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4 Dec 2008 G. Rakness (UCLA) 1
Online Software Updates and RPC data in the RAT
…including Pad Bit Mapping and Efficiency…
Greg RaknessUniversity of California, Los Angeles
UCLA group meeting4 December 2008
4 Dec 2008 G. Rakness (UCLA) 2
Online Software• Updates for TMB firmware 18 Nov 2008
– Counters• TMB class: updated• EmuPeripheralCrateMonitor application (used to start/stop TMB counters and DCS
monitoring jobs [XMAS] and to display the counters during data taking [and otherwise])– Currently hardcoded for TMB counters beyond what is in TMB class– To be improved to make maintenance easier and less error-prone. In the meantime, Jinghua
will update this…
– Xml parameters added and removed, and TStore functions modified• Add tmb_firmware_compile_type (default = a) this specifies the type of firmware
– Possible values = a, b, c, d• Add alct_readout_without_trig (default = 0)• Add clct_readout_without_trig (default = 0)• Add match_readout_without_trig (default = 1)• Add mpc_block_me1a (default = 1)• Remove clct_stagger this is implicit in tmb_firmware_compile_type
• Configuration database– N.B.: Will not be possible to remove parameters once we begin to use the
configuration database is used– Will begin to use when we turn on next year– At first, only use it for bookkeeping (i.e., we won’t configure from database)– After tools are written to modify the configuration database, and we are used to
using it, we can think about configuring from database…
4 Dec 2008 G. Rakness (UCLA) 3
Online Software (cont.)• Configuration database
– Talked to Jinghua Liu…– Note: It will not be possible to remove parameters
once we begin to use the configuration database…– Plan to begin to use when we turn on next year– At first, only use it for bookkeeping
• This means we won’t configure the hardware directly from database, but only store the configuration that has been loaded…
– I think we can think about making the step of configuring from database after…
• Tools are written to modify the configuration database• We are used to using it (i.e., have verified again and again
that reading from the database is reliable)
4 Dec 2008 G. Rakness (UCLA) 4
RPC data into RAT
4 Dec 2008 G. Rakness (UCLA) 5
Recall: RPC-TMB phase scan results for all ME+1 chambers…
• 49 chambers of Type “A” and “B” would work OK with delay = 11
Broken up by “Type”
4 Dec 2008 G. Rakness (UCLA) 6
Type “C” are pesky
• 19 chambers of type “C” come in clumps
• Have asked the RPC colleagues for input…
• Have set delay value = 11 for CRAFT data…
Remove these chambers from the analysis…
4 Dec 2008 G. Rakness (UCLA) 7
Some numerologyRun 67539: All detectors in the readout• https://cmsdaq.cern.ch/elog/Shift/4503Number of triggers accumulated = 13.7M• https://cmsdaq.cern.ch/elog/Trigger/843• DT, RPC, HCAL (HPD noise), Random (@6Hz)
= 600Hz• CSC trigger rate = 60HzNumber of events analyzed today = 3.25M ~325k CSC triggersNumber of events with single ME+1/3 chamber
fired with 1 valid ALCT and 1 valid CLCT (clean events) = 37k
4 Dec 2008 G. Rakness (UCLA) 8
General CSC distributions
4 Dec 2008 G. Rakness (UCLA) 9
Occupancy of Cosmic Rays in ME+1/3 chambers
• Chamber illumination ( = excluded from analysis, = CSC HV problem?)
• peaked at /2
• CLCT key ½-strip ()
• flat
• ALCT key-wiregroup ()
• Higher occupancy at big end
• CSC HV gaps clearly seen
4 Dec 2008 G. Rakness (UCLA) 10
ALCT key wiregroup vs. CLCT key ½-strip
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 11
CLCT Pattern ID for Cosmic Rays
• No pattern = 0 or pattern = 1, as expected
• Lower pattern ID’s for Side chambers, as expected
• I was expecting flatter distribution for Top and Bottom chambers… ?
• Dip at pattern ID = 6 and 7?
4 Dec 2008 G. Rakness (UCLA) 12
General RPC data into RAT distributions
4 Dec 2008 G. Rakness (UCLA) 13
Number of RPC pad bits per event
Already can see lots of 0’s…
4 Dec 2008 G. Rakness (UCLA) 14
Time Bin of RPC Pad Bit in TMB Readout Window
• RPC data late w.r.t. CLCT pretrigger• Width in RPC arrival time has contributions from…
• CLCT pretrigger jitter• Chamber-to-chamber timing differences to be investigated
CLCT pretrigger
Time bin (bx)
(rpc_fifo_pretrig = 2)
4 Dec 2008 G. Rakness (UCLA) 15
(BXN + parity bit)Recall: RPC firmware defines parity bit so that total number of bits = odd number
Software cut = one RPC bit
should only be an EVEN number of bits in the (BXN+parity bit) word
• (BXN+parity bit) has only even numbers of bits, as expected…
Phase scan worked…
000 001 010 011 100 101 011 111
4 Dec 2008 G. Rakness (UCLA) 16
RPC Pad Bit Mapping Determined from CSC data
Require:• Number of RPC pad bits =1• CLCT Pattern ID > 7• CLCT Quality = 6• ALCT Quality = 3
4 Dec 2008 G. Rakness (UCLA) 17
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 0
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 18
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 1
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 19
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 2
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 20
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 3
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 21
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 4
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 22
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 5
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 23
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 6
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 24
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 7
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 25
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 8
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 26
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 9
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 27
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 10
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 28
ALCT key wiregroup vs. CLCT key ½-strip: RPC pad bit = 11
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
()
4 Dec 2008 G. Rakness (UCLA) 29
ALCT key wiregroup vs. CLCT key ½-strip: heuristic RPC pad-bit mapping…
CLCT key ½-strip ()
ALC
T k
ey w
iregr
oup
() 01 3 2
5 64 7
9 108 11
Bits for inner areas cover twice the linear dimension as do bits for outer areas
4 Dec 2008 G. Rakness (UCLA) 30
RPC pad bit efficiency
4 Dec 2008 G. Rakness (UCLA) 31
Choose muons hitting chambers on either side of the RPC
Cuts:
• 1 ME+1/3 chamber with
• 1 ALCT and 1 CLCT
• 1 ME+2/2 chamber with
• 1 ALCT and 1 CLCT
• chamber number = ME+1/3 chamber…
4 Dec 2008 G. Rakness (UCLA) 32
ALCT wiregroup occupancies for events with ME+1/3/N and ME+2/2/N
Equal inter-station chamber number event selection…• Suppresses events with ME+1/3 large WG-number• Suppresses events with ME+2/2 small WG-number
… as expected…
4 Dec 2008 G. Rakness (UCLA) 33
RPC Pad Bit EfficiencyNumerator = non-zero pad-bit data in RAT
Denominator = muon going through ME+1/3 and ME+2/2
ME+1/3 chamber number
RP
C p
ad b
it ef
ficie
ncy
4 Dec 2008 G. Rakness (UCLA) 34
Next…• RPC data into RAT
– Efficiency:• More studies follow, selecting on CLCT and ALCT qualities and
pattern ID’s to choose denominator events more selectively… No difference in end result…
– Pad bit mapping:• Tried to make a plot of mapping with TWO adjoining pad bits to try
to show edges (lot cleaner presentation)… need yet more statistics– Should I present this to somebody somewhere?
• CMS week next week– “Peripheral Crate and FED crate Operations” talk on Sunday
• Finish writing this talk tomorrow– Trigger talk on Tuesday
• Write this talk Monday
• Update ALCT configuration format into user PROM• Work on expansion of trigger pattern tests…
– CLCT+ALCT TMB MPC SP (N.B. TMBMPC already exists…)
4 Dec 2008 G. Rakness (UCLA) 35
Other slides…
4 Dec 2008 G. Rakness (UCLA) 36
Wiregroup difference from station 1 to station 2No ALCT quality cut
“IP pointing” muons for top and bottom chambers
Low quality (flat) muons…
4 Dec 2008 G. Rakness (UCLA) 37
Wiregroup difference from station 1 to station 2If we require ALCT quality = 3 for both stations…
“IP pointing” muons for top and bottom chambers
4 Dec 2008 G. Rakness (UCLA) 38
CLCT ½-strip difference from station 1 to station 2
On both chambers require:• CLCT Pattern ID > 7 • CLCT Quality = 6
No CLCT requirements…
Picking high quality CLCT candidates with large patterns selects tracks which go straight through the chambers…
4 Dec 2008 G. Rakness (UCLA) 39
Denominator for pad bit efficiency
4 Dec 2008 G. Rakness (UCLA) 40
FYI: ME+1/3 CLCT and ALCT qualities
Wasn’t sure what to expect here…
4 Dec 2008 G. Rakness (UCLA) 41
Recall: CSC chamber labels• “Top” CSC = 10
• “Bottom” CSC = 28
• “Side” CSC’s = 1 and 19