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OBSERVATIONS AND ANALYSES OF DISLOCATIONS
AND STACKING FAULTS IN THE MASSIVE gm PHASE IN
A QUENCHED Ti±46.5 AT.% Al ALLOY
P. WANG1, M. KUMAR2, D. VEERARAGHAVAN1 and V. K. VASUDEVAN1
1Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, OH 45221-0012 and 2Department of Mechanical Engineering, Johns Hopkins University, Baltimore, MD 21218-
2686, U.S.A.
(Received 27 January 1997; accepted 21 July 1997)
AbstractÐThe defect structures in the massively formed gamma (gm) grains in a Ti±46.5 at.% Al alloy,rapidly quenched from the high-temperature a-phase ®eld, have been studied using transmission elec-tron microscopy (TEM). The results reveal that the defect structures are composed of dislocations,stacking faults and antiphase boundaries intimately associated with dislocations or stacking faults. Con-trast analysis indicates that both 1/2<110] and 1/2<101] unit dislocations were present in gm phase,with the latter linked by highly curved non-conservative antiphase boundaries. Comparison of exper-imental and computer simulated TEM images established that wide stacking faults, which are createdby the dissociations of 1/2h101i unit dislocations, lie on {111} planes and are bound by b= 1/6h121iShockley partial dislocations of all possible types. In addition, antiphase boundaries are found to com-mence or terminate on the stacking faults at the partial dislocations with b= 1/6<121], but not thosewith b= 1/6 < 112]. Based on the observations and subsequent analyses, a model for the formation ofthese defectsÐinvolving the occurrence of an intermediate disordered f.c.c. phase during the a4 gmmassive transformationÐis proposed. # 1997 Acta Metallurgica Inc.
1. INTRODUCTION
Since the ®rst report of the a 4 gm massive
transformation in rapidly quenched TiAl alloys
by Wang and co-workers [1, 2], several groups
[3±12], including themselves, have reported the
observation of defects such as dislocations, stack-
ing faults (SFs), microtwins and antiphase
boundaries (APBs) in the massive gm grains.
However, no detailed studies of the dislocations
and SFs in the gm phase have been performed,
although the APB-like defects have been charac-
terized in detail [4±12] and models for their for-
mation mechanisms put forth [6, 9±12]. The aim
of this paper is to present ®rst time TEM obser-
vations elucidating the nature of the SFs and
their bounding dislocations, as well as of other
dislocations found singly or in association with
the APB-like defects in gm; the detailed structural
characteristics of the APB-like defects themselves
are considered in a follow-on paper [13]. The
nature of the stacking faults and the bounding
partials has been established experimentally and
by comparison of experimental and simulated
images. A model for the formation of these
defects during the a 4 gm massive transformation
is proposed based on these observations.
2. EXPERIMENTAL PROCEDURE
The Ti±46.5 at.% Al alloy was obtained as a 250g arc-melted ingot in the cast + hot isostatically
pressed (12008C, 2h, 105 MPa) condition. Wetchemical analysis gave the actual alloy compositionas Ti±46.54 at.% Al, with 0.051 wt% oxygen, 0.005
wt% nitrogen and 0.012 wt% carbon being presentas impurities. Sectioned samples of the alloy were
coated with a protective glass±ceramic [1, 2], thensolutionized in the single phase a regionÐ13808Cfor 20 minÐand subsequently water or iced-brinequenched. Thin foils for TEM were prepared from
the quenched samples using conditions reportedelsewhere [1, 2], and observed in a Philips CM20
TEM operated at 200 kV, utilizing bright ®eld(BF), superlattice dark ®eld (SLDF), weak beam
dark ®eld (WBDF) and selected area di�raction(SAD) modes. The defect structures in the gm and
a2 phases were examined under two-beam con-ditions using a variety of low-index g-vectors. Onlyrepresentative micrographs are presented in this
paper.
Conventional g�b type contrast analysis [14] wasused to determine the Burgers' vectors of unit dislo-cations, as well as of the two individual partial dis-
locations bounding the geometrical faults and thedisplacement vectors associated with the faults. BF
Acta mater. Vol. 46, No. 1, pp. 13±30, 1998# 1997 Acta Metallurgica Inc.
Published by Elsevier Science Ltd. All rights reservedPrinted in Great Britain
1359-6454/98 $19.00+0.00PII: S1359-6454(97)00237-1
13
and WBDF images from di�erent g vectors werecompared and the invisibility criterion applied
(g.b= 0 for unit dislocations and g.b = 0 or 1/3for Shockley partial dislocations). However, themagnitude of the vectors associated with the partial
dislocations bounding stacking faults could not bedetermined entirely in this manner. To establishexactly the direction and magnitude of the individ-
ual partial dislocations, experimental BF imageswere compared with simulated images of variouspossible con®gurations. In particular, the number
and intensity of fringes and the placement of brightand dark lobes along the dislocation lines in theimages were compared. The simulations were car-ried out using CUFOUR [15], a many-beam pro-
gram based on the earlier two-beam program ofHead et al. [16]. The program, CUFOUR [15], wasoriginally written for cubic materials, but sub-
sequently modi®ed for tetragonal crystals [17]. Thegeneralized cross-section formalized by Head et al.[16] was used in the calculations. Use of this cross-
section assumes that the dislocation line direction isacute to the foil normal, and this ®xes the place-ment of the dislocation line (direction) from the left
(bottom of foil) to the right (top of the foil) of thesimulated image. Hence, the leading dislocation isalways at the top of the image and the trailing par-tial at the bottom. Stacking faults, which can be
distinguished from APBs because of the di�erencesin contrast characteristics of the outermost fringesin two-beam BF±DF images (symmetrical±asymme-
trical vs symmetrical±symmetrical, i.e. complemen-tary), can be established to be intrinsic or extrinsicby the method of Gevers et al. [18]. However, as
pointed out by Viguier et al. [17] errors in this esti-mation can arise owing to unusual foil geometries.Hence, the nature of the stacking faults was alsoestablished by image simulations. The elastic con-
stants for Ll0±TiAl were obtained from the work ofTanaka et al. [19], and extinction distances andabsorption coe�cients were calculated using the
EMS program [20]. In all cases three di�ractedbeams in the systematic row of the re¯ection andone transmitted beam (ÿg, 0, +g, 2g) were con-
sidered. The parentheses used with the Miller indi-ces of directions and planes in the text follow theconvention introduced for TiAl by Hug et al.
[21, 22]: in the notation <hkl] or {hkl), only h and kare mutually permutable; l is ®xed and can be posi-tive or negative.
3. RESULTS
Optical microscopy observations of the rapidlyquenched samples of the Ti±46.54 Al alloy revealeda microstructure consisting of darkly etched massive
gm in a light a2 matrix, similar to those reportedpreviously in the same alloy [2]. Figure 1(a) is a BFimage, recorded using g = 002, of a typical regionof the gm phase showing several dislocations, a few
SFs and highly curved APB-like defects. The latter
reveal contrast even when imaged with a fundamen-tal re¯ection [Fig. 1(a)], similar to the observationsof Li and Loretto [7] and Zhang and co-workers
[8±12]. The displacement vector, R, of these APBshas been proposed to be 1/2<101] + DR =05%of R, the latter being responsible for the obser-
vation of contrast with fundamental re¯ections [7].The APB-like defects were often found to be com-
posed of a partially or completely ®lled thin layerof a g variant with c-axis rotated 908 relative to thesurrounding g matrix, somewhat similar to the situ-
ation reported by Zhang and co-workers [8±12].Nevertheless, in the interest of brevity, these APB-like defects are referred to simply as APBs in the
remainder of the text. The structural characteristicsof the APBs are considered in detail in a follow-onpaper [13].
A striking feature is that the APBs commence orterminate at dislocations; pairs of these dislocations
are shown labeled A±B, C±D, E±F and G±H inFig. 1(a) and (b). Details of the contrast analysis ofthe dislocations are given in Table 1, and represen-
tative images are shown in Fig. 1. Since all of thesedislocations are visible in the BF±WBDF image
pair [Fig. 1(a), (b)], recorded using g = 002, and inthe WBDF images recorded using g = 200[Fig. 1(c)], g=111 [Fig. 1(d)] and g = 111 [Fig. 1(e)],
but invisible with g = 111 [Fig. 1(f)] and g = 111(Table 1), their Burgers vector is determined to bebA±H=1/2[101] (in the ordered TiAl lattice this is
one half of the Burgers vector of a [101] superdislo-cation). Stereographic trace analysis revealed thatthese dislocations were mixed (608) or edge in char-
acter, with line directions parallel to the [011] or[121] directions, respectively, and were lying on the
(111) plane. Furthermore, the observations revealthat the APBs run through the foil and the dislo-cations at which they terminate show the oscillatory
contrast that is characteristic of dislocations thatare inclined and running top to bottom through thethickness of the foil [14]. This means that the APBs
are not terminated at the foil surface and the unitdislocations at the ends have not been produced
because of sectioning of the APBs by the foil sur-faces.Examination of many other areas of the sample
revealed the same feature, namely, APBs linked bypairs of b= 1/2<101] dislocations or by a1/2<101] dislocation at one end, with the other
end terminating at a g intervariant domain or high-/low-angle boundary. Examples of the latter are
shown in Fig. 2, where the APBs labeled A and Bare attached to the b= 1/2 [101] dislocationslabeled A1 and B1, respectively, at one end in the
middle of the micrographs and to a g domain/low-angle boundary labeled DB at the other (upper)end. The APB labeled C is attached to one end to
the dislocation labeled C1, which has bC1=1/2[101].These dislocations were determined to be mixed 308
WANG et al.: OBSERVATIONS AND ANALYSES14
(A1, B1) or near-screw (C1) in character and lying
on the (111) plane. In some areas, APBs were
observed as closed loops without any association
with dislocations. The mechanism of formation of
these APBs is considered elsewhere [13].
A few undissociated 1/2<110] unit dislocations
were also observed (those labeled I1, I3, J2, J3 in
Fig. 1, set D in Fig. 2) and in this case no APBs
were found to be associated with them. For
example, the dislocations labeled I1, I3 in Fig. 1
have b=21/2[110], since they are visible with
g= 200 [Fig. 1(c)], g= 111 [Fig. 1(e)] and g = 111
[Fig. 1(f)], but practically invisible with g = 002
[Fig. 1(a),(b)], g=111 [Fig. 1(d)] and g = 111
(Table 1). Similarly, the dislocations labeled J2, J3
have b=21/2[110], since they are visible with
g= 200 [Fig. 1(c)], g=111 [Fig. 1(d)] and g = 111
(Table 1), but practically invisible with g = 002
Fig. 1(a,b).
WANG et al.: OBSERVATIONS AND ANALYSES 15
[Fig. 1(a),(b)], g= 111 [Fig. 1(e)] and g= 111
[Fig. 1(f)]. Stereographic analysis established that
dislocations I1±I3 and J1±J3 were mixed 308 and
458 in character and hence lying on the (111) and
(111) planes, respectively; this is responsible for the
weak, residual contrast seen from these dislocations
in the image with g = 002. The dislocations I2 and
J1 have b =21/2[110] and b =21/2[110], respect-
ively, although they appear to be visible in the
image with g= 002. This is because APBs appar-
ently pass through these dislocations [Fig. 1(a),(b)]
and the ensuing superimposition a�ects image con-
trast. Also, these dislocations appear to have
already dissociated into Shockley partial dislo-
cations with the associated SF. This can be seen
clearly with dislocation I2, but is just discernible
with dislocation J1. For dislocation I2, the dis-
sociation occurs according to:
Fig. 1(c,d).
WANG et al.: OBSERVATIONS AND ANALYSES16
1
2�110� ! 1
6�21�1� � SF� 1
6�121�
Thus, in the image with g= 002, the SF is expected
to be visible (a= 2p�g�R= 2p/3), whereas both the
bounding Shockley partials are expected to be invis-
ible (g�b = 1/3), exactly as observed in Fig. 1(b).
The dislocation set D (Fig. 2) was determined to
have bD=21/2[110], a line direction of [011] and
hence lying on the (111) plane. Owing to their
Fig. 1. TEM micrographs showing dislocations and APBs in the massive gm phase in the quenched Ti±46.54Al alloy. (a), (b) BF and WBDF images recorded using g = 200 (B0[010]), (c)±(f) WBDF micro-graphs recorded using (c) g= 200 (B0[010]), (d) g=111 (B0[110]), (e) g= 111 (B0[011] and (f)g = 111 (B0[121]), respectively. Note the close association between the APBs and 1/2[101] dislocations(labeled A±H). Unit dislocations labeled I1±13 and J1±J3 have b =21/2[110] and b=21/2[110],
respectively.
WANG et al.: OBSERVATIONS AND ANALYSES 17
Table 1. Experimentally observed contrast$ from dislocations labeled A± J in Fig. 1 and deduced Burgers vectors
Operatingre¯ection (g) Beam Direction (B) Dislocations A±H Dislocations I1±I3 Dislocations J1±J3 Figure No.
002 0[010] V W/I W/I 1(a), 1(b)200 0[010] V V V 1(c)111 0[110] V I V 1(d)111 0[011] V V I 1(e)111 0[121] I V I 1(f)111 0[011] I I V Ð022 0[011] V V V Ð202 0[121] V V V Ð
21/2[101](111) 21/2[110](111) 21/2[110](111)
$ W = weak; I = Invisible and V = Visible
Fig. 2(a,b).
WANG et al.: OBSERVATIONS AND ANALYSES18
mixed 608 character, the dislocations in this set
show weak, residual contrast in the images obtained
with g= 002/001 [Fig. 2(a),(b)].
Another remarkable feature observed in the gmphase was the presence of many wide SFs, with
APBs commencing or terminating at the partial dis-
locations bounding these faults, as shown, for
example, in Fig. 3. Consider the SFs labeled A and
B and the partial dislocations at the ends of these
faults labeled A1±A2 and B1. Fault A was deter-
Fig. 2. TEM micrographs showing examples of dislocations and APBs in the massive gm phase in thequenched Ti±46.54Al alloy. (a) BF image g= 002, (B0[010]), (b) SLDF image g= 001 (B0[010]; (c),(d) WBDF micrographs recorded using g=111 (B0[110]) and g=111 (B0[110]). The APBs labeled Aand B are attached to b= 1/2[101] unit dislocations labeled A1, B1 at the bottom ends and to adomain/low-angle boundary, labeled DB, at the upper ends. The APB labeled C is attached at one endto a b = 1/2[101] unit dislocation. The set of unit dislocations labeled D and shown by arrows have
b=21/2[110].
WANG et al.: OBSERVATIONS AND ANALYSES 19
mined to lie on the (111) plane, whereas B, which is
partly attached to the bottom of fault A, was deter-
mined to lie on the (111) plane. The partial A1 is
visible with g= 200 [Fig. 3(c)], but invisible (weak
in contrast) with g = 002 [Fig. 3(a),(b)], g = 111
[Fig. 3(d)] and g = 111 (Table 2). Thus, its Burgers
vector is bA1=21/x[211], where x= 3 or 6. The
partial A2 is visible with g = 002 [Fig. 3(a),(b)] and
g = 111 [Fig. 3(d)], but invisible (weak in contrast)
with g= 200 [Fig. 3(c)] and g = 111 (Table 2),
which gives its Burgers vector as bA2=21/x[112]
(where x= 3 or 6). By stereographic trace analysis,
both partials were determined to have line direc-
tions parallel to [101], which means that the partials
are mixed (308) in character and lie on the (111)
plane. The Burgers vector analysis of these dislo-
cations was self-consistent with the contrast
observed using a number of other g-vectors
(Table 2), but all of the images from these are not
shown herein. Another aspect to note in Fig. 3 is
that APBs are visible with weak contrast; these are
attached to the end of the stacking fault A, but
only at the partial with bA1=21/x[211] and not at
the partial with bA2=21/x[112]. A couple of APBs
can also be seen passing through fault A. The
Burgers vector of partial B1 was determined in a
similar way to be bB1=21/x[112].
Image simulations were carried out to provide
further con®rmation of the nature of the stacking
faults and the Burgers vectors of the partial dislo-
Fig. 3. TEM micrographs showing stacking faults, their bounding Shockley partial dislocations andAPBs in the massive gm phase in the quenched Ti±46.54Al alloy. Faults labeled A and B with boundingShockley partials A1±A2 and B1 are shown. (a), (b) BF±WBDF image pairs recorded using g= 002(B0[010]); (c), (d) WBDF micrographs recorded using g= 200 (B0[010]) and g = 111 (B0[110]), re-
spectively. The dislocation labeled C has b= 1/2[101].
WANG et al.: OBSERVATIONS AND ANALYSES20
cations associated with them. Experimental images
of the fault labeled A in Fig. 3(a), recorded under
two di�erent di�raction conditions, are shown in
Fig. 4(a), (b)Ði. From analysis of the contrast in
these images as discussed above, it appears that the
partial dislocations on the (111) plane have the fol-
lowing Burgers vectors: 21/x[211] and 21/x[112],
where x = 3 or 6. Image simulations were carried
out for all possibilities of the h101i dislocations (i.e.
1/2[101], [101], 1/2[011], [011] and 1/2[110]) disso-
ciating on the (111) plane to introduce a single geo-
metrical fault bounded by two partial dislocations,
and assuming the fault to be extrinsic, intrinsic, or
a complex fault in the ordered lattice. (In the inter-
ests of space only the pertinent images will be pre-
sented.)
Based on the images obtained from computer
simulations, it was possible to narrow down the
Burgers vector of the undissociated dislocation to
be in the [101] direction. Simulated images of the
dissociated dislocations are shown along with the
experimental images obtained with g= [200]
[Fig. 4(a)Ði] and [202] [Fig. 4(b)Ði] for the three
cases where btotal=1/2[101] [Fig. 4(a,b)Ðii], 1/
2[110] [Fig. 4(a,b)Ðiii] or 1/2[011] [Fig. 4(a,b)Ðiv]
with single Shockley partial dislocations bounding
the fault, and the fourth case where btotal=[101]
[Fig. 4(a,b)Ðv] with double Shockley partial dislo-
cations bounding the fault. It is judged from the
number and placement of the lobes along the dislo-
cation line in the simulated images that the closest
match with the experimental images [Fig. 4(a,b)Ði]
is obtained for the ®rst case [Fig. 4(a,b)Ðii], where
the dissociation occurs (on the (111) plane) in the
following manner:
1
2��10�1� ! 1
6��21�1� � SF� 1
6��1�2�1�
These results con®rm the postulated Burgers' vec-
tors of the partial dislocations bounding SF A,
which were deduced from the set of images in Fig. 3
and those recorded using other g-vectors (Table 2).
The mode of dissociation is found to involve the
formation of an intrinsic stacking fault (relative to
the Thompson tetrahedron for an ordinary f.c.c.
lattice), as the simulated images associated with the
extrinsic stacking fault (not shown) caused by dis-
sociation of the dislocation (with respect to a disor-
dered f.c.c. lattice) were not in agreement with the
experimental images. (It is more appropriate to
report the nature of the stacking fault in terms of
the disordered f.c.c. lattice and not the ordered glattice as will be discussed in the next section). The
dislocation labeled C in Fig. 3 was determined to
have bc=21/2[101], a line direction of [211] (308mixed) and hence lying on the (111) plane. An APB
can be seen attached to this dislocation.
Figure 5 shows another region containing a
stacking fault and APBs. Contrast analysis of the
fault labeled A reveals that in this case the fault
plane is (111) and the bounding partials labeled A1
and A2 have Burger's vectors given by bA1=21/
x[211] and bA2=21/x[121], respectively, where
x = 3 or 6; the line directions were determined by
stereographic trace analysis to be [213] and [112],
respectively. For instance, partial A1 is visible with
g= 200 [Fig. 5(d)], but invisible (weak in contrast)
with g = 002 [Fig. 5(a),(c)], g = 111 [Fig. 5(e)] and
g= 111 [Fig. 5(f)], whereas partial A2 is visible
with g = 111 [Fig. 5(e)], but invisible (weak in con-
trast) with g= 002 [Fig. 5(a),(c)], g= 200 [Fig. 5(d)]
and g= 111 [Fig. 5(f)]. This analysis was self-con-
sistent with the contrast observed in the images
recorded utilizing other g-vectors (Table 3).
Further con®rmation of the determined Burgers
vectors of the partials and the SF was obtained by
comparing, as before, experimental images recorded
under two di�erent conditions [Fig. 6(a),(b)Ði]
with simulated images [Fig. 6(a),(b)Ðii±iv], assum-
ing the fault is produced by the dissociation of
1/2[110] [Fig. 6(a), (b)Ðii], 1/2[101] [Fig. 6(a),
(b)Ðiii], and 1/2[011] [Fig. 6(a),(b)Ðiv] unit dislo-
cations. The best match is obtained for the ®rst set
of simulated images [Fig. 6(a),(b)Ðii], correspond-
ing to a dissociated 1/2[110] dislocation leading to
an intrinsic stacking fault (with respect to a disor-
dered f.c.c. lattice), but not the other possible unit
dislocation 1/2[101] [Fig. 6(a),(b)Ðiii] and 1/2[011]
[Fig. 6(a),(b)Ðiv] or superdislocation (not shown)
con®gurations on the (111) plane. The dissociation
in this case proceeds as follows:
Table 2. Experimentally observed contrast$ from fault A and associated partials A1, A2 in Fig. 3 and deduced fault displacement anddislocation burgers vector
Operatingre¯ection (g) Beam Direction (B) Partial dislocation A1 Partial dislocation A2 Stacking fault A Figure No.
002 0[010] W/I V V 3(a), 3(b)200 0[010] V W/I V 3(c), 4(a)Ði111 0[110] W/I V V 3(d)111 0[110] I I I Ð202 0[010] V V I 4(b)Ði220 0[110] W/I V V Ð022 0[011] I V I Ð202 0[010] W/I W/I V Ð
21/x[211] 21/x[112] Rf=1/3[111]
$W= weak; I = Invisible and V = Visible
WANG et al.: OBSERVATIONS AND ANALYSES 21
1
2�110� ! 1
6��211� � SF� 1
6��12�1�
An important feature to note is that unlike the situ-
ation with the stacking faults in Fig. 3, APBs are
seen to be attached to both the partials bounding
the stacking fault in Fig. 5. These APBs can be seen
clearly in the images in Fig. 5(b),(f). The other ends
of these APBs terminate at a grain boundary visible
at the left side of the micrographs in Fig. 5. Notice
Fig. 4. Experimental (i) and simulated (ii±v) BF image pairs of the fault labeled A in Fig. 2 under twodi�erent di�racting conditions: (a) g= 200, B0[010] and (b) g=202, B0[010]. The con®gurations corre-sponding the dissociation of di�erent dislocations (unit and super-) on the (111) plane are shown in thesimulated images: (ii±ii) b= 1/2[101], (iii±iii) b= 1/2[110], (iv±iv) b = 1/2[011] and (v±v) b= [101].The Burgers vector of the bounding Shockley partial dislocations in each set of the simulated imagesare also shown labeled in between the images. The best match with the experimental images (i±i) is
obtained for the set of simulated images in (ii±ii).
WANG et al.: OBSERVATIONS AND ANALYSES22
that in both cases (Figs 3 and 5) residual contrast is
observed outside the bounding partials owing to
APBs that had attached to the partial dislocations.
Attempts were made to simulate this contrast but
were largely unsuccessful as it is quite apparent that
the displacements associated with these non-conser-
vative thermal APBs are not entirely in the plane of
the stacking fault, and moreover, the displacement
vectors may not be exactly 1/2h101i. This aspect
will be addressed in a later communication. The dis-
location labeled B in Fig. 5 was determined to have
bB=21/2[101], a near-screw character and hence
lying on the (111) plane. The end of an APB can
also be seen attached to this dislocation, with the
other end terminating at the neighbouring grain
boundary.
Another point to note is that most of the SFs
observed were monolayer faults, i.e. non-overlap-
ping and not twins. A few overlapping faults were
also observed, but for those that were analyzed, the
Fig. 5(a,b).
WANG et al.: OBSERVATIONS AND ANALYSES 23
partial dislocations bounding the faults were deter-
mined to have the same 1/6<112] Burgers vector,
similar to the situation observed in deformed TiAl
[23]. When h110i SAD patterns were recorded with
these faults edge-on, extra twin re¯ections at the
expected 1/3{111} positions could be seen, together
with streaking along the same h111i direction owing
to the thinness of the twins. Through SAD, it was
also established that no retained a2 layers existed in
the gm grains in regions without and with stacking
faults. Also, the a2 matrix near the gm was observedto contain, on occasion, a few SFs on [0001] planes,
but to be relatively free of dislocations.
4. DISCUSSION
The results of this study have brought to lighta number of new characteristics of the defectstructures in the massive gm phase that have notbeen reported before. Naturally, how these
Fig. 5(c,d).
WANG et al.: OBSERVATIONS AND ANALYSES24
defects originate during the a 4 gm transform-ation requires explanation, and this is considered
below.
According to Hug et al. [21, 22], there are threetypes of SFs that can be de®ned in the L10 structure
of g-TiAl: Complex Stacking Fault (CSF),Superlattice Intrinsic Stacking Fault (SISF) and
Superlattice Extrinsic Stacking Fault (SESF). The
CSF can be thought to be a superimposition ofan SISF + APB. The possible dissociation of a
Fig. 5. TEM micrographs showing another area in the massive gm phase in the quenched Ti±46.54Alalloy containing a stacking fault (labeled A), the bounding Shockley partial dislocations (labeled A1,A2) and APBs. (a); (b) BF/SLDF images pairs recorded using g= 002/001 (B0[110]); (c)±(f) WBDFmicrographs recorded using (c) g= 002 (B0[110]); (d) g= 200 (B0[011]), (e) g = 111 (B0[011]) and (f)
g= 111 (B0[110]). The unit dislocation labeled B has b =21/2[101].
WANG et al.: OBSERVATIONS AND ANALYSES 25
Table 3. Experimentally observed contrast* from fault A and associated partials A1, A2 in Fig. 5 and deduced fault displacement anddislocation burgers vectors
Operating re¯ection (g) Beam direction (B) Partial dislocation A1 Partial dislocation A2 Stacking fault A Figure No.
002/001 0[110] W/I W/I V 5(a,c)/5(b)200 0[011] V W/I V 5(d)111 0[011] W/I V V 5(e), 6(a)±i111 0[110] W/I W/I V 5(f)111 0[110] I I I Ð202 0[111] W/I V V 6(b)±i022 0[011] I V I Ð220 0[110] W/I W/I V Ð
21/x[211] 21/x[121] Rf=1/3[111]
*W= Weak, I = Invisible, and V = Visible
Fig. 6. Experimental (i) and simulated (ii±v) BF image pairs of the fault labeled A in Fig. 4 under twodi�erent di�racting conditions: (a) g= 111, B0[011] and (b) g = 202, B0[111]. The con®gurations cor-responding to dissociation of di�erent unit dislocations on the (111) plane are shown in the simulatedimages: (ii±ii) b= 1/2[110], (iii±iii) b= 1/2[101], and (iv±iv) b = 1/2[011]. The Burgers vector of thebounding Shockley partial dislocations in each set of the simulated images are also shown labeled inbetween the images. The best match with the experimental images (i±i) is obtained for the set of simu-
lated images in (ii±ii).
WANG et al.: OBSERVATIONS AND ANALYSES26
1/2[110] unit dislocation and a [101] superdisloca-
tion [on (111)] are:
1
2��110� ! 1
6��211� � SF� 1
6��12�1��1�
�101� ! 1
2�101� � �APB� � 1
2�101� ! 1
6�112��2�
� �SISF� � 1
6�2�11� � �APB� � 1
6�112� � �CSF�
� 1
6�2�11�
Hug et al. [22] argued that, owing to the extremely
high APB energy in g-TiAl, the [101] dislocations
are expected to be present as pairs of narrowlyspaced 1/2[101] dislocations linked by APBs; each
1/2[101] dislocation may further dissociate intoShockley partials connected by an SISF or CSF as
shown above. Experimental observations [22, 24±27]indicate that the separations between the partial dis-
locations bounding SISFs and APBs are less than 6nm and 4.5 nm, respectively, whereas CSFs have
not been observed to date. The 1/2[110] dislo-cations, which do not disrupt order and hence have
no APBs associated with them, never appear disso-ciated because of the high CSF energy; this feature
is con®rmed by both weak-beam [22, 25±29] andhigh-resolution [29, 30] TEM observations of these
dislocations.
The evidence presented in this study has estab-lished that 1/2<101] dislocations (A±B, C±D, E±F
and G±H in Fig. 1; A1, B1, C1 in Fig. 2, C inFig. 3, B in Fig. 5) are present as widely separated
single dislocations (e.g. projected separations >150nm for the A±B pair in Fig. 1). These 1/2<101]
unit dislocations destroy the order in TiAl andhence are always observed to be connected by
APBs. Furthermore, the dissociations of these 1/2h101i dislocations on {111} planes create wide SFs
bound by 1/6h211i Shockley partial dislocations of
all possible types (Figs 3±6, projected widthsbetween partials >400 nm). For instance, the SF
marked A in Fig. 3 has been created presumably bythe dissociation of an 1/2[101> dislocation on the
(111) plane into 1/6[112] and 1/6[211] Shockley par-tial dislocations, whereas the SF in Fig. 5 has been
created by the dissociation of a 1/2[110] dislocationon the (111) plane into 1/6[211] and 1/6[121]
Shockley partial dislocations. Although the dis-sociation of an 1/2<101] dislocation in ordered
TiAl can create either a SISF or CSF [reaction (2)above], it is quite apparent that the projected separ-
ations between the partials (>400 nm) in theseimages (Figs 3 and 4) for either a SISF or CSF are
extremely large when compared with those forSISFs (3±6 nm) reported in deformed samples
[22, 25±28].
Though dislocation reactions in deformed g-TiAlhave been studied and reported extensively, dislo-
cation dissociations with such high superpartial/superShockley partial separations with an APB/SF
have not been observed before. The exceptions are
stacking fault dipoles [21, 22, 26±28, 31, 32], bound
by single or double Shockley partials having the
same 1/6 < 112] Burgers vector, and overlapping
SFs (mechanical twins) [23]. The high CSF or APB
energy in g-TiAl [33±36] strongly inhibits the cre-
ation of such large partial dislocation separations
with SFs or APBs in deformed samples. Since there
is currently no model that can satisfactorily explain
the possible mechanism for the occurrence of these
``unexpected'' dislocations and their dissociations
observed in ordered TiAl in this study, alternative
explanations for their formation are required, as
discussed in the following.
Two possible scenarios can be initially con-
sidered: the ®rst based on the assumption that these
defects were inherited from the parent, high-tem-
perature a, and the second [3, 5, 6, 10] that they
were created during the formation of ordered gmdirectly from a on cooling. TEM examination of
the remaining a2 in the neighbourhood of gm grains
showed practically no dislocations. A few SFs, lying
only on the (0001) planes, were observed in the a2,whereas in gm the stacking falults were seen on all
four {111} planes. This implies that the defects
observed in the gm phase do not exist in the parent
a phase before transformation. Therefore, the ®rst
scenario which assumes that the observed defects
survive through the a 4 gm massive transformation
and are frozen in the gm grains appears to be inva-
lid. With regard to the second scenario, the high
APB and CSF energies would be a barrier for the
introduction of these widely separated unit dislo-
cations and wide stacking faults, respectively, by
thermal or mechanical means during the formation
of ordered gm directly from the a, as it appears to
be an obstacle for the formation of these defects in
deformed g-TiAl. Thus, it appears unlikely that the
1/2<101] dislocations, the associated APBs and the
SFs produced by the dissociation of the 1/2<101]
and 1/2<110] dislocations were introduced in the
ordered gm phase either during its formation
directly from the a phase or subsequently on cool-
ing after it had already formed. This conclusion is
also supported by the fact that widely extended
defects of the types reported herein have not been
observed previously in ordered g-TiAl alloys
deformed at either low (to ÿ1968C) or high
(>8008C) temperatures [22, 26, 28, 29, 37].
Therefore, a new model for the massive trans-
formation in TiAl alloys is proposed based on the
observations and the discussion detailed above.
Instead of the single step a 4 gm reaction, the
model postulates that a disordered f.c.c.-type phase
is formed as an intermediate phase between the
parent a and the product gm phases, and the trans-
formation then proceeds as follows:
WANG et al.: OBSERVATIONS AND ANALYSES 27
a ÿÿÿ4�massive transformation�disordered f.c.c. phase
ÿÿÿ4�ordering transformation�gm
Based on this model, it can be postulated that the
1/2h101i dislocations and SFs observed in the gmphase are introduced in the ®rst step of the reaction
during which the high-temperature disordered aphase massively transforms to the high-temperature
intermediate disordered f.c.c. phase. Although the
possible methods by which these defects are intro-
duced in the disordered f.c.c. phase have not been
entirely considered yet, it is assumed that they are
created by chance during the change in structure
from h.c.p. to f.c.c. Since this intermediate f.c.c.
phase is disordered, all the 1/2h101i unit dislo-
cations on {111} planes are equivalent. In the sec-
ond step of the reaction, the intermediate
disordered f.c.c. phase undergoes an ordering trans-
formation to the L10g phase, thus making the 1/
2<110] and 1/2<101] unit dislocations non-equiv-
alent in the ordered structure. The 1/2<110] unit
dislocations do not destroy the order and can be
present individually (e.g. those labeled I1, I3 and
J2, J3 in Fig. 1 and set D in Fig. 2), without being
attached to APBs. On the other hand, 1/2 < 101]
unit dislocations will destroy the order, so APBs
are created in their wake as the ordering front
sweeps past them. The other end of these APBs will
either terminate at another 1/2 < 101] unit dislo-
cation (A±B, C±D, E±F pairs in Fig. 1) or at an
interface such as a intervariant g domain or low-
high-angle boundary (Fig. 2) to restore the order.
Several examples, with TEM evidence, can be
found in the literature pertaining to order±disorder
transformations in other alloy systems, of attach-
ment of APBs to unit dislocations present in the
disordered phase [38±41]. In these cases, it is
deduced that the unit dislocations were originally
present in the disordered phase and that during the
subsequent ordering process on aging, APBs
become attached to these dislocations to restore
order.
The same situation holds good with the stacking
faults bound by 1/6h211i Shockley partials, which,
as shown in Section 3, Figs 3±6, are produced by
the dissociation of 1/2h101i dislocations on {111}
planes in the disordered f.c.c. phase. The TEM evi-
dence suggests that the SF energy of the disordered
f.c.c. phase is quite low, especially at the elevated
temperatures where the massive transformation
takes place (1100±11308C [42, 43]). This allows the
easy splitting of the 1/2h101i unit dislocations into
widely separated (>400 nm) Shockley partial dislo-
cations, similar to the situation in other low-SF
energy f.c.c. alloys. For the sake of discussion,
these SFs have been assumed to have been pro-
duced by dissociation of 1/2h101i dislocations,
although a priori there is no reason why they could
not have formed directly by errors in atomic stack-
ing during the a4 f.c.c. massive reaction. The lat-ter appears to be the likely source given the highgrowth rates of the gm phase [43].
The geometry in the simulated images in Figs 4and 6 that gave the best match indicate that the SFsare intrinsic in nature relative to the disordered
f.c.c. lattice. It should be recognized that in theordered TiAl lattice these faults could become high-
energy CSFs. In the case of the SFs in Figs 3 and 4,since the net unit dislocation comprising the twoShockley partials (1/6<112] and (1/6<211]) has
Burgers vector (1/2<101]) that is one half of a<101] superdislocation, order is destroyed whenthe disorder±order interface encounters these
defects. Examination of the atomic stacking on the(111) plane of ordered TiAl, the plane of the SF,
reveals that the 1/6<112] displacement does notchange the nearest neighbor environment aroundthe atoms, whereas the 1/6<211] displacement
does. Consequently, to restore order, APBs are cre-ated at one end of the fault where the 1/6<211]Shockley partial resides, the other end of the APBs
terminating at another Shockley partial associatedwith another fault, at another 1/2<101] unit dislo-
cation, or at an interface such as an intervariant gdomain or other type of boundary. After this pro-cess, the SF would be expected to be a pure geo-
metrical fault (SISF). The random introduction ofdislocations (undissociated or dissociated into SFswith 1/6<211] type Shockley partials) in the disor-
dered f.c.c. phase during the ®rst step of the reac-tion, together with the multi-directional progress ofthe ordering process thereafter could account for
the highly curvaceous and meandering nature of theAPBs that become intimately attached to the dislo-
cations.Interestingly, and unexpectedly, APBs were also
observed to be attached to each of the 1/6[211] and
1/6[121] Shockley partial dislocations bounding theSF produced by the dissociation of a 1/2[110] unitdislocation (Fig. 5), with other partial dislocations
or intervariant domain/grain boundaries. As men-tioned above, the 1/2<110] unit dislocations do
not destroy order in TiAl and can (and should, inprinciple) be present without being linked by APBs(e.g. those labeled I1±I3, J1±J3 in Fig. 1 and set D
in Fig. 2). These undissociated dislocations couldhave been introduced either in the disordered f.c.c.or in the gm phase after the ordering transform-
ation. However, the dissociation of a 1/2[110] unitdislocation into widely separated 1/6[211] and 1/
6[121] Shockley partial dislocations on the (111)plane with the SF in between (Fig. 5) is deduced tohave occurred in the disordered f.c.c. phase prior to
the ordering reaction, since the high CSF energy inthe ordered g phase would prevent wide separationof the Shockley partials.
One possible explanation for the attachment ofAPBs to both the component 1/6<211] partial dis-
WANG et al.: OBSERVATIONS AND ANALYSES28
locations is as follows. Since the wide SFs produced
by the dissociation of the 1/2<110] dislocations inthe disordered f.c.c. phase would become high-energy CSFs [reaction (1) above] after the ordering,
they will have a tendency to reduce their energy.APBs that exist in the vicinity after the orderingreaction may have some mobility at the high tem-
peratures and hence be ``attracted'' to these high-energy faults. Presumably, after the APBs join the
CSF the local atomic displacement of the lattice issuch that the stacking in the faulted region re-sembles a pure geometrical fault (with lower
energy). A better explanation is that the APBs arecreated as the ordering front passes through thesepre-existing wide SFs with 1/6<211] Shockley par-
tial dislocations, around which, otherwise, local vio-lations of the nearest neighbor atomic con®guration
would occur. Since the direction of movement ofthe disorder±order interface is probably randomand not necessarily parallel to the plane of the SF,
the APBs are left attached from the two bounding1/6<211] partial dislocations to restore the nearestneighbor environment and order locally around the
dislocations. In both cases (splitting of 1/2<101] or1/2<110]), the SFs after interaction with the APBs
from the ordering are expected to be lower energy,pure geometrical faults. The only situation wherethe SFs would become CSFs is when the atomic
displacements caused by the motion of the disorder±order interface are exactly parallel to and in theplane of the SF, but this is thought to be a rare
occurrence. Further work is required to fully estab-lish and understand these features.
It should be noted that the occurrence of an in-termediate disordered f.c.c. phase during thea 4 gm transformation has also been hypothesized
recently by other researchers [6, 11, 12]. Forinstance, Denquin and Naka [6] proposed that the
APBs could be produced either by a directa 4 ordered gm transformation or through the me-diation of a disordered f.c.c. phase during this
transformation. They were, however, unable tostate which of these two processes was more likelyto occur. More recently, Zhang et al. [11, 12] expli-
citly proposed the occurrence of an intermediatedisordered f.c.c. phase during the a 4 gm massive
transformation to account for the APBs in the gmphase. However, their proposal that the existence ofAPBs and three gm variants alone is the evidence
for the occurrence of an intermediate disorderedf.c.c. phase prior to ordering is not entirely justi®ed,since these could also be created by impingement of
growing ordered gm domains formed directly in thea phase [3, 6]. Our interpretation of the mechanism
of formation of these APBs di�ers from that ofthese authors [11, 12]. In particular, the existenceand role of widely dissociated 1/2<110] unit dislo-
cations, and 1/2<101] unit dislocationsÐundisso-ciated or widely dissociated into 1/6h211i Shockleypartial dislocations bounding stacking faultsÐwas
not entirely recognized until the present study.Indeed, the occurrence of these unexpected defects
in the gm phase provides, perhaps, better evidencefor the occurrence of an intermediate disorderedf.c.c. phase during the a4 gm transformation. The
APBs, which are intimately attached to these dislo-cations, are then just natural by-products from thesubsequent f.c.c. to g ordering reaction that passes
through these dislocations.Detailed observations and characterization of the
APBs, the structure within them, and the inter-
actions between APBs with dislocations/SFs, as wellas a discussion of the ordering process, will be pro-vided in a follow-on paper [13], which will furthervalidate the new model for the formation and evol-
ution of these defects during the a4 gm massivetransformation in TiAl alloys.
5. CONCLUSIONS
In conclusion, the defect structures in the massivegm phase in a rapidly quenched Ti±46.5 at.% Alalloy have been studied by TEM. The defect struc-
tures are found to be composed of dislocations, SFsand APBs intimately associated with dislocations orSFs. Both 1/2<110] and 1/2<101] unit dislo-cations were present in the gm phase, with the latter
linked by highly curved non-conservative APBs.Comparison of experimental and simulated TEMimages shows that SFs, which are created by the
dissociations of 1/2h101i unit dislocations, lie on{111} planes and are bound by well-separatedb= 1/6h121i Shockley partial dislocations of all
possible types. In addition, APBs are found to com-mence or terminate on the stacking faults only atthe partial dislocations with b =1/6<121], but not
those with b= 1/6<112]. The evidence and argu-ments presented in this study suggest that thesedefects are created through the occurrence of an in-termediate disordered f.c.c. phase during the
a4 gm massive transformation in TiAl alloys.
AcknowledgementsÐSupport for this research from theNational Science Foundation (DMR-9224473, B.MacDonald, Program Monitor) and the WrightLaboratories, Materials Directorate/UES (S-269-000-002/SUB AF, M. Mendiratta, Program Monitor), is deeply ap-preciated. The authors also wish to deeply thank K. J.Hemker at Johns Hopkins University and R. Schaublinand P. Stadelmann of EPFL (Switzerland) for allowingaccess to the simulation program. One of the authors(MK) is thankful for the ®nancial support received as apost-doctoral fellow with K. J. Hemker during the courseof this work.
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WANG et al.: OBSERVATIONS AND ANALYSES30
Recommended