 2.1 -- 3.47 3.47 3.48 3.47 3.51 3.46 3.47 3.56 3.48
2723 24 25 26
15-Jul-2020
UUT Serial No.
18 19 21 22