RFIC Test SystemTest Solution for Power Amplifier and Front End Module Characterization

DPD Reference Solution• Measure AM-AM and AM-PM using

modulated waveforms• Implement both lookup table (LUT) and

memory polynomial model (MPM) DPD algorithms

Characterization & Manufacturing Test Solutions• FPGA-based power level servo• 5x to 10x improvements in measurement

speed versus traditional instruments

System Features• Support for 802.11a/b/g/h/n/ac, UMTS,

LTE, and LTE-Advanced technologies• Getting started LV, C and .NET example

programs for DPD, Power Servo and Envelope Tracking

• Measure harmonics up to 26.5 GHz

Envelope Tracking Reference Solution• Industry leading baseband-to-RF

synchronization• Customizable Vccwaveform shaping• Advanced digital synchronization with DUT

TestStand Example Sequences

Transition test plans from initial design to automated characterization and production test using TestStandexample sequences.

RFIC Test Soft Front Panel

Interactively characterize ET and DPD PA’s using measurements such as EVM, ACLR, and harmonics.

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Modular InstrumentsPXI modular instruments including RF signal generators, RF signal analyzers, high speed digital I/O, source measure units (SMUs), switches, high-speed digitizers, and arbitrary waveform generators (AWGs).

Application SoftwareNI instrument soft front panel and reference example software provides an easy-to-use interface to modular instruments and is powered by LabVIEW

Embedded PCAs an embedded PC, a PXI controller is the heart of the PXI system and contains a high-performance multicore processor, deep memory, and multiple hard drive options.

RFIC Test SystemThe demands of emerging wireless standards such as LTE Advanced and 802.11ac in conjunction with RF power amplifier (PA) technologies such as envelope tracking (ET) and digital pre-distortion (DPD) are creating new test challenges for today’s engineers. NI PXI offers complete solutions for PA testing from initial product design to manufacturing test. Benefits of NI PXI solutions include:

• Best-in-Class RF MeasurementPerformance• Industry-Leading Measurement Speed• Reduced Cost of Test

Customizable Example Programs

Customize your RFIC test system more quickly by modifying ready-to-run LabVIEW example programs.

www.ni.com/pa

System ArchitectureNI RFIC Test System includes a combination of software and PXI modular instruments. The system includes an instrument soft panel along with LabVIEW, C, and .NET example programs. In addition, NI TestStand example sequences allow you to easily automate PA testing with test executive software.

PXI Controller

Arbitrary Waveform Generator

Vector Signal Analyzer

High-Speed Digitizer

Source Measure Unit

High Speed Digital I/P

PXI System

NI-RFmx Measurement Driver Software

DPD, Envelope Trackin for WiFiand Cellular Devices

TestStand Sequences forCharacterization & Manufacturing

DPD, ET, and Power Servo LabVIEW / .NET Reference Examples

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www.ni.com/pa

DPD Solution OverviewDigital pre-distortion (DPD) is a popular technique to correct for signal distortion and improve PA metrics such as ACLR and EVM. Testing a PA under DPD conditions involves four key operations: characterizing device behavior, model extraction, model inversion, and application of predistortion to baseband IQ samples.

When testing DPD enabled PA’s and front end modules, the RFIC Test Soft Front Panel allows you to interactively apply DPD models and observe device behavior. This solution supports three DPD models, the memoryless AM-AM/PM lookup table (LUT), the Memory Polynomial Model (MPM), and the Generalized Memory Polynomial (GMP). In addition, the included LabVIEW example programs allow you to automate device testing. Because these example programs use the same underlying measurement IP as the soft front panel – you can more easily correlate results from the interactive and automated use case.

Performance VisualizationObserve improvements in spectral regrowth and modulation quality in real time.

PA Linearity MeasurementsObserve AM-AM and AM-PM response of the PA with and without DPD.

PA Performance MetricsUse metrics such as ACLR, EVM, power, and RMS memory to characterize PA performance.

Harmonics MeasurementsMeasure harmonics up to 26.5 GHz using the high performance 5668R Vector Signal Analyzer

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DPD Solution Hardware ConfigurationFor DPD testing, the RFIC Test System combines multiple instruments into a single system including the NI vector signal transceiver (VST), precision power supplies, and high speed digital I/O. The NI VST is a key element of the measurement configuration and combines an RF signal generator and RF signal analyzer into one module. Tight synchronization between RF signal generator and acquisition enables you to accurately measure AM-AM/PM using modulated waveforms.

NI PXI has the added benefit of accelerating measurement speed through NI-RFmx measurement software. This software takes advantage of multicore processors for highly mathematically complex algorithms such as the memory polynomial DPD model.

DPD Solution Features & Specifications

DPD Models• Memoryless AM-AM/PM LUT• Memory Polynomial Model• Generalized Memory Polynomial

Measurements• AM-AM/PM• Power• EVM• ACLR• SEM• RMS Memory (Phase)• Harmonics

Supported Signal Types• UMTS (WCDMA, HSPA, HSPA+), LTE / LTE-

Advanced, GSM / EDGE, TDSCDMA, CDMA2k and EVDO

• WLAN 802.11a/b/g/h/n/ac

Included Products• NI PXIe-1085 18-Slot PXI Chassis• NI PXIe-8135 Embedded Controller• NI PXIe-5646R Vector Signal Transceiver• NI PXIe-4139 Source Measure Unit• NI PXIe-6556 High Speed Digital I/O• NI PXIe-5668R Vector Signal Analyzer

Vector Signal Transceiver

PXI Chassis

MIPI RFFE ControlHigh Speed DigitalI/O & PPMU

DigitalI/O

Precision SourceMeasure Unit DCout

PA

Stimulus

Response

Vector Signal Analyzer

PXI Controller

RFin

RFout

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Envelope Tracking Solution Overview Envelope tracking (ET) is an increasingly popular technique to improve the efficiency of power amplifiers for modern wireless signals with a high peak to average power ratio (PAPR). PA efficiency is highest when a PA nears compression, an ET Power Supply (ETPS) is used to dynamically vary the power supply in conjunction with the amplitude of a modulated wireless signal. Envelope tracking keeps a PA near compression as often as possible –thus improving overall efficiency.

For ET testing, the NI RFIC Test Soft Front Panel transforms multiple instruments into a single measurement experience. Instruments include the NI Vector Signal Transceiver (VST), arbitrary waveform generator (AWG), and high-speed digitizer. The GUI provides an easy-to-use interface for synchronizing all of these instruments and also supplies UMTS and LTE waveforms. The system also features LabVIEW, C, and .NET example code that you can customize for automated test applications.

DPD AlgorithmsApply DPD algorithms to ET PAs to correct for AM-AM and AM-PM distortion.

Envelope ControlApplies envelope shaping and real-time control of VSG-to-AWG delay.

PA PerformanceObserve AM-AM and AM-PM behavior of PA under envelope tracking conditions.

PA Performance MetricsUse metrics such as ACLR, EVM, power, and RMS memory to characterize PA performance.

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Envelope Tracking Solution Hardware ConfigurationA critical challenge for ET PA Testing is synchronization and stable alignment of RF and Vcc signals supplied by a vector signal generator (VSG) and arbitrary waveform generator (AWG). The RFIC Test System is based on NI PXI instrumentation and features shared trigger and timing bus resources. This implementation produces synchronization jitter between RF and Vcc signals that is less than 20 ps. In addition, by routing timing signals on the PXI backplane, these results are stable and repeatable. The software includes the NI Fast ET Align measurement which rapidly estimates RF and Vcc alignment. Finally, the envelope tracking software can simultaneously apply DPD to the stimulus signal.

Envelope Tracking Solution Features & Specifications

Vector Signal Transceiver

High Speed Digitizer

Measure PA Behavior

High Speed Digital I/O & PPMU

Arbitrary Waveform Generator

Precision Power Supply

PXI Controller

Power Modulator

RFout

PXI Chassis

DigitalI/O

DCout

VccOut

Ch1

Ch0

PA

MIPI RFFE Control

Splitter

Shaped Envelope

Synchronization• AWG-to-VSG Jitter: < 20 ps• AWG-to-VSG skew resolution: 1 ns

Supported Signal Types• UMTS (WCDMA, HSPA, HSPA+), LTE /

LTE-Advanced, GSM/EDGE, TDSCDMA, CDMA2k and EVDO

• WLAN 802.11a/b/g/h/n/ac

Included Products• NI LabVIEW System Design Software• NI PXIe-1085 18-Slot Chassis• NI PXIe-8135 Embedded Controller• NI PXIe-5646R Vector Signal Transceiver• NI PXIe-5451 Arbitrary Waveform Generator• NI PXIe-4139 Precision Source Measure Unit• NI PXIe-5162 High Speed Digitizer• NI PXIe-6556 High Speed Digital I/O

Vector Signal Analyzer RFin

Power Amplifier Characterization Solution OverviewThe emergence of new wireless technologies and multi-mode power amplifiers are increasing the demands on automated power amplifier testing both in characterization and in high-volume manufacturing test. NI PXI automated test systems deliver best-in-class RF measurement performance with test times that are typically 5 to 10 times faster than traditional instruments.

The NI approach combines high-performance modular instruments with highly innovative measurement software. Typical automated PA test systems include a combination of modular instruments and test automation software and test PAs that use technologies such as: GSM/EDGE, UMTS (WCDMA/HSPA/HSPA+), LTE/LTE-A, CDMA2000/EV-DO, and 802.11a/b/g/h/n/ac

With NI PXI, we were able to reduce the characterization time of new parts from two weeks to about a day.

Gary Shipley, Senior EngineerQorvo

www.ni.com/pa

“ ”Fast Power Level Servo Technology

A unique technology of the NI power amplifier test solution is FPGA-based power level servo using the NI Vector Signal Transceiver (VST). Power level servo is traditionally a time consuming process. By performing the control loop entirely on the instrument FPGA you can achieve the fastest possible power level convergence. By decoupling the power level servo algorithm from the embedded controller and performing it on an FPGA, test software is able to exploit dramatic measurement parallelism. This results in significant reductions in test time and test cost.

Vector Signal TransceiverDigital

I/O

RFin

RFout

PXI Chassis

FPG

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PA

Data Transfer

PXI Controller

CPU Memory

From Characterization to Manufacturing TestThe openness and flexibility of the NI RFIC Test System allows engineers to easily transition test systems from the R&D lab to the manufacturing floor. Although the RFIC Test System is designed for product characterization, you can duplicate the same physical hardware and measurement software for manufacturing test.

PXI’s combination of fast measurement speed and small physical footprint make it an ideal test solution for high-volume manufacturing. In addition, by re-using the same equipment and test software from initial product design through final production test, you can reduce development time and improve correlation of R&D and manufacturing test data.

Quickly validate PA behavior using instrument soft front panels or reference examples.

Automate PA/FEM characterization through easy-to-use example programs

Re-use test equipment and characterization software such as LabVIEW code and TestStandsequences in manufacturing test.

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R&D Test Bench Device Characterization Manufacturing Test

NI STS T1NI PXI NI STS T4NI STS T2

PXI Chassis and Controller

PXI RF and Modular Instrumentation

NI RFmx Measurement Science and NI TestStand (Test Management)

STS Standardized Docking and Cabling Interface

Deploying PXI in Manufacturing Test

You can deploy PXI for manufacturing test either as a stand-alone system or as part of the NI Semiconductor Test System (STS). STS combines the NI PXI platform, TestStand test management software, and LabVIEW graphical programming inside a fully enclosed test head.

The STS enclosure houses all the key components of a production tester including test instruments, device under test (DUT) interfacing, and device handler/prober docking mechanics. With the open, modular STS design, you can take advantage of the latest industry-standard PXI modules for more instrumentation and computing power to lower the overall cost of RFIC production test.

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Hardware SpecificationsNI DPD and Envelope Tracking (ET) Reference Solutions are based on a standard configuration of PXI modular instruments. One can use these instruments with the LabVIEW Reference example code or as standalone instruments.

NI PXIe-5646R Vector Signal TransceiverThe NI PXIE-5646R VST combines an RF vector signal generator (VSG) and RF vector signal analyzer (VSA) into one module. The combination of wide bandwidth and high-quality RF measurement performance make the NI PXIe-5646R an ideal solution for RF power amplifier testing.

PXIe-5646R Specifications (Signal Generator)

Frequency Range 65 MHz – 6 GHz

Bandwidth 200 MHz

Maximum Output Power +15 dBm

802.11ac EVM -45 dB

LTE EVM -50 dB

UMTS ACLR 65 dB

PXIe-5646R Specifications (Signal Analyzer)

Frequency Range 65 MHz – 6 GHz

Bandwidth 200 MHz

Amplitude Accuracy +/- 0.34 dB

Average Noise Floor -161 dBm/Hz (1 GHz)

802.11ac EVM -45 dB

LTE EVM -50 dB

Refer to PXIe-5646R Specifications Document for more details

PXIe-55668R Specifications

Frequency Range 20 Hz – 26.5 GHz

Bandwidth Up to 765 MHz

Phase Noise, Typ -129 dBm/Hz ( 1GHz)

Amplitude Accuracy +/- 0.25 dB

Average Noise Floor -167 dBM/Hz (1 GHz)

Tuning Speed 3 ms (1 GHz step)

Third Order Intercept +25 dBm (1 GHz)

Refer to PXIe-5668R Specifications Document for more detailsNI PXIe-5668R Vector Signal Transceiver

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Hardware Specifications (Continued)

PXIe-8880 Embedded Controller Specifications

Processor Xeon Octal Core

CPU Clock Rate 2.3 GHz

Memory Up to 24 GB

PXIe-1085 Chassis Specifications

PXI Express Slots 18

Total System Bandwidth 24 GB/s

Total Power Rating 925 W

PXIe-6556 High Speed DIO Specifications

Clock Rates 800 Hz – 200 MHz

PPMU Channels 24

Voltage Ranges -2 V to 7 V

PXIe-5162 10-Bit Digitizer Specifications

Max Sample Rate 5 GS/s

Bandwidth (3 dB) 1.5 GHz

Max Channels 4

PXIe-5451 Arbitrary Waveform Generator Specifications

Max Sample Rate 400 MS/s

Bandwidth 145 MHz

SFDR (1 MHz) 98 dB

PXIe-4139 Precision Source Measure Unit Specifications

Max Pulse Power 500 W

Max Continuous Power 20 W

Transient Response < 70 µs

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For more information on the RFIC Test system, email: rfic.test@ni.com