The top documents tagged [bulk silicon]

1.Introduction and application. 2.Ion implantation tools. 3.Dopant distribution. 4.Mask thickness and lateral distribution. 5.Effect of channeling. 6.Damage
Documents 1.Introduction and application. 2.Ion implantation tools. 3.Dopant distribution. 4.Mask thickness and lateral distribution. 5.Effect of channeling. 6.Damage

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Estimation and Compensation of Process Induced Variations in Nanoscale Tunnel Field Effect Transistors (TFETs) for Improved Reliability
Documents Estimation and Compensation of Process Induced Variations in Nanoscale Tunnel Field Effect Transistors (TFETs) for Improved Reliability

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4-1 FINAL for Tom Dillinger
Documents 4-1 FINAL for Tom Dillinger

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Laser Testing of Silicon Detectors Rhorry Gauld University of Saint Andrews IPM program – PPD Mentor: Ronald Lipton 30/07/08 1
Documents Laser Testing of Silicon Detectors Rhorry Gauld University of Saint Andrews IPM program – PPD Mentor: Ronald Lipton 30/07/08 1

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Analytical Thermal Placement for VLSI Lifetime Improvement and Minimum Performance Variation Andrew B. Kahng †, Sung-Mo Kang ‡, Wei Li ‡, Bao Liu † † UC
Documents Analytical Thermal Placement for VLSI Lifetime Improvement and Minimum Performance Variation Andrew B. Kahng †, Sung-Mo Kang ‡, Wei Li ‡, Bao Liu † † UC

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The electro-thermal properties of integrated circuit microbolometers
Documents The electro-thermal properties of integrated circuit microbolometers

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Memory Aid “a hairpin is lighter than a frying pan”
Documents Memory Aid “a hairpin is lighter than a frying pan”

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Dislocation-Interface Interactions in Silicon August 10 th, 2011 3PM Lucas Hale Post Doc Sandia National Laboratories, CA Jonathan Zimmerman, Xiaowang
Documents Dislocation-Interface Interactions in Silicon August 10 th, 2011 3PM Lucas Hale Post Doc Sandia National Laboratories, CA Jonathan Zimmerman, Xiaowang

216 views

Force Field Development for Silicon Carbides, Bulk Silicon and Oxidized Silicon surfaces with Graphite Santiago Solares, Adri van Duin and William A. Goddard
Documents Force Field Development for Silicon Carbides, Bulk Silicon and Oxidized Silicon surfaces with Graphite Santiago Solares, Adri van Duin and William A. Goddard

240 views

Jim Brau, Amsterdam, April 2, 2003 1 Nikolai Sinev and Jim Brau University of Oregon April 2, 2003 Radiation Damage Studies of Vertex Detector CCDs First
Documents Jim Brau, Amsterdam, April 2, 2003 1 Nikolai Sinev and Jim Brau University of Oregon April 2, 2003 Radiation Damage Studies of Vertex Detector CCDs First

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Radiation Damage Studies of Vertex Detector CCDs
Documents Radiation Damage Studies of Vertex Detector CCDs

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Introduction to Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) Chapter 7, Anderson and Anderson
Documents Introduction to Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) Chapter 7, Anderson and Anderson

313 views