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Dynamic Thinking : Patent Search and Analysis
www.wipsglobal.comWG ver3.1-150613
WIPS Headquarter. Global Business DivisionDMC Tower 18-19F, 189 Sungam-ro, Mapo-gu, Seoul, South Korea 121-904Tel +82 2 726 1130 Fax +82 2 777 7334 E-mail [email protected]
JAPAN Tel +82 2 726 1113 Fax +82 2 777 7334 E-mail [email protected]
CHINA & TAIWAN Tel +82 2 726 1104 Fax +82 2 777 7334 E-mail [email protected]
U.S. OFFICE1952 Gallows Road, Suite 110, Vienna, VA22182 Tel +1 571 268 6639 Fax +1 571 633 9517 E-mail [email protected] Worldwide Intellectual Property Service
Authorized Prior Art Search Institute.
Authorized Trademark & Design Art Search Institute.
Authorized Patent Cooperation Treaty (PCT) Prior Art Search Institute.
ASPI (Access to Specialized Patent Information) program
DB Quality Award by Korea government
Partnership
Award&Recognition
CompanyProfile
Worldwide Intellectual Property Service
About WIPS
WIPS is Korea’s first company to offer on-line worldwide patent information service. Since starting the business in 1999, the service is being used by over 3,000 companies, patent law firms, academics, governments, and R&D centers including top Korean global companies and multinationals. With over 100,000 users worldwide, WIPS has kept the number 1 spot in Korea with largest market share for over 13 yrs term. In 2012, WIPS achieved 63% market share.
DB Quality Certification(Gold-Class) by Korea Database Agency
Designated as World Class Product / Service by Korea government
Certified ISO/IEC 27001:2005 Information Security Management System
Certification BS10012:2009 Personal Information Management System
WIP
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Native Language Search Service
Chinese/English for CN database
Korean/English for KR database
Japanese/English for JP database
For more accuracy search to Asia patent database,WIPS Global newly add native language keyword search for CN/KR/JP.Now, User can use Korean/ Chinese keyword for search. (Advanced / Step search ) *Japanese will be coming soon.WG provide high quality Machine-Translation
The Leader of Asia patent
What are the Special Features of WIPS Global?
General Search
Theme Search
• Integrated Search : patent search in multiple countries with a single click
• Advanced Search : advanced search using various and exclusive search fields of WIPS
• Step Search : a cross-search of search results and information
• Number Search : a quick search using patent numbers
• Family Search : enables a quick custom search for patents by setting various search terms for patent families
• Citation Search : a quick search for citation relationships with specific document
• Company Search : enables extraction of applicable cases when wanting to analyze patent portfolios of a specific company
Search
Review
Quickly reviews and classifies a large amount of search results en bloc(user-defined tags)
Easy Viewer
View option : List, Block, Drawing type view List realignment with Family Group function
Search results
Quickly reviews major information (e.g., claims, drawing) of individual patent
Express View
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SmartAngle: Patent Statistics
Patent Analysis
• Chart Analysis : quickly and easily offers statistics of a large amount of patent information in chart forms, enables phased review of statistical information
• Cross Matrix : quickly extracts major statistics from a large amount of patent information by setting up statistics fields (X/Y Axis)
• Classification : quickly extracts the patents that satisfy the condition of review from a large amount of patent information
Download
Offers various output formats (XLS, TXT, MDB, PMDX) to allow major information of patents to be used in various ways
ThinKlear 2012
Offers editing and reporting tools to allow users to utilize the Output information in various ways
• Cla im Analys is : o ffers keyword extraction and a referential relationship with an individual patent claim, able to compare claims of published and granted patents
• Family Analysis : offers information on nations in which patent family is entered, time series information, and comparison of claims to enable multi-dimensional analysis on patent family information
• Citation Analysis : allows a multi-dimensional analysis on patent citation information through a citation map and citation statistics information
• Patent Folder : saves and shares searched results of patents
• Query Folder : saves and shares query information
• Query History : reuses the query information
Query SDI
Monitors trends through registering interested query (Keyword, IPC, etc.)
Citation SDI
Continually monitors changes to citation information in patents of interest
Family SDI
Continually monitors changes to family information in patents of interest
Monitoring
My Folder Statistics & Analysis
Download Information
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Search
List type Block type Drawing type
• Optimizes the patent search environment by offering various and exclusive search fields
• Search Type: Integrated Search / Advanced Search / Step Search / Number Search
• Additional Functions: Query Matching Board, Error Check, Setting output items out of searched results, supporting various search field operators, etc.
• Search Results View: Provide List, Block, Drawing type view-option
• Family Group Function: List realignment with Family Group
Status information of patent families
Status Information of Forward / Backward Citation
Convenient search interface for applicants’ info.
Dictionary of representative names of applicants (EN/KR)
Gen
eral
Sea
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Them
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earc
h Family Search
• Quickly extracts patent document using the search terms and keywords for family patents
• Able to quickly figure the present conditions of domestic/overseas patent applications of competitors: enables establishing patent strategies for each nation
Citation Search
• Quickly and easily search Forward / Backward Citation through inte-
grated citation information of patents from Korea, the US, Japan, and Euro pean countries
• Easily searches the current status of patents of interest (competitors’):
conveniently establishes strategies to respond to disputes
Company Search
• Search patent document of an applicant for a patent without omis sions by making a representative name for the information of affiliated companies or applicants written in various forms
• Conveniently figures the trends of competitors’ patent applications: enables continuous monitoring of competitor patent portfolios
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Easy Viewer
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• Easy Viewer is a feature that enables searching large amount of patent document rapidly and conveniently
- Provides selected abstract, drawings, and original documents by each viewers
- Item classification, download, my folder service can be all connected as needed
- Original document can be viewed directly without downloading..
- Provides a short sign and description for each selected figure.- It is a very useful feature for users who want to review all drawings at once.
View Drawings
View Document
- User can setup output options by selecting Bibliography, Abstract, summary, Representative drawing, Exemplary Claim and etc.
View PDF
Cha
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Loading patents related to OOO saved in My Folder onto SmartAngle
1. Drag & Drop : US patent
2. Select Field (First output info): Applicant’s Nationality
Present status of patents applied in the US by Japanese applicants related to (technology areas)
3. Drag & Drop : JP data
Output
Input
• Conducts a multi-dimensional review of results through various statistics fields offered by the SmartAngle and the narrow down type statistics function for searched data or a large amount of patent data saved in My Folder
• SmartAngle is able to load 10,000 cases of searched data or 10,000 cases of saved data in My Folder
Q : I want to know the present status of patents applied in the U.S. by major Japanese applicants related to (technology areas)
A : SmartAngle(Chart Analysis)
4. Select Field (secondary output info) : Primary Applicant
SmartAngle
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• Easily and quickly extracts statistical information on two-dimensional correlation of a large amount of patent data through setting up statistics information fields (X/Y Axis) for search results or a large amount of patent data saved in My Folder
• Offers various chart views of the Cross Matrix results and the view function of a list of patents
• Easily and quickly clusters the patent document search results among a large amount of patent data using filtering operators and various classification fields
• Able to quickly review extracted results using Easy Viewer
Question
Answer
Setting classification fields
Setting Classification Fields
US and 000 Corp. and G06F-017
US 2011 –XXXXXXX A1US 2005 –XXXXXXX A1
I want to know the present status of patents applied in the US by (company name) related to (technology areas)
Q
A
Cross M
atrixC
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Fam
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Cita
tion
Ana
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s • Offers a customized statistical analysis function through setting various statistics fields for the citation information of patents of interest (or competitors’) and offers visualized information of the citation relationship for user’s convenience.
• Offers integrated citation information for patents from Korea, the US, Japan, and European countries
• Offers such functions as statistics, family country profiles, time series view, and compare documents to enable a multi-dimensional analysis on family information of patents of interest (or competitors’)
• Conveniently figures the present status of competitor patents; enables strategic use of information to establish patent portfolio
Statistics
Time Series View
Family Country Profiles
Compare Documents
• Patent Portfolio• R&D Trends• Scope of Rights
Family Analysis
Visual Mode (Citation Map)Text Mode & Statistics
Analysis
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Claim
Analysis
• Offers information in diagram forms for users to conveniently analyze the classes and reference relationship among patent claims
• Offers a comparison function of claims per document and analysis function of keywords per claim for users to easily analyze public and registered patents from the same patent document and a range of rights for an individual claim
2. Analysis on Keywords by Claim 3. Disclosure of the Same Patent Document and Comparison of Claim in Published and Granted Patents
Can be used in various works such as prior art, invalidity, and infringement searches through
the convenient function of claim analysis
1.Classes of Claim and Reference Relationship Diagram
Dependent Claim
Independent Claim
Comparison of the range of rights between claims in a reference relationship
Information on keywords analysis
Highlighting major keywords
Present status of independent and dependent claims
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SD
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lect
ive
Dis
sem
inat
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of In
form
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n) • SDI is a “notification service of newly registered patents” that regularly provides users with new patent information every time applicable patent information is updated according to the user’s query of interest (Keyword, IPC, Applicant) registered on the Web SDI.
• Once the patent numbers of interest (or competitors’) are registered on the Web SDI, the updated news of patent families or citation patents of the applicable patent are regularly offered.
• SDI service can be effectively used to monitor competitors or the patent trends of technology of interest.
1. Setting Up Query SDI 3. Setting Up Family SDI
Obtaining prior art data before applying for a patent overseas
Blocking other applicants to register a patent relatedto the company’s rights
(Raising a formal objection)
Obtaining related patent data when developing new
technology
Get the trend of competitor’s patent applications
SDIUtilization of SDI Service
2. Setting Up Citation SDI
Setting the sharing person about SDI result
Setting up a range of monitoring and registering Query
Setting patent numbers of the monitoring object
Setting patent numbers of the monitoring object
Convenient management of the SDI History informationSDI Result
SDI
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My FolderM
y FolderQ
uery History
• Offers the function to save (10,000 cases/folder) patent data that will be applied to work and manage the data (data sharing and information classification)
• Enables a secondary use of the data by linking the saved data in Patent Folder with SmartAngle and Easy Viewer offered by the WIPS Global
The setting status of user-classification tags for the saved patent data in an individual folder
• Displays a list of the saved patent data in an individual folder
• Able to set up user-classification tag for individual patent data
• offers a search function of patent document in an individual folder
• Conveniently links the saved patent data in Patent Folder with other services such as Easy Viewer and SmartAngle
Setting to share the saved patent data in Patent Folder
Query Folder
• Convenient function to save and manage frequently used query information in folders
• Links the saved query information with SDI service
• Linked with Query Matching Board
• Offers the history of query information by used dates
• Offers the search terms used
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• Offers a wide range of information fields for users to use major patent information in various ways• Offers various output formats: XLS, TXT, MDB, PMDX (supported format by ThinKlear2012)
• ThinKlear2012 is a support tool for editing and analyzing patent information with an improved degree of freedom for users. Offered as software, this additional service can be used in various ways including analyzing or making a report on patent information.
• Its user interface is reinforced to enable customized analysis on downloaded patent information such as bibliographical information, patent families, citation information, applicants, and inventors from WIPS Global Advanced.
Offers various patent information fields (79 Fields) Reinforced set function for a customized output
Offers a list of patent information with representative drawing
Editing an order of output data
ThinKlear2012
Simple tool for automatic analysis Customized list of essentialsFunction to manage and edit group
work information
Supports a customized analysis
Various functions of information editing
(e.g., Standardized Applicant)
Download Information
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Data collection Earliest Records Data
US
Patents issued before 1975 Grant Date1790.07.31 ~ 1975.12.30 Full text, Full-Image(PDF), Rep. Drawings
Patent Application Publications Unexam Pub. Date2001
Full text, Full-Image(PDF), Drawings* Agent/Attorney (Published information from USPTO is provided
until Feb. 24,2011)
Patent Granted Publications Grant Date1976
Full text, Full-Image(PDF), Drawings* Individual Drawings (Grant date 2001~Present)
Assignments Information 1970Assignor / Assignee Data* Range of date provided is the registry date of assignee information
from the USPTO.
EPEuropean Patent Applications Issued Date
1978 Full text, Full-Image(PDF), Drawings
Granted European Patents Issued Date1980 Full text, Full-Image(PDF), Drawings
PCT(WO) Issued Date1978 Full text, Full-Image(PDF), Rep. Drawings
JP
Patent Application
Unexamined Publications
Unexam Pub. Date1993 Full text, Full-Image(PDF), Drawings
Unexam Pub. Date1989.01.01 ~ 1992.12.31 Full-Image(PDF)
Japanese Translation of PCT Unexam Pub. Date1996 Full text, Full-Image(PDF), Drawings
Domestic Re-Publication of PCT Unexam Pub. Date1992 Full text, Full-Image(PDF), Drawings
Patent GrantedExamined Publications Exam Pub. Date
1994.01.05 ~ 1996.03.29 Full text, Full-Image(PDF), Drawings
Granted Grant Date1996 Full text, Full-Image(PDF), Drawings
Utility ApplicationUnexamined Publications
Unexam Pub. Date1993 Full text, Full-Image(PDF), Drawings
Unexam Pub. Date1989.01.01 ~ 1992.12.31 Full-Image(PDF)
Unexamined Granted Grant Date1994
Full text, Full-Image(PDF), Drawings* Published after 1994
Utility GrantedExamined Publications Exam Pub. Date
1994.01.05 ~ 1996.03.29 Full text, Full-Image(PDF), Drawings
Granted Grant Date1996 Full text, Full-Image(PDF), Drawings
PAJ (Patent Abstract of Japan – Unexamined Applications) Unexam Pub. Date1976
Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings* JP Full-Image(PDF) (Unexam Pub. Date 1989.01.01 ~ Present)
Amendment Information (JP patent / Utility) Issued Date1993 Amendment Image (PDF)
* JP data is in Japanese language except for PAJ
KR
Patent Application Unexamined Publications Unexam Pub. Date1983 Full text, Full-Image(PDF), Drawings
Patent GrantedExamined Publications Exam Pub. Date
1979.07.12 ~ 1997.08.08 Full text, Full-Image(PDF), Drawings
Granted Grant Date1997 Full text, Full-Image(PDF), Drawings
Utility Application Unexamined Publications Unexam Pub. Date1983 Full text, Full-Image(PDF), Drawings
Utility GrantedExamined Publications Exam Pub. Date
1979.07.11 ~ 1997.07.31 Full text, Full-Image(PDF), Drawings
Granted Grant Date1996 Full text, Full-Image(PDF), Drawings
KPA (Korea Patent Abstract)KPA-A (Unexamined Applications) Unexam Pub. Date
1999 Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings
KPA-B1 (Examined Applications) Grant Date1997 Bibliographic, Abstract, Full-Image(PDF), Rep. Drawings
Amendment Information (KR patent / Utility) Issued Date2005 Amendment Image (PDF)
* Text data is offered in Korean+English depending on its fields.
CN
Patent Application Publications Unexam Pub. Date1985 Full text, Full-Image(PDF), Rep. Drawings
Patent Granted Publications Grant Date1985 Full text, Full-Image(PDF), Rep. Drawings
Utility Application Publications Unexam Pub. Date1985.09.10 ~ 1992.12.30 Full text, Full-Image(PDF), Rep. Drawings
Utility Granted Publications Grant Date1993 Full text, Full-Image(PDF), Rep. Drawings
* Text data is offered in Chinese+English depending on its fields.
DOCDB Patent Date1827
Collection of published applications from 100+ countriesBibliographic, Abstract, Legal Status
Others
FEDERAL REPUBLIC GERMANY Patent Date1861 Full text, Rep. Drawing
UNITED KINGDOM Patent Date1782 Full text, Rep. Drawing
FRANCE Patent Date1855 Full text, Rep. Drawing
RUSSIAN FEDERATION Patent Date1975 Full text, Rep. Drawing
INDIA Patent Date1900 Bibliographic, Abstract, Rep. Drawings
TAIWAN Patent Date1950 Bibliographic, Abstract
Dynamic Thinking : Patent Search and Analysis
www.wipsglobal.comWG ver3.1-150613
WIPS Headquarter. Global Business DivisionDMC Tower 18-19F, 189 Sungam-ro, Mapo-gu, Seoul, South Korea 121-904Tel +82 2 726 1130 Fax +82 2 777 7334 E-mail [email protected]
JAPAN Tel +82 2 726 1113 Fax +82 2 777 7334 E-mail [email protected]
CHINA & TAIWAN Tel +82 2 726 1104 Fax +82 2 777 7334 E-mail [email protected]
U.S. OFFICE1952 Gallows Road, Suite 110, Vienna, VA22182 Tel +1 571 268 6639 Fax +1 571 633 9517 E-mail [email protected] Worldwide Intellectual Property Service