R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
The Latchup Monitor System
Raffaello Secondo
1. The Latchup and Single Event Latchup (SEL)
2. The SEL test and Latchup Monitor system: State of the Art
3. Description of the project
Contents
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
1– The Single Event Latchup (SEL) and Latchup
A Single Event Latchup is a type of short circuit , more specifically it is the inadvertent creation of a low-impedance path between the power supply rails of a CMOS structure caused by the impact of ionized particles
A power cycle is required to correct this situation.
Other Latchup reasons on CMOS chips and/or devices:
A spike of positive or negative voltage on an input or output pin of a digital chip
Short circuit on
the power supply
Anti-latchup protection
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
2–The SEL test and Latchup Monitor system: State of The Art
Multiple devices under test usually 20-30 chips to test
simultaneously
230 MeV Proton beam facility PIF at PSI used for SEL radiation tests
Multiple devices are irradiated at the same time to increase the number of occurrences
Each devices must be supplied with an efficient anti-latchup power supply
The current waveform study after the anti-latchup intervention can help to understand the phenomenon
I(Load)
Time
LATCHUP
DETECTED
DEVICE IS
SHUT DOWN
BEHAVIOR WITHOUT
ANTI-LATCHUP
Keen Anti-Latchup Protection
Latchup Current fast acquisition
The SEL radiation tests aim at evaluating the Latchup cross section of a component off the shelf (COTS)
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
2–The SEL test and Latchup Monitor system: State of The Art
Power Supply for the Latchup protection chassis
Power Supply for the DUTs
Latchup protection chassis
BNC harness for current acquisition (DAQ sampling period is about 10s)
PXI for driving DAQ, power supplies and temperature acquisition
Temperature patch panel
Data acquisition system
Not compact and modular Problems of noise, space and transportability
A LatchUp Monitor based on commercial instrumentation:
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
3. Description of the project: The LatMon PXI card
Requirements: 0 to 15V & -15 to 0 – 3A Isolated power
outputs
16-bit voltage and current programming
16-bit 2MS/s current reading
Temperature monitoring of the DUT
Current protection trigger based on current threshold and current profile
Output disabling upon current protection triggering
Real time current consumption recording upon current protection triggering
PXI format
Hardware architecture
FPGA architecture
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
3. Description of the project
The Babele`s tower
Our LatMon system:
• Compact
• Modular (up to 34 output channels)
The state of the art
The future
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
3. Description of the project: The LabView Software developed
Management Software In LabView
An example of latchup acquisition
Latchup profiles programming
R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9th 2014
4– Follow up on the LatMON Project
- LATCHUP MONITORING:- COMPACT AND MODULAR
- ENABLES SETTING OF A CURRENT PROFILE
- RADIATION TESTS AT CHARM IN 2015.
Schedule:
- Production of a pre-series of 5 cards to test the driver on a full system
- Test of a complete system based on 17 PXI cards.