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1 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com A New Method for Testing Electrolytic Capacitors to Compare Life Expectancy 2013 IMAPS Device Packaging Conference March 11-13, 2014 Stephani Gulbrandsen 1 , Ken Cartmill 2 , Joelle Arnold 1 , Nicholas Kirsch 1 , Greg Caswell 1 1 DfR Solutions, LLC – Beltsville, MD USA 301-474-0607 2 LED Roadway Lighting – Halifax, NS Canada 877-533-5755 IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA 001759

A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

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A faster method for assessing electrolytic capacitor reliability

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Page 1: A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

1 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

A New Method for Testing

Electrolytic Capacitors to Compare

Life Expectancy 2013 IMAPS Device Packaging Conference

March 11-13, 2014

Stephani Gulbrandsen1, Ken Cartmill2, Joelle Arnold1,

Nicholas Kirsch1, Greg Caswell1

1 DfR Solutions, LLC – Beltsville, MD USA

301-474-0607 2LED Roadway Lighting – Halifax, NS Canada

877-533-5755

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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Page 2: A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

2 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Overview

o Aluminum Electrolytic Capacitors

o Introduction

o Construction

o Failure Criteria

o Ripple Current

o Wear-Out

o Life Test

o Traditional

o Trends evident in data

o Accelerated

o Calculations

o Traditional vs. Accelerated

o Accelerated Life Test

o Conditions

o Suppliers A & B

o Suppliers C & D

o Conclusions

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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Page 3: A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

3 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Overview

o Aluminum Electrolytic Capacitors

o Introduction

o Construction

o Failure Criteria

o Ripple Current

o Wear-Out

o Life Test

o Traditional

o Trends evident in data

o Accelerated

o Calculations

o Traditional vs. Accelerated

o Accelerated Life Test

o Conditions

o Suppliers A & B

o Suppliers C & D

o Conclusions

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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4 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Introduction

Al ECap 1

Al ECap 2

Datasheet lifetime

Test lifetime

Datasheet lifetime

Test lifetime

Time (hours)

Traditional life testing of Al ECaps indicates test lifetime can be slightly less

than or 2-3x greater than datasheet lifetime.

Industrial customer

communication interface

PCBA from Monico Inc.

Digital media player PCBA

from Shenzhen Sinetech

Electronic Co Ltd.

Automotive asset tracking PCBA

from Theta Engineering Inc.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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5 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Construction

Internal construction of an Al ECap with

equivalent circuit from Nippon Chemi-Con.

Different lead lengths distinguish

the anode (long) and the cathode

(short) leads.

The body consists

of an Al can

encased with a

plastic sleeve.

CT scan showing the

internal windings.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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6 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Construction

Non-hermetic seal between

bung and can allows for

evaporation of electrolyte

during operation.

A rubber bung

seals the Al can.

CT scan showing the

crimped seal

between the can

and the bung.

Smaller capacitors have

etched vents at can top.

These are designed so that

in the event of a failure,

leaking electrolyte is

directed away from the PCB.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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7 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Failure Criteria

Capacitance Change Within +/- 20% of initial value

Dissipation Factor Not more than 200% of the specified value

Leakage Current Initial specific value or less

Failure criteria defined in manufacturer datasheets.

Dissipation factor is proportional to equivalent

series resistance (ESR), so >200% increase in ESR is

classified as failed.

Increase in

leakage current

Increase in dissipation

factor (ESR);

Decrease in

capacitance

Detailed internal construction

of an Al ECap from EPCOS.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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8 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Failure Criteria

Capacitance Change Within +/- 20% of initial value

Dissipation Factor Not more than 200% of the specified value

Leakage Current Initial specific value or less

Failure criteria defined in manufacturer datasheets.

Dissipation factor is proportional to equivalent

series resistance (ESR), so >200% increase in ESR is

classified as failed.

Increase in

leakage current

Increase in dissipation

factor (ESR);

Decrease in

capacitance

Detailed internal construction

of an Al ECap from EPCOS.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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9 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Ripple Current

Rip

ple

Cur

rent

Lower Frequency

Rip

ple

Cur

rent

Lower frequencies allow the

capacitor to fully charge and

discharge.

Higher frequencies do not

allow the capacitor to fully

charge and discharge.

Larger amplitude and larger applied ripple currents

induce greater internal temperature rise.

Ripple Current

Tem

pera

ture

Higher Frequency

Rip

ple

Cur

rent

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10 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Aluminum Electrolytic Capacitors – Wear-Out

Apply ripple

and bias

e-

e-

e-

e-

Heating of the capacitor

from applied ripple

current causes

evaporation of the

electrolyte.

Internal pressure increase

from electrolyte

evaporation facilitates

electrolyte egress

between the rubber bung

and Al case.

PCB PCB

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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11 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Overview

o Aluminum Electrolytic Capacitors

o Introduction

o Construction

o Failure Criteria

o Ripple Current

o Wear-Out

o Life Test

o Traditional

o Trends evident in data

o Accelerated

o Calculations

o Traditional vs. Accelerated

o Accelerated Life Test

o Conditions

o Suppliers A & B

o Suppliers C & D

o Conclusions

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12 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Apply rated

ripple and bias

at rated

temperature.

Oven and

ripple current

heating causes

electrolyte

evaporation.

Turn off

electricity and

cool to room

temperature.

Life Test – Traditional (& Accelerated: Rate of Weight Loss)

e-

e-

Did ESR have a

>200%

increase from

the initial

value?

No. Continue

testing.

Yes. Testing

is complete.

e-

e-

Weight: 1.432 g

Weigh.

Electrical

characterization.

PCB PCB PCB

Measure ESR

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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13 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Life Test – Trends in Traditional Data

Weig

ht L

oss

Time (hours) 4000 2000 3000 1000

Time (hours) 4000 2000 3000 1000

% Inc

rease

ESR

200%

400%

600%

800%

Variable Impact on Rate

of Weight Loss

Ambient temperature

Applied ripple current

Heat dissipation

Crimp between bung and can

Linear throughout entire test

lifetime of an Al ECap population. Exponential behavior that is relatively

constant until approach time to failure.

Variable Impact on Critical

Weight Loss

Electrolyte stability

Initial ESR measurement

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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14 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Puncture a hole

in the

capacitor.

Life Test– Accelerated: Critical Weight Loss

Did ESR have a

>200%

increase from

the initial

value?

No. Continue

testing.

Yes. Testing

is complete.

Weigh.

Electrical

characterization.

Weight: 1.432 g

Oven heating

causes

electrolyte

evaporation.

Turn off heat

and cool to

room

temperature.

Measure ESR

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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15 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

1. Critical weight loss at 200% increase in ESR is calculated

using the ESR-Weight Loss curve

2. Rate of weight loss is extrapolated to the critical weight

loss and the corresponding time is recorded as the

accelerated test lifetime

Life Test– Accelerated Calculations

W

eig

ht L

oss

Time (hours) 4000 2000 3000 1000

Weight Loss

% Inc

rease

ESR

200%

400%

600%

800%

Critical weight loss

Critical weight loss

Accelerated test lifetime

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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16 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Life Test – Accelerated Wear-Out Failure Mode

As-received

Dried out, off

white paper

indicative of

electrolyte

evaporation.

Grey paper

indicative of

electrolyte

saturation. Accelerated test

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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17 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Life Test – Traditional vs. Accelerated

Accelerated test time Al ECap 1

Al ECap 2

Traditional test time

Time (hours)

Al ECap 3

Accelerated test time

Traditional test time

Accelerated test time

Traditional test time

Applied Test Conditions*

Traditional (T) Accelerated (A)

Ripple Current (I) IT = IR 0 < IA ≤ IR

Bias Voltage (V) VT = VR 0 < VA ≤ VR

Temperature (T) TT = TR TA = TR

* Datasheet rating (R). All ripple applied at 120 Hz.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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18 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Overview

o Aluminum Electrolytic Capacitors

o Introduction

o Construction

o Failure Criteria

o Ripple Current

o Wear-Out

o Life Test

o Traditional

o Trends evident in data

o Accelerated

o Calculations

o Traditional vs. Accelerated

o Accelerated Life Test

o Conditions

o Suppliers A & B

o Suppliers C & D

o Conclusions

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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19 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

o The accelerated test approached was used to compare the behavior of the following two pairs of Al ECaps.

Accelerated Life Test – Conditions

Supplier Capacitance

(mF)

Size

(mm)

Rated

Lifetime

(hrs)

Voltage

(V)

Test

Voltage

(V)

Rated

Ripple

Current

(mA RMS)

Test

Ripple

Current*

(mA RMS)

A 68 18 x 31.5 10,000 450 225 1575 300

B 68 18 x 40 >15,000 450 225 1517 300

C 2.2 10 x 20 10,175 450 225 43 20

D 2.2 10 x 20 5,000 450 225 29 15

* Ripple applied at 120 Hz.

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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20 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

o Supplier ARate of Weight Loss ≈ ½ Supplier BRate of Weight Loss

o Supplier A capacitors have a better seal between the can and bung

Accelerated Life Test – Suppliers A & B Rate of Weight Loss

450 V, 68 mF

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21 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Accelerated Life Test – Suppliers A & B Critical Weight Loss

450 V, 68 mF

o Supplier ACritical Weight Loss ≈ Supplier BCritical Weight Loss

o Chemical stability of Supplier A and Supplier B electrolyte is comparable

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22 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

o Accelerated life test results indicate that the Supplier A Al

ECap is more reliable than Supplier B

o This is opposite of what the datasheet lifetimes suggest

Accelerated Life Test – Suppliers A & B Comparison

Supplier Minimum Accelerated

Lifetime (hours)

Maximum Accelerated

Lifetime (hours)

Datasheet

Lifetime (hours)

A 21,130 29,140 10,000

B 12,540 16,030 >15,000

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23 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Accelerated Life Test – Suppliers C & D Rate of Weight Loss

450 V, 2.2 mF

o Supplier CRate of Weight Loss ≈ 2 Supplier DRate of Weight Loss

o Supplier C capacitors have a worse seal between the Al can and bung

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24 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Accelerated Life Test – Suppliers C & D Critical Weight Loss

450 V, 2.2 mF

o Supplier CCritical Weight Loss ≈ 2.5 Supplier DCritical Weight Loss

o Supplier C capacitors have a more chemically stable electrolyte

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25 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Supplier Minimum Accelerated

Lifetime (hours)

Maximum Accelerated

Lifetime (hours)

Datasheet

Lifetime (hours)

C 12,010 17,170 10,175

D 7,910 11,160 5,000

Accelerated Life Test – Suppliers C & D Comparison

o Accelerated life test results indicate that the Supplier C Al

ECap is more reliable than Supplier D

o This supports what the datasheet lifetimes suggest

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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Page 26: A new-method-for-testing-electrolytic-capacitors-to-compare-life-expectancy

26 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Overview

o Aluminum Electrolytic Capacitors

o Introduction

o Construction

o Failure Criteria

o Ripple Current

o Wear-Out

o Life Test

o Traditional

o Trends evident in data

o Accelerated

o Calculations

o Traditional vs. Accelerated

o Accelerated Life Test

o Conditions

o Suppliers A & B

o Suppliers C & D

o Conclusions

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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27 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

o The Al ECap accelerated life test approach is an effective

way to compare the reliability of the same capacitors

from different manufacturers under applied test conditions

o Test results indicated that datasheet lifetime values can be

inaccurate when compared to the reliability test results

Conclusions

Accelerated test time Al ECap 1

Al ECap 2

Traditional test time

Time (hours)

Al ECap 3

Accelerated test time

Traditional test time

Accelerated test time

Traditional test time

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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28 9000 Virginia Manor Rd Ste 290, Beltsville MD 20705 | 301-474-0607 | www.dfrsolutions.com

Many thanks to Steph, who is the primary author, for letting me present her findings.

Our appreciation as well goes to our collaborators, LED Roadway, for allowing us to

publish the findings of this study.

Questions?

IMAPS 10th International Conference on Device Packaging | March 10-13, 2013 | Fountain Hills, AZ USA

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