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silicon processing
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SILICON PROCESSING – FABRICATION YIELDSILICON PROCESSING – FABRICATION YIELD
BYSRITEJA TARIGOPULA
SUBMITTED TODR. ROMAN STEMPROK
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Overview of Silicon ProcessingOverview of Silicon Processing
An integrated circuit (IC) consists of several patterned layers of materials to form FETs and interconnects
In a modern process : Minimum feature size < 0.12µm Individual chips with more than 100 million FETs
The techniques needed to fabricate chips of this sophistication have been developed over several decades at tremendous cost
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Silicon Processing - WafersSilicon Processing - Wafers
Si ICs are created on large circular sheets of Si called wafers 100-300mm in diameter ~ 0.7 mm thick
Si IC is ~ 1 cm on a side Many ICs on a single wafer
Location of an IC on a wafer is called a die site
A flat on the wafer is used as a reference plane to form a grid for die placement
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Silicon Processing - WafersSilicon Processing - Wafers
The manufacturing capacity of a chip factory is measured by the number of wafer starts per week
The number of wafer starts indicates how many “fresh” wafers are introduced into the fabrication sequence
Wafers are processed in groups, and it typically takes several weeks for a lot to pass through the entire processing line
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Silicon Processing – Fabrication YieldSilicon Processing – Fabrication Yield
Not every die site on the Si wafer produces a functional circuit Due to many factors inherent in the complexity of the Si processing
To quantify problem, chip manufacturers use the concept of fabrication yield Y ;
Y = [NG / NT] x 100%
NG = number of good functional sites NT = total number of sites on wafer
High yield values are critical for IC economic stability
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Silicon Processing – Fabrication YieldSilicon Processing – Fabrication Yield
Yield analysis is based on predicting the yield Y of a particular IC process very specialised aspect of VLSI manufacturing requires thorough understanding of all aspects of Si processing
Yield analysts attempt to optimise Y for a given IC design work closely with groups on manufacturing line also work with specialist wafer analysis groups
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Silicon Processing – Effect of die area on yieldSilicon Processing – Effect of die area on yield
A variable that is critically important to increasing the yield is the area of the die Adie
The total die sites NT on a wafer of diameter d is found as :NT = (d - de)2 / 4Adie
de = wasted edge distance from placing rectangular die onto round wafer
Empirical analysis shows that large area die are plagued by smaller yields
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Silicon Processing – effect of die area on yieldSilicon Processing – effect of die area on yield
Defects on the wafer can result in circuit failure and influence Y
The average number of defects per cm2 is denoted by the parameter D and quantifies the wafer “perfection” for modern IC production D is typically ~ 1 cm-2
For isolated defects : Y = exp[-(AdieD)]
For clustered defects : Y = [1 - (AdieD)/c]c
c = empirical parameter that characterises cluster structure
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Silicon Processing – Economic FactorsSilicon Processing – Economic Factors
For economic survival, a Si chip manufacturing plant must be profitable : profit-per-chip = Csell - Cchip is not easy to estimate
Cchip = chip production costs
Cchip includes Materials personnel salaries
(design, manufacture, test etc)
overheads (electricity, water, taxes etc)
initial plant commission~ $1-3 billion !!
Csell = chip selling price all direct and indirect costs fraction of plant debt
Csell must however be at level that customers will pay high chip demand Csell
“whatever market will bear” low chip demand Csell
Withdraw product?
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Silicon Processing – Economic FactorsSilicon Processing – Economic Factors
Notice also that Csell tends to decrease with time ! Hottest new microprocessors eventually become basement bargains no problem to IC manufacturer provided initial engineering costs are
recouped original IC design can be very expensive
A helpful factor in IC manufacturing profitability is that as time progresses : Cchip Cmaterials
for CMOS Si is very cheap compared to alternatives such as III-Vs keeping product lines operative for many years therefore improves
overall profitability
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RefrencesRefrences
Introduction to VLSI Circuits and Systems, by John P.Uyemura
D.Morgan and K.Board, “An Introduction to Semiconductor Microtechnology”, J.Wiley & Sons, 1988
http://www.personal.dundee.ac.uk/~dmgoldie/teaching/eg4013/lectures/1
http://www.stanford.edu/class/ee271/stick_to_layout/stick_to_layout.html
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Thank you…Thank you…