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Electron Microscope
Comparison b/w light and electron microscopes
LIGHT MICROSCOPE ELECTRON MICROSCOPE
Magnification can be done upto 2000 times
Resolving power is less
Photons are involved
Magnification can be done upto 2 million times
Have much greater resolving power than ordinary microscope
Electrons are involved
3
Scale
Reason for greater resolution and magnification of electron
microscopeWavelength of an electron[de Broglie] is very much
smaller than that of a light photon
Wavelength of an electron = λ=h/(√2mE)Wavelength of a light photon = λ=h/E
First Electron Microscope
Invented by Ernst Ruska
Year-1933
He was awarded the Nobel Prize for physics for his invention in 1986
Construction Of An Electron
Microscope
Construction of EM [TEM]
THE ELECTRON GUN
WORKING OF AN ELECTRON MICROSCOPE
elec mic intro.avi
Types of ELECTRON MICROSCOPE
Scanning EM
Transmission EM
Reflection EM
Scanning Transmission EM
TRANSMISSION ELECTRON
MICROSCOPE
Developed by ERNST RUSKA and MAX KNOLL in 1931 in germany
It was the first type of electron microscope to be invented
TEM
When a beam of electrons is passed through a specimen , a part of it is transmitted and this part when projected on fluorescent screen , its image can be seen by the observer
PRINCIPLE
Construction and working
TEM1. ELECTRON GUN2. ELECTROMAGNE
TIC LENSES3. VACUUM PUMPS4. OPENING TO
INSERT SAMPLES
5. OPERATION PANEL
6. DISPLAY SCREEN 7. WATER SUPPLY
TO COOL THE INSTRUMENT
ELECTRON GUN
The electron gun produces a stream of monochromatic electrons of
energy 100-400keV .
The extraction of electrons is of two types
1. Thermionic emission using thermal energy
2. Field emission by applying very large electric field 1010 A/m
FE gun is more expensive and must be used in high vacuum
conditions.
FIELD EMISSION GUN
The beam of electrons is focused using condenser lenses [1&2]
The beam is restricted by the condensor aperture
Then it strikes the specimen and transmitted
The transmitted portion is focused by Objective Lens into an
image
Intermediate and projector lenses enlarge the image
Image is formed on phosphor screen
Darker area – few electrons – thick region
Lighter area – more electrons – thin region.
Transmission electron microscopy
Advantages
versatile technique for the characterisation
of materials
very high resolution
Resolving power is
Magnifi cation is 1,000,000 times greater
than the size of the object
Information about crystal structure and
chemical composition can be collected
simultaneously
OA21
Disadvantages
No 3-D image
Aberrations due to lenses
Absorption of electrons heats up the sample and
changes its characteristics
Larger current density[j] and hence more current I=jA
{A- Illuminated area}
Specimen must be thin because due to strong
absorption of electrons , the penetration depth is small
In nano science , to find the internal structure of nanomaterials
To get 2-D Image of biological cells , virus , bacteria etc.
In fields such as thin film technology , metallurgy , microbiology etc.
In studying the compositions of paints , alloys etc.
APPLICATIONS
Scanning Electron
Microscope
24
The Scanning Electron Microscopeuses electrons reflected from the surface of a specimen to create image
It captures the images of the specimen surface by scanning it with a high-energy beam of electrons , in a scan pattern
produces a 3-dimensional image of specimen’s surface features
PRINCIPLE
The electrons interact with the atoms that make up the specimen, producing signals that contain information about its surface topography , composition and other properties such as electrical conductivity
CONSTRUCTIONPARTS of SEM
Electron gun
Anode
Electromagnetic lens
Scanning coils
Specimen Holder
Detectors
CRO Tube
SEM1. e lec t ron gun2. e lec t romagnet
i c l enses3. vacuum
pumps4. open ing to
i nse r t spec imen
5. opera t ion pane l
6. sc reen fo r d i sp lay
7. c ryo – un i t f o r c ryo sem
8. e lec t ron i c i n s t ruments
PREPARATION OF SAMPLESSamples must be electrically conductive
If a non conductive material has to be viewed , then it has to be coated by a thin layer of electrically conductive material
This coating is done using a sputter coater
GOLD COATED INSECT WHICH IS TO BE VIEWED THROUGH SEM
SPUTTERING
WORKINGSEM produces signals in the form of secondary electrons , backscattered electrons, characteristic x-rays , light , specimen current, and transmitted electrons
These signals are formed by the interaction of the electron beam with the surface of the specimen and require specialized detectors for their detection
Depth of the specimen can be expressed in the image
Back scattering of electrons help to detect the distribution of elements in the specimen
CHARACTERISTIC X-RAY SIGNAL
Characteristic x-ray signals are formed when the electron beam removes an inner shell electron of the sample causing a high energy electron to fill the space and release energy
Help to identify the composition of elements in sample
Scanning Electron Microscope
ADVANTAGES OF SEM
used to examine specimens of large thickness
Image can be directly viewed
3-Dimensional image can be obtained
has large depth of focus
very high magnifi cation from x25 to x250,000
DISADVATAGES OF SEM• The Resolution of image is poor
• preparation of sample is diff icult and tedious
• some samples can loose their structural property due to their interaction with the electrons
APPLICATIONS Specimens of large thickness can be examined
wide application in medical , science and engineering fields
To find the structural composition of paper pulps, ceramic materials , polymers etc.
Used to get 3-D image of biological cells, DNA , Bacteria etc.
ComparisonSEM TEM
SEM AND TEM PHOTOSSEM TEM
Comparison of images
SEM of the compound eye of a fly!
TEM of bacteria
Some more images obtained using SEM
SEM of Yersinia pestis – which causes plague
SEM image of Streptococcus pyogenes , which causes scarlet fever
EM Image of the chloroplast of spinach
EM Image of RBC
SEM Image of a mesh
RBC OF MAN
NEURON CELL
MOSQUITO
CULTURED CELLS OF HUMAN BEING
HUMAN CELLS
HEAD OF A BLACK ANT
Websites for further info:www.nobelprize.org
www.wikipedia.com
www.pbrc.hawaii.edu/microangela
www.mos.org/sln/SEM/
www.britannica.com/EBchecked/topic-art/183561/110970/Scanning-electron-microscope
Presentation done by…
SHANTHA KUMAR . TEEE
RMD ENGG COLLEGE
THANK YOU!