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Today’s Outline - November 16, 2016
• Resonant and inelastic techniques
• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques
• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure
• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy
• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering
• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the exam
Send me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Today’s Outline - November 16, 2016
• Resonant and inelastic techniques• Diffraction anomalous fine structure• X-ray Raman spectroscopy• Resonant inelastic x-ray scattering• X-ray emission spectroscopy
Homework Assignment #7:Chapter 7: 2,3,9,10,11due Monday, November 28, 2016
Final Exam, Wednesday, December 7, 2016, Stuart Building 2132 sessions: 09:00-12:00; 13:00-17:00; (this may change)
Provide me with the paper you intend to present and a preferred sessionfor the examSend me your presentation in Powerpoint or PDF format before beforeyour session
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 1 / 15
Diffraction anomalous fine structure (DAFS)
The real part of scattering factor of anatom has a resonance at the absorp-tion edge
An atom in a real solid or liquid showsEXAFS oscillations in the absorptioncross section which are reflected in theresonant term as well
This can be measured in Bragg reflec-tions contributed to by the atom withthe absorption edge and exploited toextract site specific information
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 2 / 15
Diffraction anomalous fine structure (DAFS)
The real part of scattering factor of anatom has a resonance at the absorp-tion edge
An atom in a real solid or liquid showsEXAFS oscillations in the absorptioncross section which are reflected in theresonant term as well
This can be measured in Bragg reflec-tions contributed to by the atom withthe absorption edge and exploited toextract site specific information
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 2 / 15
Diffraction anomalous fine structure (DAFS)
The real part of scattering factor of anatom has a resonance at the absorp-tion edge
An atom in a real solid or liquid showsEXAFS oscillations in the absorptioncross section which are reflected in theresonant term as well
This can be measured in Bragg reflec-tions contributed to by the atom withthe absorption edge and exploited toextract site specific information
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 2 / 15
Diffraction anomalous fine structure (DAFS)
The real part of scattering factor of anatom has a resonance at the absorp-tion edge
An atom in a real solid or liquid showsEXAFS oscillations in the absorptioncross section which are reflected in theresonant term as well
This can be measured in Bragg reflec-tions contributed to by the atom withthe absorption edge and exploited toextract site specific information
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 2 / 15
Diffraction anomalous fine structure (DAFS)
The real part of scattering factor of anatom has a resonance at the absorp-tion edge
An atom in a real solid or liquid showsEXAFS oscillations in the absorptioncross section which are reflected in theresonant term as well
This can be measured in Bragg reflec-tions contributed to by the atom withthe absorption edge and exploited toextract site specific information
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 2 / 15
The DAFS experiment
As the energy is swept through the absorption edge, the angle of thesample and the detector are changed to remain in a Bragg condition.
Several peaks are measured to be able to extract information aboutindividual atomic sites.
Initially experiments were done on single crystals but now DAFS onpowders can be performed
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 3 / 15
The DAFS experiment
As the energy is swept through the absorption edge, the angle of thesample and the detector are changed to remain in a Bragg condition.
Several peaks are measured to be able to extract information aboutindividual atomic sites.
Initially experiments were done on single crystals but now DAFS onpowders can be performed
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 3 / 15
The DAFS experiment
As the energy is swept through the absorption edge, the angle of thesample and the detector are changed to remain in a Bragg condition.
Several peaks are measured to be able to extract information aboutindividual atomic sites.
Initially experiments were done on single crystals but now DAFS onpowders can be performed
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 3 / 15
The DAFS experiment
As the energy is swept through the absorption edge, the angle of thesample and the detector are changed to remain in a Bragg condition.
Several peaks are measured to be able to extract information aboutindividual atomic sites.
Initially experiments were done on single crystals but now DAFS onpowders can be performed
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 3 / 15
DAFS of YBa2Cu3O7
YBa2Cu3O7−δ is a defect perovskite struc-ture with two distinct copper sites
the two Cu sites have distinct local environ-ments, one has square-pyramidal coordina-tion and the second has square planar
with simple EXAFS, you will see a superpo-sition of the two sites in a 2:1 ratio
by measuring the DAFS of multiple diffrac-tion peaks, it is possible to separate the EX-AFS of the two Cu sites
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 4 / 15
DAFS of YBa2Cu3O7
YBa2Cu3O7−δ is a defect perovskite struc-ture with two distinct copper sites
the two Cu sites have distinct local environ-ments, one has square-pyramidal coordina-tion and the second has square planar
with simple EXAFS, you will see a superpo-sition of the two sites in a 2:1 ratio
by measuring the DAFS of multiple diffrac-tion peaks, it is possible to separate the EX-AFS of the two Cu sites
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 4 / 15
DAFS of YBa2Cu3O7
YBa2Cu3O7−δ is a defect perovskite struc-ture with two distinct copper sites
the two Cu sites have distinct local environ-ments, one has square-pyramidal coordina-tion and the second has square planar
with simple EXAFS, you will see a superpo-sition of the two sites in a 2:1 ratio
by measuring the DAFS of multiple diffrac-tion peaks, it is possible to separate the EX-AFS of the two Cu sites
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 4 / 15
DAFS of YBa2Cu3O7
YBa2Cu3O7−δ is a defect perovskite struc-ture with two distinct copper sites
the two Cu sites have distinct local environ-ments, one has square-pyramidal coordina-tion and the second has square planar
with simple EXAFS, you will see a superpo-sition of the two sites in a 2:1 ratio
by measuring the DAFS of multiple diffrac-tion peaks, it is possible to separate the EX-AFS of the two Cu sites
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 4 / 15
DAFS of YBa2Cu3O7
YBa2Cu3O7−δ is a defect perovskite struc-ture with two distinct copper sites
the two Cu sites have distinct local environ-ments, one has square-pyramidal coordina-tion and the second has square planar
with simple EXAFS, you will see a superpo-sition of the two sites in a 2:1 ratio
by measuring the DAFS of multiple diffrac-tion peaks, it is possible to separate the EX-AFS of the two Cu sites
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 4 / 15
DAFS of YBa2Cu3O7
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 5 / 15
DAFS of YBa2Cu3O7
The two Cu sites are distinctlydifferent in both edge positionand shape
the Fourier transform is also sig-nificantly different for the twosites, particularly the amplitudeof the Cu-O peak in the real-space EXAFS
combined in the 2:1 ratio, themeasured EXAFS is recovered
This data was taken on a singlecrystal but it is also possible tomeasure powders using DAFS
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 6 / 15
DAFS of YBa2Cu3O7
The two Cu sites are distinctlydifferent in both edge positionand shape
the Fourier transform is also sig-nificantly different for the twosites, particularly the amplitudeof the Cu-O peak in the real-space EXAFS
combined in the 2:1 ratio, themeasured EXAFS is recovered
This data was taken on a singlecrystal but it is also possible tomeasure powders using DAFS
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 6 / 15
DAFS of YBa2Cu3O7
The two Cu sites are distinctlydifferent in both edge positionand shape
the Fourier transform is also sig-nificantly different for the twosites, particularly the amplitudeof the Cu-O peak in the real-space EXAFS
combined in the 2:1 ratio, themeasured EXAFS is recovered
This data was taken on a singlecrystal but it is also possible tomeasure powders using DAFS
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 6 / 15
DAFS of YBa2Cu3O7
The two Cu sites are distinctlydifferent in both edge positionand shape
the Fourier transform is also sig-nificantly different for the twosites, particularly the amplitudeof the Cu-O peak in the real-space EXAFS
combined in the 2:1 ratio, themeasured EXAFS is recovered
This data was taken on a singlecrystal but it is also possible tomeasure powders using DAFS
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 6 / 15
DAFS of YBa2Cu3O7
The two Cu sites are distinctlydifferent in both edge positionand shape
the Fourier transform is also sig-nificantly different for the twosites, particularly the amplitudeof the Cu-O peak in the real-space EXAFS
combined in the 2:1 ratio, themeasured EXAFS is recovered
This data was taken on a singlecrystal but it is also possible tomeasure powders using DAFS
‘Separated anomalous scattering amplitudes for the inequivalent Cu sites in YBa2Cu3O7−δ using DAFS,” J.O. Cross, M.Newville, L.B. Sorensen, H.J. Straiger, C.E. Bouldin, and J.C. Woicik, J. Phys. C2, 745-747 (1997).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 6 / 15
DAFS of maghemite γ-Fe2O3
In this study, a mixedphase material with Fe inboth phases, is measuredand the two sites of themaghemite (γ-Fe2O3) areseparated
one of the Fe sites isoctahedral and the othertetrahedral
DAFS can also be used toseparate different phaseswhich contain the sameelement in a heteroge-neous system or closelyoverlapping absorptionedges
“Diffraction anomalous fine structure study of iron/iron oxide nanoparticles,”C. Meneghini, F. Boscherini, L. Pasquini, and H. Renevier, J. Appl. Cryst.42, 642-645 (2009)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 7 / 15
DAFS of maghemite γ-Fe2O3
In this study, a mixedphase material with Fe inboth phases, is measuredand the two sites of themaghemite (γ-Fe2O3) areseparated
one of the Fe sites isoctahedral and the othertetrahedral
DAFS can also be used toseparate different phaseswhich contain the sameelement in a heteroge-neous system or closelyoverlapping absorptionedges
“Diffraction anomalous fine structure study of iron/iron oxide nanoparticles,”C. Meneghini, F. Boscherini, L. Pasquini, and H. Renevier, J. Appl. Cryst.42, 642-645 (2009)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 7 / 15
DAFS of maghemite γ-Fe2O3
In this study, a mixedphase material with Fe inboth phases, is measuredand the two sites of themaghemite (γ-Fe2O3) areseparated
one of the Fe sites isoctahedral and the othertetrahedral
DAFS can also be used toseparate different phaseswhich contain the sameelement in a heteroge-neous system or closelyoverlapping absorptionedges
“Diffraction anomalous fine structure study of iron/iron oxide nanoparticles,”C. Meneghini, F. Boscherini, L. Pasquini, and H. Renevier, J. Appl. Cryst.42, 642-645 (2009)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 7 / 15
DAFS of maghemite γ-Fe2O3
In this study, a mixedphase material with Fe inboth phases, is measuredand the two sites of themaghemite (γ-Fe2O3) areseparated
one of the Fe sites isoctahedral and the othertetrahedral
DAFS can also be used toseparate different phaseswhich contain the sameelement in a heteroge-neous system or closelyoverlapping absorptionedges
“Diffraction anomalous fine structure study of iron/iron oxide nanoparticles,”C. Meneghini, F. Boscherini, L. Pasquini, and H. Renevier, J. Appl. Cryst.42, 642-645 (2009)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 7 / 15
X-ray Raman (XRR)
X-ray Raman is a way to measure the XAS spectrum of light elementswhose absorption edges are below 2 keV.
hν hν
XRR
hν
XAS
The x-ray absorption event consists of the ab-sorption of a photon and production of a pho-toelectron
X-ray Raman is a similar process which pro-duces a photoelectron but is an inelastic scat-tering process with an outgoing photon oflower energy
The incoming x-rays are high energy and thedetector is set to measure outgoing x-rayswhich are at a fixed energy. The incomingenergy is scanned and the processes detecteddepend on the difference in energy
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 8 / 15
X-ray Raman (XRR)
X-ray Raman is a way to measure the XAS spectrum of light elementswhose absorption edges are below 2 keV.
hν hν
XRR
hν
XAS
The x-ray absorption event consists of the ab-sorption of a photon and production of a pho-toelectron
X-ray Raman is a similar process which pro-duces a photoelectron but is an inelastic scat-tering process with an outgoing photon oflower energy
The incoming x-rays are high energy and thedetector is set to measure outgoing x-rayswhich are at a fixed energy. The incomingenergy is scanned and the processes detecteddepend on the difference in energy
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 8 / 15
X-ray Raman (XRR)
X-ray Raman is a way to measure the XAS spectrum of light elementswhose absorption edges are below 2 keV.
hν hν
XRR
hν
XAS
The x-ray absorption event consists of the ab-sorption of a photon and production of a pho-toelectron
X-ray Raman is a similar process which pro-duces a photoelectron but is an inelastic scat-tering process with an outgoing photon oflower energy
The incoming x-rays are high energy and thedetector is set to measure outgoing x-rayswhich are at a fixed energy. The incomingenergy is scanned and the processes detecteddepend on the difference in energy
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 8 / 15
X-ray Raman (XRR)
X-ray Raman is a way to measure the XAS spectrum of light elementswhose absorption edges are below 2 keV.
hν hν
XRR
hν
XAS
The x-ray absorption event consists of the ab-sorption of a photon and production of a pho-toelectron
X-ray Raman is a similar process which pro-duces a photoelectron but is an inelastic scat-tering process with an outgoing photon oflower energy
The incoming x-rays are high energy and thedetector is set to measure outgoing x-rayswhich are at a fixed energy.
The incomingenergy is scanned and the processes detecteddepend on the difference in energy
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 8 / 15
X-ray Raman (XRR)
X-ray Raman is a way to measure the XAS spectrum of light elementswhose absorption edges are below 2 keV.
hν hν
XRR
hν
XAS
The x-ray absorption event consists of the ab-sorption of a photon and production of a pho-toelectron
X-ray Raman is a similar process which pro-duces a photoelectron but is an inelastic scat-tering process with an outgoing photon oflower energy
The incoming x-rays are high energy and thedetector is set to measure outgoing x-rayswhich are at a fixed energy. The incomingenergy is scanned and the processes detecteddepend on the difference in energy
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 8 / 15
The XRR experiment
“Bulk-sensitive XAS characterization of light elements: from x-ray Raman scattering to x-ray Raman spectroscopy,” U.Bergmann, P. Glatzel, and S. Cramer, Microchem. J. 71, 221-230 (2002)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 9 / 15
The XRR experiment
“Bulk-sensitive XAS characterization of light elements: from x-ray Raman scattering to x-ray Raman spectroscopy,” U.Bergmann, P. Glatzel, and S. Cramer, Microchem. J. 71, 221-230 (2002)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 9 / 15
XRR spectra of light elements
Comparison of XRRand XAS on graphite
Aromatic (solid) andaliphatic (dashed) car-bon K-edge x-ray Ra-man spectra
Li K-edge spectrafor LiOH ·H2O (top),Li2CO3 (middle), andLi4SiO4 (bottom).
“Bulk-sensitive XAS characterization of light elements: from x-ray Raman scattering to x-ray Raman spectroscopy,” U.Bergmann, P. Glatzel, and S. Cramer, Microchem. J. 71, 221-230 (2002)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 10 / 15
XRR spectra of light elements
Comparison of XRRand XAS on graphite
Aromatic (solid) andaliphatic (dashed) car-bon K-edge x-ray Ra-man spectra
Li K-edge spectrafor LiOH ·H2O (top),Li2CO3 (middle), andLi4SiO4 (bottom).
“Bulk-sensitive XAS characterization of light elements: from x-ray Raman scattering to x-ray Raman spectroscopy,” U.Bergmann, P. Glatzel, and S. Cramer, Microchem. J. 71, 221-230 (2002)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 10 / 15
XRR spectra of light elements
Comparison of XRRand XAS on graphite
Aromatic (solid) andaliphatic (dashed) car-bon K-edge x-ray Ra-man spectra
Li K-edge spectrafor LiOH ·H2O (top),Li2CO3 (middle), andLi4SiO4 (bottom).
“Bulk-sensitive XAS characterization of light elements: from x-ray Raman scattering to x-ray Raman spectroscopy,” U.Bergmann, P. Glatzel, and S. Cramer, Microchem. J. 71, 221-230 (2002)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 10 / 15
Resonant inelastic x-ray scattering (RIXS)
νh νh
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 11 / 15
RIXS measures electronic excitations
“Resonant inelastic x-ray scattering,” P.M. Platzman and E.D. Isaacs, Phys. Rev. B 57, 11108 (1998)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 12 / 15
RIXS measures electronic excitations
“Resonant inelastic x-ray scattering,” P.M. Platzman and E.D. Isaacs, Phys. Rev. B 57, 11108 (1998)
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 12 / 15
RIXS example
“Magnetic excitation spectra of Sr2IrO4 probed by resonant inelastic x-ray scattering: Establishing links to cupratesuperconductors,” J. Kim, D. Casa, M.H. Upton, T. Gog, Y.-J. Kim, J.F. Mitchell, M. van Veenendaal, M. Daghofer, J. van denBrink, G. Khaliullin, and B.J. Kim, Phys. Rev. Lett. 108, 177003 (2012).
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 13 / 15
X-ray emission spectroscopy (XES)
sample
analyzer
2D detector
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
X-ray emission spectroscopy (XES)
sample
analyzer
2D detector
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
X-ray emission spectroscopy (XES)
sample
analyzer
2D detector
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
X-ray emission spectroscopy (XES)
sample
analyzer
2D detector
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
X-ray emission spectroscopy (XES)
sample
analyzer
2D detector
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
X-ray emission spectroscopy (XES)
Normally a fluorescence line is mea-sured with a detector which cannotresolve its fine structure
with an XES analyzer, the fine fea-tures of the emission spectrum areseparated
the analyzer crystal diffracts dif-ferent energies at different an-gles, spreading the different ener-gies over the face of the 2D detec-tor
each crystal in the analyzer collectsthe same range of fluorescence en-ergies for a larger solid angle
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 14 / 15
RIXS spectrometer performance
The Pr-containing sample isplaced in a diamond anvil highpressure cell (DAC) and illumi-nated with energies near the PrL3 edge (5964 eV)
the spectrometer clearly sepa-rates the Pr Lα1 (5035.2 eV)and Lα2 (5015.7 eV) emissionlines
after integration, the two peakscan be seen to change relativeintensities and even position as afunction of the incident energy:just at the absorption edge and14 eV higher
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 15 / 15
RIXS spectrometer performance
The Pr-containing sample isplaced in a diamond anvil highpressure cell (DAC) and illumi-nated with energies near the PrL3 edge (5964 eV)
the spectrometer clearly sepa-rates the Pr Lα1 (5035.2 eV)and Lα2 (5015.7 eV) emissionlines
after integration, the two peakscan be seen to change relativeintensities and even position as afunction of the incident energy:just at the absorption edge and14 eV higher
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 15 / 15
RIXS spectrometer performance
The Pr-containing sample isplaced in a diamond anvil highpressure cell (DAC) and illumi-nated with energies near the PrL3 edge (5964 eV)
the spectrometer clearly sepa-rates the Pr Lα1 (5035.2 eV)and Lα2 (5015.7 eV) emissionlines
after integration, the two peakscan be seen to change relativeintensities and even position as afunction of the incident energy:just at the absorption edge and14 eV higher
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 15 / 15
RIXS spectrometer performance
The Pr-containing sample isplaced in a diamond anvil highpressure cell (DAC) and illumi-nated with energies near the PrL3 edge (5964 eV)
the spectrometer clearly sepa-rates the Pr Lα1 (5035.2 eV)and Lα2 (5015.7 eV) emissionlines
after integration, the two peakscan be seen to change relativeintensities and even position as afunction of the incident energy:just at the absorption edge and14 eV higher
C. Segre (IIT) PHYS 570 - Fall 2016 November 16, 2016 15 / 15