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FORM NP (IEC)2009-06-01

85/394/NP

NEW WORK ITEM PROPOSAL

Proposer

China

Date of proposal

June 2011

TC/SC

85

Secretariat

China

Date of circulation

2011-07-01

Closing date for voting

2011-10-07

A proposal for a new work item with in the scope of an exis ting technical committee or subcommittee shall be submitted to theCentral Office. The proposal will be distributed to the P-members of the technical committee or subcommittee for voting on theintroduction of it into the work programme, and to the O-members for information. The proposer may be a National Committee of the IEC, the secretariat itself, another technical committee or subcommittee, an organization in liaison, the StandardizationManagement Board or one of the advisory committees, or the General Secretary. Guidelines for proposing and justifying a newwork item are given in ISO/IEC Directives, Part 1, Annex C (see extract overleaf). This form is not to be used for amendments or revisions to exis ting publications.

The proposal (to be completed by th e proposer)

Title of proposal

IEC 62586-2 Ed.1: Power quality measurement in power supply systems – Part 2: Functional testsand uncertainty requirements

Standard Technical Specification Scope (as defined in ISO/IEC Directives, Part 2, 6.2.1)

This standard specifies functional tests and uncertainty requirements for instruments whosefunctions include measuring, monitoring and/or ascertaining Power Quality parameters in power supply systems, and whose measuring methods (class A or class S) are defined in IEC 61000-4-30

Purpose and justification, including the market relevance, whether it is a proposed horizontal standard (Guide 108) 1) andrelationship to Safety (Guide 104), EMC (Guide 107), Environmental aspects (Guide 109) and Quality assurance(Guide 102) . (attach a separate page as annex, if necessary)

To define in a standard a set of functional tests and some accuracy requirements, allowing aproduct to comply with IEC 61000-4-30 (class A or class S).

Target date for first CD 2012 for IS/ TS 2014

Estimated number of m eetings 6 Frequency of meetings: 2 per year Date and place of first meeting:

10-12 Oct 2011 Grenoble France

Proposed working methods E-mail Collaboration tools

Relevant documents to be considered

IEC 61000-4-30, IEC 61557-12, IEC 61010

Relationship of project to activities of other international bodies

SC77A / WG9

Liaison organizations No

Need for coordination within ISO or IEC No

1) Other TC/SCs are requested to indicate their interest, if any, in this NP to the TC/SC secretary.

®

Copyright © 2011 International Electrotechnical Commission, IEC. All rights reserved. It is

permitted to download this electronic file, to make a copy and to print out the content for the sole

purpose of preparing National Committee positions. You may not copy or "mirror" the file or printed

version of the document, or any part of it, for any other purpose without permission in writing from IEC.

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FORM NP (IEC)2009-06-01

Preparatory work

Ensure that all copyright issues are identified. Check one of the two following boxes

A d raf t is attached for com ment* An out line i s a ttached

* Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of whichthey are aware and to provide supporting documentation.

We nominate a project leader as follows in accordance with ISO/IEC Directives, Part 1, 2.3.4 (name, address, fax and

e-mail): Franck GRUFFAZ, Schneider-electric, site 38EQI, 38050 Grenoble cédex 9, FRANCE

Tel: +33 4 76 39 45 65 ; e-mail: [email protected]

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Concerns known patented items (see ISO/IEC Directives, Part 2) Name and/or signature of the proposer Yes. If yes, provide full information as an annex no China NC

Comments and recommendations from the TC/SC officers

1) Work allocation

Project team New working group Existing working group no: WG20

2) Draft suitable for direct submission asCD CDV/ DTS

3) General quality of the draft (conformity to ISO/IEC Directives, Part 2)Little redrafting needed Substantial redrafting needed no draft (outline only)

4) Relationship with other activitiesIn IECSC77A / WG9

In other organizations

5) Proposed horizontal standard1)

Remarks from the TC/SC officersThe Chairman and the Secretary of TC 85 strongly support this proposal and encourage NationalCommittees to re-nominate experts for this project.

1) Other TC/SCs are requested to indicate their interest, if any, in this NP to the TC/SC secretary.

Approval criteria:

• Approval of the work item by a simple majority of the P-members voting;

• At least 4 P-members in the case of a committee with 16 or fewer P-members, or at least 5 P-members in the case of committees withmore than 17 P-members, have nominated or confirmed the name of an expert and approved the new work item proposal.

Elements to be clarified when proposing a new work item

TitleIndicate the subject matter of the proposed new standard or technical specification.

Indicate whether it is intended to prepare a standardor a technical specification.

Scope

Give a clear indication of the coverage of the proposed new work item and, if necessary for clarity, exclusions.

Indicate whether the subject proposed relates to one or more of the fields of safety, EMC, the environment or quality assurance.

Purpose and justification

Give details based on a critical study of the following elements wherever practicable.

a) The specific aims and reason for the standardization activity, with particular emphasis on the aspects of standardization to becovered, the problems it is expected to solve or the difficulties it is intended to overcome.

b) The main interests that might benefit from or be affected by the activity, such as industry, consumers, trade, governments,distributors.

c) Feasibility of the activity: Are there factors that could hinder the successful establishment or general application of the standard?

d) Timeliness of the standard to be produced: Is the technology reasonably stabilized? If not, how much time is likely to beavailable before advances in technology may render the proposed standard outdated? Is the proposed standard required as abasis for the future development of the technology in question?

e) Urgency of the activity, considering the needs of the market (industry, consumers, trade, governments etc.) as well as other fields or organizations. Indicate target date and, when a series of standards is proposed, suggest priorities.

f) The benefits to be gained by the implementation of the proposed standard; alternatively, the loss or disadvantage(s) if no standard isestablished within a reasonable time. Data such as product volume of value of trade should be included and quantified.

g) If the standardization activity is, or is likely to be, the subject of regulations or to require the harmonization of existingregulations, this should be indicated.

If a series of new work items is proposed, the purpose and justification of which is common, a common proposal may be draftedincluding all elements to be clarified and enumerating the titles and scopes of each individual item.

Relevant documents

List any known relevant documents (such as standards and regulations), regardless of their source. When the proposer considersthat an existing well-established document may be acceptable as a standard (with or without amendments), indicate this with

appropriate justification and attach a copy to the proposal.Cooperation and liaison

List relevant organizations or bodies with which cooperation and liaison should exist.

Preparatory work

Indicate the name of the project leader nominated by the proposer.

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CONTENTS

1 Scope .............................................................................................................................10

2 Normative references......................................................................................................11

3 Definitions, abbreviations, notations and symbols ...........................................................12

3.1 General definitions ................................................................................................12

3.2 Definitions related to uncertainty ...........................................................................12

3.3 Notations ...............................................................................................................13

3.3.1 Functions ...................................................................................................13

3.3.2 Symbols and abbreviations ........................................................................13

3.3.3 Indices .......................................................................................................13

4 Requirements .................................................................................................................14

4.1 Requirements for products complying with c lass A .................................................14

4.2 Requirements for products complying with c lass S .................................................14

5 Functional type tests common requirements ...................................................................16

5.1 General philosophy for testing ...............................................................................16

5.1.1 Measuring ranges ......................................................................................16

5.1.2 Single "power system influence quantit ies" ................................................17

5.1.3 Mixed "power system influence quantities" measuring range ......................18

5.1.4 "External influence quantities" ...................................................................19

5.1.5 Test criteria ...............................................................................................19

5.2 Testing procedure ..................................................................................................20

5.2.1 Device under test .......................................................................................20

5.2.2 Testing conditions ......................................................................................20

5.2.3 Testing equipment .....................................................................................20

6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30 ...................................................................................................................................21

6.1 Power frequency ....................................................................................................21

6.1.1 General .....................................................................................................21

6.1.2 Measurement method ................................................................................21

6.1.3 Measurement uncertainty and measuring range .........................................21

6.1.4 Measurement evaluation ............................................................................22

6.1.5 Measurement aggregation .........................................................................22

6.2 Magnitude of supply voltage ..................................................................................22


6.2.2 Measurement uncertainty and measuring range .........................................22 6.2.3 Measurement evaluation ............................................................................22


6.3 Flicker ...................................................................................................................24

6.4 Supply voltage interruptions, dips and swells .........................................................24

6.4.1 General .....................................................................................................24

6.4.2 Check dips / interruptions in polyphase system ..........................................32

6.4.3 Check swells in polyphase system .............................................................34

6.5 Supply voltage unbalance ......................................................................................35

6.5.1 General .....................................................................................................35

6.5.2 Measurement method, measurement uncertainty and measuring range .....35

6.5.3 Aggregation ......... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... .....36

6.6 Voltage harmonics .................................................................................................37



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6.7 Voltage inter-harmonics .........................................................................................40





6.8 Mains Signalling Voltages on the supply voltage ....................................................44 6.8.1 Measurement method ................................................................................44


6.8.3 Aggregation ......... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... .....47

6.9 Measurement of underdeviation and overdeviation parameters ..............................48





6.10 Flagging ................................................................................................................52

6.11 Clock uncertainty testing .......................................................................................54 6.12 Variations due to external influence quantities .......................................................55

6.12.1 General .....................................................................................................55

6.12.2 Influence of temperature ............................................................................55

6.12.3 Influence of power supply voltage ..............................................................56

7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30 ...................................................................................................................................57

7.1 Power frequency ....................................................................................................57

7.1.1 General .....................................................................................................57





7.2 Magnitude of the supply voltage ............................................................................58





7.3 Flicker ...................................................................................................................60

7.4 Supply voltage interruptions, dips and swells .........................................................60

7.4.1 General .....................................................................................................60

7.4.2 Check dips / interruptions in polyphase system ..........................................68 7.4.3 Check swells in polyphase system .............................................................70

7.5 Supply voltage unbalance ......................................................................................71

7.5.1 General .....................................................................................................71

7.5.2 Measurement method, measurement uncertainty and measuring range .....71

7.5.3 Aggregation ......... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... .....72

7.6 Voltage harmonics .................................................................................................73




7.7 Voltage inter-harmonics .........................................................................................77 7.7.1 Measurement method ................................................................................77

7.8 Mains Signalling Voltages on the supply voltage ....................................................78



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7.8.3 Aggregation ......... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... ..... ... ..... .....78

7.9 Measurement of underdeviation and overdeviation parameters ..............................79





7.10 Flagging ................................................................................................................83

7.11 Clock uncertainty testing .......................................................................................85 7.12 Variations due to external influence quantities .......................................................86

7.12.1 General .....................................................................................................86

7.12.2 Frequency measurement ...........................................................................86

7.12.3 Influence of temperature ............................................................................86

7.12.4 Influence of power supply voltage ..............................................................87

8 Calculation of operating uncertainty ................................................................................87

Annex A (normative) Intr ins ic uncertaint y, operating uncertaint y, and overall system uncertainty.......................................................................................................................................89

A.1 General .................................................................................................................89

A.2 Measurement uncertainty ......................................................................................89 A.3 Operating uncertainty ............................................................................................89

A.4 Overall system uncertainty.....................................................................................90

Annex B (normative) Calculation of operating uncertaint y for magnitude of the power supply andfrequency .......................................................................................................................91

B.1 SELECTION OF TEST POINTS TO VERIFY OPERATING UNCERTAINTY ANDUNCERTAINTY UNDER REFERENCE CONDITIONS ............................................91

B.2 EXAMPLE ..............................................................................................................91

Annex C ( informative) Further tes t on dips (amplitude & phase angles changes) ... ... ... ..... ... .92

C.1 Phase to phase or phase to neutral testing ............................................................92

C.2 Test method ..........................................................................................................92

Annex D ( informative) Further tes ts on dips (polyphase) . ... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... ...94

D.1 Test procedure ......................................................................................................94

D.1.1 General .....................................................................................................94

D.1.2 Phase voltage dips and interruptions .........................................................95

D.1.3 Phase swells ..............................................................................................95

Annex E (normative) Gapless measurements of voltage amplitude and harmonics test . ... ... .97

E.1 Purpose of the test ................................................................................................97

E.2 Test set up ............................................................................................................97

E.3 Voltage amplitude ..................................................................................................97

E.3.1 Test signal .................................................................................................97

E.3.2 Result evaluation .......................................................................................97

E.4 Harmonics .............................................................................................................98

E.4.1 Test signal .................................................................................................98

E.4.2 Result evaluation .......................................................................................98

Annex F ( informative) Gapless measurements of voltage amplitude and harmonics . ... ... ..... .99

Annex G ( informative) Test ing equipment requirements .. ... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... . 107

Annex H ( informative) Example of test report .. ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... ..... .. ... .. 108

Annex I (informative) Mixed inf luence quant it ies ... ... ..... ... ..... ..... ... ..... ..... ... ..... ... ..... ..... ... .... 109

I.1 Variations due to mixed influence quantities for frequency ................................... 109

I.2 Variations due to mixed influence quantities for magnitude of voltage .................. 109 I.3 Variations due to mixed influence quantities for dips and swells .......................... 110

I.4 Variations due to mixed influence quantities for under and over deviations .......... 110

Figure 1 - Overview of test for dips according to 4.1.1 ...........................................................27

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Figure 2 – Detail 1 of waveform for test of dips according to 4.1.1.........................................27

Figure 3 - Detail 2 of waveform for tests of dips according to 4.1.1 ........................................28


Figure 5 - Detail 1 of waveform for test of dips according to 4.1.2 .........................................28


Figure 7 - Detail 1 of waveform for test of swells according to 4.1.2 ......................................30

Figure 8 - Detail 2 of waveform for tests of swells according to 4.1.2 ....................................30 Figure 9 - Sliding reference voltage test ................................................................................31

Figure 10 - Sliding reference start up condition .....................................................................31

Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions ..............................32

Figure 12 - Detail 2 of waveform for test of polyphase dips/interruptions ...............................33

Figure 13 - Detail 3 of waveform for test of polyphase dips/interruptions ..............................33

Figure 14 – Detail 1 of waveform for test of polyphase swells ................................................34

Figure 15 - Detail 2 of waveform for test of polyphase swells ................................................35

Figure 16 - Flagging test for C lass A .....................................................................................53

Figure 17 - Clock uncertainty testing .....................................................................................54 Figure 18 - Overview of test for dips according to 4.1.1 .........................................................63

Figure 19 – Detail 1 of waveform for test of dips according to 4.1.1 .......................................63

Figure 20 - Detail 2 of waveform for tests of dips according to 4.1.1 ......................................64


Figure 22 - Detail 1 of waveform for test of dips according to 4.1.2 .......................................64


Figure 24 - Detail 1 of waveform for test of swells according to 4.1.2 ....................................66

Figure 25 - Detail 2 of waveform for tests of swells according to 4.1.2 ..................................66

Figure 26 - Sliding reference voltage test ..............................................................................67 Figure 27 - Sliding reference start up condition .....................................................................67

Figure 28 – Detail 1 of waveform for test of polyphase dips/interruptions ..............................68

Figure 29 - Detail 2 of waveform for test of polyphase dips/interruptions ...............................69

Figure 30 - Detail 3 of waveform for test of polyphase dips/interruptions ..............................69

Figure 31 – Detail 1 of waveform for test of polyphase swells ................................................70

Figure 32 - Detail 2 of waveform for test of polyphase swells ................................................71

Figure 33 - Flagging test for C lass S .....................................................................................84

Figure 34 - Clock uncertainty testing .....................................................................................85

Figure H.1 - Different kind of uncertainties ............................................................................89 Figure A.1 – Phase-to-neutral testing on three-phase systems ..............................................92

Figure A.2 – Phase-to-phase testing on three-phase systems ...............................................92

Figure B.1 - ...........................................................................................................................94

Figure B.2 - ...........................................................................................................................95

Figure B.3 - ...........................................................................................................................95

Figure D.1 - S imulated signal under noisy conditions ............................................................99

Figure D.2 - Waveform for check ing gapless RMS voltage measurement ............................ 100

Figure D.3 - 2.3 Hz Frequency fluctuation ........................................................................... 100

Figure D.4 - Spectral leakage effects for a missing sample ................................................. 101 Figure D.5 - Illustration of QRMS for missing samples ......................................................... 101

Figure D.6 - Detection of a s ingle missing sample ............................................................... 102

Figure D.7 - QRMS for an ideal signal, sampling error =300 x 10-6

...................................... 102


...................................... 103

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...................................... 103

Figure D.10 - QRMS with ideal test signal and perfect sampling frequency synchronization 104

Figure D.11 - QRMS with 300 x 10-6

sampling frequency error and 100 x 10-6

modulationfrequency error ................................................................................................................... 105

Figure D.12 - QRMS with a 20/24 cycles s liding window with a output every 10/12 cycles ... 105

Figure D.13 - Amplitude test for f luctating component ......................................................... 105

Table 1 – Summary of type tests for Class A .........................................................................14

Table 2 – Summary of type tests for Class S .........................................................................15

Table 3 – Testing points for each measured parameter .........................................................16

Table 4 - List of single "power system influence quantities" ...................................................17

Table 5 - List of mixed "power system influence quantities" ...................................................19

Table 6 – Influence of Temperature .......................................................................................19

Table 7 – Influence of auxiliary power supply voltage ............................................................19

Table 8 – List of generic test criteria .....................................................................................19

Table 9 – Uncertainty requirements .......................................................................................88

Table J.1 -........................................................................................................................... 109

Table J.2 -........................................................................................................................... 109

Table J.3 -........................................................................................................................... 110

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INTRODUCTION

Power Quality instruments on the current market have different characteristics, which need a commonsystem of references. Therefore there is a need for a new standard in order to facilitate the choices of theend-users in terms of performances, safety, interpretation of the indications, ... This standard provides abasis by which such devices can be specified and described, and their performance evaluated.

It is acknowledged that IEC 61000-4-30 standard is a basic EMC publication. Detailed guidance oninstrument performance, performance verification methods, additional influence quantities and other

similar information should, in general, be found in a product standard.

IEC 62586-2 is a standard specifying functional and uncertainty tests intended to verify the compliance of a product to class A and class S measurement methods defined in IEC 61000-4-30.

IEC 62586-2 is therefore not conflicting but complementing IEC 61000-4-30 standard.

This standard is based on IEC guide 111 recommendations.

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1 Scope

This standard specifies functional tests and uncertainty requirements for instruments whose functionsinclude measuring, monitoring and/or ascertaining Power Quality parameters in power supply systems,and whose measuring methods (class A or class S) are defined in IEC 61000-4-30.

These requirements are applicable in single, dual- (split phase) and 3-phase a.c. power supply systems at

50 Hz or 60 Hz.

If devices such as digital fault recorders, energy/power meters, protection relays or circuit breakersinclude Power Quality functions defined in 61000-4-30 class A or class S, and if those devices arespecified according to this standard, then this standard shall fully apply, and shall apply in addition to therelevant product standard. This standard does not replace the relevant product standard.

NOTE 1 - It is not the intent of this standard to address user interface or topics non related to device measurement performance.

NOTE 2 - The standard does not cover postprocessing & interpretation of the data, for example with a d edicated software.

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2 Normative references

The following normative documents contain provisions, which through reference in this text constituteprovisions of this standard. At the time of publication, the editions indicated were valid. All normativedocuments are subject to revision, and parties to agreements based on this standard are encouraged toinvestigate the possibility of applying the most recent editions of the normative documents indicatedbelow. Members of IEC and ISO maintain registers of currently valid International Standards.

The following referenced documents are essential for the application of this document. For datedreferences, only the edition cited applies. For undated references, the latest edition of the referenceddocument (including any amendments) applies.

IEC 62586-1: Power Quality Measurement in power supply systems – Part 1: Power Quality Instruments(PQI)

IEC 60359: Electrical and electronic measurement equipment – Expression of performance

IEC 61000-4-7: 2002, Electromagnetic compatibility (EMC) – Part 4-7: Testing and measurementtechniques – General guide on harmonics and interharmonics measurements and instrumentation, for

power supply systems and equipment connected thereto

IEC 61000-4-15: 2010, Electromagnetic compatibility (EMC) – Part 4: Testing and measurementtechniques – Section 15: Flickermeter – Functional and design specifications

IEC 61000-4-30: 2008, Electromagnetic compatibility (EMC) – Part 4-30: Testing and measurementtechniques – Power quality measurement methods

IEC 61000-2-4: Electromagnetic compatibility (EMC) – Part 2-4: Environment – Compatibility levels inindustrial plants for low-frequency conducted disturbances

IEC 61334-3-1: Distribution automation using distribution line carrier systems - Part 3-1: Mains signalling

requirements - Frequency bands and output levels

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3 Definitions, abbreviations, notations and symbols

For the purposes of this document, definitions of IEC 61000-4-30 apply as well as the following terms anddefinitions:

3.1 General definitions

3.1.1Limit range of operationextreme conditions that an measuring instrument can withstand without damage and without degradation

of its metrological characteristics when it is subsequently operated within its rated operating conditions

NOTE: measuring instrument should be able to function within the limit range of operation

3.1.2rated range of operationrange of values of a single influence quantity that forms a part of the rated operating conditions

NOTE: uncertainty should be met within the rated range of operation

3.2 Definitions related to uncertainty

3.2.1intrinsic uncertaintyuncertainty of a measuring instrument when used under reference conditions. In this standard, it is apercentage of the measured value defined in its rated range and with the other influence quantities under

reference conditions, unless otherwise stated

[IEC 60359, definition 3.2.10, modified]

3.2.2influence quantityquantity which is not the subject of the measurement and whose change affects the relationship between

the indication and the result of the measurement

NOTE 1 Influence quantities can originate from the measured system, the measuring equipment or the environment [IEV].

NOTE 2 As the calibration diagram depends on the influence quantities, in order to assign the result of a measurement it isnecessary to know whether the relevant influence quantities lie within the specified range [IE V].

NOTE 3 An influence quantity is said to lie within a range C' to C" when the results of its measurement satisfy the relationship:

C' ≤ V – U < V + U ≤ C".

[IEC 60359, definition 3.1.14]

3.2.3variation (due to a single influence quantity)

difference between the value measured under reference conditions and any value measured within theinfluence range

NOTE The other performance characteristics and the other influence quantities should stay within the ranges specified for thereference conditions.

3.2.4(rated) operating conditions

set of conditions that must be fulfilled during the measurement in order that a calibration diagram may bevalid

NOTE Beside the specified measuring range and rated operating ranges for the influence quantities, the conditions may includespecified ranges for other performance characteristics and other indications that cannot be expressed as ranges of quantities.

[IEC 60359, definition 3.3.13]

3.2.5operating uncertainty

uncertainty under the rated operating conditions

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NOTE The operating instrumental uncertainty, like the intrinsic one, is not evaluated by the user of the instrument, but is statedby its manufacturer or calibrator. The statement may be expressed by means of an algebraic relation involving the intrinsicinstrumental uncertainty and the values of one or several influence quantities, but such a relation is just a convenient means of expressing a set of operating instrumental uncertainties under different operating conditions, not a functional relation to be usedfor evaluating the propagation of uncertainty inside the instrument.

[IEC 60359, definition 3.2.11, modified]

3.2.6overall system uncertainty

uncertainty including the instrumental uncertainty of several separated instruments (sensors, wires,measuring instrument, etc.) under the rated operating conditions

3.3 Notations

3.3.1 Functions

See functions defined in IEC 61000-4-30.

3.3.2 Symbols and abbreviations

N.R. Not Requested

N.A. Not Applicable

3.3.3 Indices

min minimum value

max maximum value

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4 Requirements

4.1 Requirements for products complying with class A

Products compliant with class A of IEC 61000-4-30 shall comply with the following requirements:

- Compliance with class A operational uncertainty, based on testing, as defined in clause 8.

- Compliance with class A functional tests as defined in clause 6, based on common requirementsdefined in clause 5. A summary of those tests is provided in Table 1.

Table 1 – Summary of type tests for Class A

Power Systeminfluencequantities

Clause

Measurementmethod

Measurement uncertainty andmeasuring range

Measurementevaluation

Measurementaggregation

Uncertaintyunder

referenceconditions

Variationsdue to

influencequantities

Power frequency 6.1 6.1.2 6.1.3.1 6.1.3.2 6.1.4 N.A.

Magnitude of supply voltage

6.2 6.2.1 6.2.2.1 6.2.2.2 N.A. 6.2.4

Flicker 6.3 See IEC61000-4-15

See IEC61000-4-15

N.A. N.A. N.A.

Supply voltageinterruptions, dipsand swells

6.4 6.4 6.4 6.4 N.A. 6.4

Supply voltageunbalance

6.5 6.5 6.5 N.A. N.A. N.A.

Voltageharmonics

6.5.3 6.5.3 6.5.3 6.5.3 N.A. 6.5.3

Voltage inter-harmonics

6.7 6.7.1 6.7.2.1 6.7.2.2 N.A. 6.7.4

Mains Signallingvoltage

6.8 6.8 6.8 6.8.2.2 N.A. 6.8

Under-over deviations

6.9 6.9 6.9 6.9 N.A. 6.9

Flagging 6.10 6.10 N.A. N.A. N.A. N.A.

Time clockuncertainty

6.11 N.A. 6.11 N.A. N.A. N.A.

Variations due toexternal influencequantities

6.12 N.A. N.A. 6.12 N.A. N.A.

4.2 Requirements for products complying with class S

The testing procedure for class S instruments is identical to class A instruments, if class A measurementmethod is implemented (see Chapter 6). However, the measurement range and measuring uncertainty areexpected to meet or exceed the performance requirements defined in IEC 61000-4-30 for class Sinstruments.

Products compliant with class S of IEC 61000-4-30 shall comply with the following requirements:

- Compliance with class S operational uncertainty, based on testing, as defined in clause 8.

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- Compliance with class S functional tests as defined in clause 7, based on common requirementsdefined in clause 5. A summary of those tests is provided in Table 2 Erreur ! Source du renvoiintrouvable.:

Table 2 – Summary of type tests for Class S

Power Systeminfluence

quantities

Clause

Measurementmethod

Measurement uncertainty andmeasuring range

Measurementevaluation

Measurementaggregation

Uncertaintyunder

referenceconditions

Variationsdue to

influencequantities

Power frequency

Magnitude of supply voltage

Flicker

Supply voltageinterruptions, dipsand swells

Supply voltageunbalance

Voltageharmonics

Voltage inter-harmonics

Mains Signallingvoltage

Under-over deviations

Flagging

Time clockuncertainty

Variations due toexternal influencequantities

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5 Functional type tests common requirements

5.1 General philosophy for testing

5.1.1 Measuring ranges

Table 3 below defines the different testing points that shall be applied according to the test proceduresdefined in clause 6, in order to check the uncertainty over the measuring range.

Table 3 – Testing points for each measured parameter

Measuredparameter

Class Testing pointP1

a)

Testing pointP2

a)

Testing pointP3

a)

Testing pointP4

a)

Testing pointP5

a)

Frequency 50 Hzb)

(covers 50 Hz) A 42,5 Hz 50,05 Hz 57,5 Hz 50 Hz N.A.

S 42,5 Hz 50,05 Hz 57,5 Hz 50 Hz N.A.

Frequency 60 Hzb)

(covers 60 Hz) A 51 Hz 59,95 Hz 69 Hz 60 Hz N.A.

S 51 Hz 59,95 Hz 69 Hz 60 Hz N.A.

Voltage magnitude A 10 % U din 45 % U din 80 % U din 115 % U din 150 % U din

S 20 % U din 45 % U din 70 % U din 95 % U din 120 % U din

Swellsc)

A Thresholdswell-

d)

Thresholdswell+

d)110 % U din 120 % U din 200 % U din

S Thresholdswell-

d)

Thresholdswell+

d)110 % U din 120 % U din 150 % U din

Dips, Interruptionsc)

A Thresh old

dip-d)

Thresholddip+

d)

20 % U din 60 % U din 85 % U din

S Thresholddip-

d)

Thresholddip+

d)

20 % U din 60 % U din 85 % U din

Voltage harmonics A Fundamentalas specified

5% on the 2nd

harmonic

Fundamentalas specified

10% on the

3rd

harmonic


1% on the

50th

harmonic

Fundamental asspecified

Distortion on all

harmonicssimultaneouslyup to the 50

th

order at 10% of class 3compatibilitylevels from IEC61000-2-4


Distortion on all

harmonicssimultaneouslyup to the 50

th


S N.A. N.A. N.A. N.A. N.A.

Voltageinterharmonics

A Fundamenta las specified

5% on theinterharmonicat 1,5 x the

fundamentalfrequency








Distortion on 4selectedinterharmonics

e)

up to the 50th



Distortion on 4selectedinterharmonics

e)

up to the 50th



MsV A Udin appliedat thefundamentalfrequency,with 0% Udinat thespecifiedcarrier

frequency

Udin appliedat thefundamentalfrequency,with 1% Udinat thespecifiedcarrier

frequency

Udin appliedat thefundamentalfrequency,with 3% Udinat thespecifiedcarrier

frequency

Udin applied atthe fundamentalfrequency, with9% Udin at thespecified carrier frequency

Udin applied atthe fundamentalfrequency, with15% Udin at thespecified carrier frequency


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Measuredparameter

Class Testing pointP1

a)

Testing pointP2

a)

Testing pointP3

a)

Testing pointP4

a)

Testing pointP5

a)

a)Measured parameters shall be considered individually, e.g. Testing point P1 for frequency, Testing point P2 for

Flicker, …

b)Instruments intended to work at 50 Hz shall use the figures provided line “Frequency 50 Hz”. Instruments intended to

work at 60 Hz shall use the figures provided in line “Frequency 60 Hz”. Instruments intended to work both at 50 Hz and60 Hz shall use the figures provided in lines “Frequency 50 Hz” and “Frequency 60 Hz”.

c)see details in Annex C.

d)

Threshold swell+ = Lowest threshold for swells declared by manufacturer + uncertainty of residual voltagemeasurement + hysteresis

e)The manufacturer may select the interharmonics but shall report them in the type test report.

Threshold swell- = Lowest threshold for swells declared by manufacturer - uncertainty of residual voltage measurement – hysteresis

Threshold dip+ = Lowest threshold for dips declared by manufacturer + uncertainty of residual voltage measurement +hysteresis

Threshold dip- = Lowest threshold for swells declared by manufacturer - uncertainty of residual voltage measurement –hysteresis

NOTE 1 : this table is derived from clause 6.2 of IEC 61000-4-30

5.1.2 Single "power system influence quantities"

Table 4 specifies in detail the requirements of sub clause 6.1 in IEC 61000-4-30. It specifies the testingstates min, mean and max for each Power system influence quantity, and for each performance class.Testing states will have to be considered for each Power System influence quantity independently and notas a whole set.

These test points are intended to be applied according to the test procedures defined in clause 6 and

clause 7.

Table 4 - List of single "power system influence quantities"

Power System

influencequantities

Class Testing state

S1a)

Testing state

S2a)

Testing state

S3a)

Testing state

S4a)

Testing state

S5a)

Frequency:

a) for instrumentscovering both 50Hz and 60 Hzfrequencies

A 42,5 Hz 50 Hz 55,75 Hz --- 69 Hz

S 42,5 Hz 50 Hz 55,75 Hz --- 69 Hz

b) for instrumentscovering only 50Hz frequency

A 42,5 Hz 50 Hz 57,5 Hz --- ---

S 42,5 Hz 50 Hz 57,5 Hz --- ---

c) for instrumentscovering only 60Hz frequency

A 51 Hz 60 Hz 69 Hz --- ---

S 51 Hz 60 Hz 69 Hz --- ---

Voltage magnitude A 10 % U din --- 200 % U din --- ---

S 10 % U din --- 150 % U din --- ---

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Power Systeminfluencequantities

Class Testing stateS1

a)

Testing stateS2

a)

Testing stateS3

a)

Testing stateS4

a)

Testing stateS5

a)

Harmonics (inaddition to thefundamentalsignal)

Ac)d)

3rd harmonic:10 % U din

7th harmonic:10 % U din



19 th harmonic:5 % U din

23 rd harmonic:5 % U din

--- --- ---

S Harmonic H5:15 % U

din, at

+90º

--- --- --- ---

Interharmonicsb)

(including ranksbelowfundamental)

A Frequency =1,5 xfundamentalfrequency; 9 %of U din

Frequency =0,5 xfundamentalfrequency;2,5 % of U din

Distortionapplied at twointerharmonicfrequenciessimultaneously:

1) Frequency =2

ndharmonic

plus 5 Hz(105Hz at50Hz, and/or 125Hz at60Hz),Magnitude =4% of U din

2) Frequency =2

ndharmonic

plus 10 Hz(110Hz at50Hz, and/or 130Hz at60Hz),Magnitude =6% of U din

---

S --- Frequency =

1,5 xfundamentalfrequency;2,5 % of U din

Frequency =

0,5xfundamentalfrequency;2,5 % of U din

--- ---

a)Influence quantities shall be considered individually, e.g. Testing State S1 for f requency, Testing State S2 for

Flicker, … Other influence quantities shall stay in reference conditions for testing.

b)Mains Signalling Voltages may be used like interharmonics for being an influence quantity.

c)Harmonics shall be shifted by 180° compared to fundamental.

d)This signal represents a crest factor of 2.

NOTE 1: this table is derived from Table 1 of IEC 61000-4-30

5.1.3 Mixed "power system influence quantities" measuring range

Table 5 specifies in detail the requirements of subclause 6.2 of IEC 61000-4-30.

Testing states of Table 5 will have to be considered as a whole set including all influence quantitiesacting together.

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Table 5 - List of mixed "power system influence quantities"

Power Systeminfluence quantities

Testing state M1a)

Testing state M2

a)Testing state M3

a)

Frequency( f no m = 50 Hz and 60

Hz)

f no m ± 0,5 Hz f no m – 1 Hz ± 0,5 Hz f no m + 1 Hz ± 0,5 Hz

Voltage magnitude U di n ±1 % Determined by flicker,unbalance, harmonics,interharmonics (below)

Determined by flicker,unbalance, harmonics,interharmonics (below)

Flicker P st < 0,1 P st = 1 ± 0,1 – rectangular modulation at 39 changes / min

P st = 4 ± 0,1 – rectangular modulation at 110 changes / min

Unbalance 100% ±0,5 % of U di n on all

channels. Allphase angles 120°(equivalent tou0 = 0 %, u2 = 0 %)

73 % ±0,5 % of U din Channel 1



all phase angles 120°(equivalent to u0 = 5,05 %,

u2 = 5,05 %)




all phase angles 120°(equivalent to u0 = 4,95 %,

u2 = 4,95 %)

Harmonics 0 % to 3 % of U di n 10 % ± 3 % of U di n 3rd at 0°

5 % ± 3 % of U di n 5th at 0°

5 % ± 3 % of U di n 29 th at 0°

10 % ± 3 % of U di n 7th at 180°

5 % ± 3 % of U din 13th at 0°

5 % ± 3 % of U din 25th at 0°

Interharmonics 0 % to 0,5 % of U di n

1 % ± 0,5 % of U di n at 7,5 f no m 1 % ± 0,5 % of U di n at 3,5 f no m

a)Influence quantities shall be considered all together, with a mix of all influence quantities.

NOTE: this table is derived from Table 2 of IEC 61000-4-30

5.1.4 "External influence quantities"

Table 6 and Table 7 specify the different testing states related to temperature and Power supply voltage.

Table 6 – Influence of Temperature

Influencequantities

Testing state ET1 Testing state ET2 Testing state ET3

Temperaturea)

Minimum temperature of therated range of operationb)

.Bathe time as needed toachieve equilibrium,minimum 1 hour

worst case as defined bythe manufacturer among therated range of operation

b)

Bathe time as needed toachieve equilibrium,minimum 1 hour

Maximum temperature asdefined in the rated range of operation

b)

Bathe time as needed toachieve equilibrium,minimum 1 hour

a)Circulating air may be forced or unforced. If circulating air is forced, then the temperature limit shall be

adjusted to account for the impact of the forced air on the internal temperature of the device under test. For example, if the impact of the forced air is deemed to lower the effective temperature by 5°C, then the temperaturelimit shall be raised by 5°C.

b)For PQI products, this rated range of operation is specified in Table 1 and Table 2 of IEC 62586-1. Each

manufacturer or product standard referring to IEC 62586-2 will have to specify the rated temperature range of operation.

Table 7 – Influence of auxiliary power supply voltage

Influencequantities

Testing state EV1 Testing state EV2

Auxili ary power supply voltage

U min as specified bymanufacturer

U max as specified bymanufacturer

5.1.5 Test criteria

Table 8 specifies the different generic test criteria used in clause 6 and clause 7.

Table 8 – List of generic test criteria

Test criteria N° Definition

TC10s(unc) Every 10 sec frequency measurement shall be within their specified UNCertainty.

TC10s(sam) Every 10 sec frequency measurement shall be the SAMe (within twice the intrinsic uncertainty).

TC(11≤ N ≤13) Counter number of frequency readings in 2 min: 11≤N≤13

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Test criteria N° Definition

TC10/12(unc) Every basic 10/12 cycles measurement shall be within their specified uncertainty.

TC150/180(unc) Every 150/180 cycles aggregation measurement shall be within their specified uncertainty.

TC10/12(unc)-harm

For the harmonic order(s) being tested, every basic 10/12 cycle m easurement shall be within theuncertainty specified in IEC 61000-4-7 class I.

TC150/180(unc)-harm

For the harmonic order(s) being tested, every 150/180-cycle aggregation measurement shall bewithin the uncertainty specified in IEC 61000-4-7 class I.

TC10-min(unc)-harm

For the harmonic order(s) being tested, every 10-min aggregation measurement shall be withinthe uncertainty specified in IEC 61000-4-7 class I.

TC150/180(unc)-thd

The total harmonic distortion is calculated according to the definition for subgroup total harmonicdistortion (THDS) in IEC 61000-4-7

TC10/12(unc)-interharm

For the interharmonic order(s) being tested, every basic 10/12 cycle measurement shall bewithin the uncertainty specified in IEC 61000-4-7 class I.

TC150/180(unc)-interharm

For the interharmonic order(s) being tested, every 150/180-cycle aggregation measurement shallbe within the uncertainty specified in IEC 61000-4-7 class I.

TC10-min(unc)-interharm

For the interharmonic order(s) being tested, every 10-min aggregation measurement shall bewithin the uncertainty specified in IEC 61000-4-7 class I.

5.2 Testing procedure

5.2.1 Device under test

The device under test shall be representative of the device in production.

5.2.2 Testing conditions

Reference conditions for testing defined in the related product standard shall apply unless otherwisespecified. For PQI products, these reference conditions are specified in IEC 62586-1.

5.2.3 Testing equipment

Testing equipment and its calibration date shall be specified in the test report and in the certificate.

For class A testing, an external synchronisation device shall be used.

NOTE: some guidance is provided in Annex G.

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6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30

6.1 Power frequency

6.1.1 General

Frequency measurement shall be made on the reference channel.

6.1.2 Measurement method

Each test shall last 2 minutes at least.

N° Target of the test Testing pointsaccording to Table 3

Complementary testconditions

Test criterion (if test is applicable)

1.1.1

S

Check that averaging intervalis 10 sec

Loop (see schemebelow):

P1-P3 triangle

Period: 5 sec

P3-P1 triangle

Period: 5 sec

Count the number of frequency readings in 2min (N)

TC10s(sam)

TC(11≤ N ≤13)

5s 10s 15s

fHz

P1

P3

6.1.3 Measurement uncertainty and measuring range

6.1.3.1 Uncertainty under reference conditions

Each test shall last 1 min at least.




1.2.1

S

Check measuring range P1 for Frequency a) --- TC10s(unc)

1.2.2

S


1.2.3

S


a) Instruments intended to work at 50 Hz shall use the figures provided line “Frequency 50 Hz”. Instrumentsintended to work at 60 Hz shall use the figures provided in line “Frequency 60 Hz”. Instruments intended to workboth at 50 Hz and 60 Hz shall use the figures provided both in line “Frequency 50 Hz” and in line “Frequency 60Hz”.

6.1.3.2 Variations due to single influence quantities





1.3.1

M

Check influence of voltagemagnitude on measurementuncertainty.

P2 for Frequencya) b)

S1 for voltage magn. TC10s(unc)

1.3.2

M

Check influence of harmonicson measurement uncertainty.

P2 for Frequency a) b) S1 for Harmonics TC10s(unc)

a) Instruments intended to work at 50 Hz shall use the figures provided line “Frequency 50 Hz”. Instruments

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intended to work at 60 Hz shall use the figures provided in line “Frequency 60 Hz”. Instruments intended to workboth at 50 Hz and 60 Hz shall use the figures provided both in line “Frequency 50 Hz” and in line “Frequency 60Hz”.

b) Frequency measurement is made on the reference channel.

6.1.4 Measurement evaluation

N° Target of the test Test

1.4.1

S

Reference channel It shall be checked that the frequency measurement is made on thereference channel

6.1.5 Measurement aggregation

Aggregation is not required for power frequency

6.2 Magnitude of supply voltage


Each test shall last 1 second at least.


2.1.1

M

Check gapless and nonoverlapping measurement

A tes t shall be achieved according t o the requir ements of Annex E.

NOTE: the following tests are not listed here because they are covered by other tests : Check true r.m.smeasurement (covered by other tests), Check basic accuracy of 10/12 cycles measurement (covered by other tests)







2.2.1.

S

Check measuring range P1 for Voltage magn. --- TC10/12(unc)

2.2.2. Check measuring range P3 for Voltage magn. --- TC10/12(unc)




N° Target of the test Testing pointsaccording Table 3

Complementary testconditions according

to Table 4


2.3.1.

S

Check influence of frequencyon measurement uncertainty.

P3 for Voltage magn. S1 for Frequency TC10/12(unc)

S3 for Frequency TC10/12(unc)


2.3.2.

S


P3 for Voltage magn. S1 for Harmonics TC10/12(unc) on ch1compared to areference voltage


Not applicable.


6.2.4.1 10/12 cycles with 10 min synchronisation

Each test shall last 11 minutes at least, and shall contain at least two consecutive RTC 10 minute ticks.

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2.4.1

L

Check aggregation overlap 1 P3 for magnitude of voltage

f = 59,99 Hz (covering60 Hz) or f = 49,99 Hz(covering 50 Hz)” (10min tick should occur inthe middle of 10/12cycle time intervalnumber 3000)

Test duration = 11 min

Test the time tag,and the sequencenumber of blocks.

NOTE: 10 min tick should occur in the middle of the 10/12 cycle time interval number 3000.

59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10

6.2.4.2 150/180 cycles aggregation with 10 min synchronisation





2.5.1

L

Check aggregation overlap 2 Loop (see schemebelow):

- Voltage changinglinearly from P1 to P3for 1min, then

-linearly from P3 to P1for 1min

f = 50,125 Hz (covering50 Hz) and/or 60,15 Hz(covering 60 Hz)depending onmanufacturer selection.

Check 150/180cycles aggregationcomply with IEC61000-4-30

1 min 2 min 3 min

U (v)

P1

P3

NOTE: 10 min tick should occur in the middle of the 150/180 cycle time interval number 201

50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180

6.2.4.3 10-min aggregation




to Table 4

Test criterion

2.6.1

L

Check 10-min aggregation Loop (see schemebelow):


- linearly from P3 to P1for 1min

S2 for Frequency Check 10 minaggregation complywith IEC 61000-4-30

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1 min 2 min 3 min

U (v)

P1

P3

6.2.4.4 2-hours aggregation




2.7.1

XL

Check 2-hours aggregation It shall be checked that the 2-hours aggregated value is provided by theequipment under test.

6.3 Flicker

Test shall be performed according to IEC 61000-4-15 testing requirements.

XXXL

6.4 Supply voltage interruptions, dips and swells

6.4.1 General

NOTE - further guidance for testing is provided in Annex C and Annex D.

N° Target of the test Testing points

according to Table 3

Complementary test

conditions

Test criterion (if

test is applicable)

4.1.1.

M

Check Urms (1/2) areindependently synchronizedon each channel on zerocrossing.

P4 for frequency

a)for

at least 15 sd)

.

Voltage step should bemade on zerocrossing.

This test does notrequire synchronizedgenerator.

- At T1, inject 0% U din

interruption of duration2 cycles followed by astep at 90% U din and

of 2 cycles, then asteady state at 94%U din on channel 1

- At T1+10cycles + 1/3cycle, apply the same

profile on channel 2.-At T1+20cycles - 1/3cycle, apply the sameprofile on channel 3.

See Figure 1 andFigure 2.

- Check, for eachchannel, that thesequence of Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 4.

- Check time tag of Urms(1/2) (N+1) onchannel 1: T1 + ½cycle. - Check thattime tag of Urms(1/2) (N+1) onchannel2 isT1+10,5cycles+/-1/2cycle

- Check that time tagof Urms(1/2) (N+1)on channel3 isT1+20,5cycles+/-1/2cycle.

4.1.2.

S

Check amplitude andduration accuracyrequirement

d) P5 for swells.b)

P4 for Frequencya)


The signal change inamplitude to create

Check that alldurations andamplitudes reportedon the dips/ swells/interruptionmeasurements are

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P3 for Dips/Int.b)

P4 for Frequencya)

dips/swells/interruptionwill be simultaneous intime.

Test shall be achievedwith the followingdurations: 1; 1,5; 2,5;10; 30 and 150 cycles.

See Figure 5,Figure6,Figure 7 and Figure 8

complying with IEC61000-4-30 §5.4.5.1(amplitude accuracyrequirement) and§5.4.5.2 (durationaccuracyrequirement)

4.1.3.

S

Check threshold P2 for swellsb) c)

P4 for Frequencya)


The signal change inamplitude to createdips/swells/interruptionwill be simultaneous intime.

Test shall be achievedwith the followingdurations: 2,5 cycles.

Check the durationaccuracy complieswith IEC 61000-4-30§5.4.5.2P1 for swells

b) c)

P4 for Frequencya)

P2 for Dips/Int.b) c)

P4 for Frequencya)


P4 for Frequencya)

4.1.4.

S

Check influence of mainsfrequency.

P1 for Frequencya)

P2 for Dips/Int.b)



Test shall be achievedwith the followingdurations: 2 and 30cycles.

Check the durationaccuracy complieswith IEC 61000-4-30§5.4.5.2P3 for Frequency

a)

P2 for Dips/Int.b)

4.1.5.

S

Checkdips / interruptions /swells in a polyphase system

A tes t shall be achieved according to the requirements of 6.4.2 and6.4.3.

4.1.6.

M

Check sliding voltagereference - Steady statestate operation

1) configuration: selectsliding referencevoltage, dip thresholdset to 90%Usr,hysteresis=2% U din.

2) Inject steady statevoltage at U din for at

least 5mins. Thendecrease voltageamplitude by to 95%U din for 5mins. Then

87% U din for 5mins.

See Figure 9 No dip should bedetected.

3) Inject dip of 5

cycles duration at 50% U din.

Verify that

instrument isdetecting a dip at(57,5)%Uref.

NOTE 1: 57,5% =50/87*100%

4.1.7.

M

Check sliding voltagereference - Sliding referencestart up condition

1) configuration :select slidingreference voltage, dipthreshold set to 90% U din, hysteresis=2%

U din.

2) Turn on theinstrument with 0Vinjected at the voltageinputs.

See Figure 10 The instrument shalldetect a interruptionstart.

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3) After 5 mins +instrument boot uptime, inject voltage = U din

NOTE 2: the purposeis to check that thesliding reference

voltage is built from aninitial value of Udin,not refreshed until thevoltage is applied.

Verify that theinstrument hasdetected an end of interruption

a)Instruments intended to work at 50 Hz shall use the fi gures provided line “Frequency 50 Hz”. Instruments intended

to work at 60 Hz shall use the figures provided in line “Frequency 60 Hz”. Instruments intended to work both at 50Hz and 60 Hz shall use the figures provided both in line “Frequency 50 Hz” and in line “Frequency 60 Hz”.

b)Test points P1, P2, P3, P4 and P5 as described in Table 3 and in IEC 61000-4-30 table C.1.

c)Test point P1 must not be identified as a dip/swell, and testing points P2 must be identified as a dip/swell.

d)Recommended values for threshold dip is 90%Udin, for swell threshold is 110%Udin, Hysteresis =2%.

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0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150testsignalphase1

0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150testsignalphase2

0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150

testsignalphase3ZerocrossingatT1+10cycles

ZerocrossingatT1+20cycles

ZerocrossingatT1

Figure 1 - Overview of test for dips according to 4.1.1

0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80

1001/2cycleRMSphase1

0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80


0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80


Figure 2 – Detail 1 of waveform for test of dips according to 4.1.1

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U din

90 %2 % Hysteresis

2 % Hysteresis0 %

Vdip duration

Vdip start Vdip end

Figure 3 - Detail 2 of waveform for tests of dips according to 4.1.1

Urms(1/2)N

Urms(1/2)N+1

Urms(1/2)N+2

Urms(1/2)N+3

Urms(1/2)N+4

Urms(1/2)N+5

Urms(1/2)N+6

Urms(1/2)N+7

100 70 0 0 0 64 90 90

Urms(1/2)N+8

Urms(1/2)N+9

Urms(1/2)N+10

Urms(1/2)N+11

Urms(1/2)N+12

Urms(1/2)N+13

Urms(1/2)N+14

Urms(1/2)N+15

90 92 94 94 94 94 94 94


0 0.02 0.04 0.06 0.08 0.1 0.12-150

-100

-50

0

50

100

150

test signal: dip 60 %, 2.5 cycles

Figure 5 - Detail 1 of waveform for test of dips according to 4.1.2

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0 0.02 0.04 0.06 0.08 0.1 0.120

20

40

60

80

100

1201/2 cycle RMS


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0 0.02 0.04 0.06 0.08 0.1 0.12-300

-200

-100

0

100

200

300test signal: swell 200 %, 2.5 cycles

Figure 7 - Detail 1 of waveform for test of swells according to 4.1.2

0 0.02 0.04 0.06 0.08 0.1 0.120

20

40

60

80

100

120

140

160

180

2001/2 cycle RMS

Figure 8 - Detail 2 of waveform for tests of swells according to 4.1.2

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87%Udin

Udin

50%Udin

95%Udin

Figure 9 - Sliding reference voltage test

Udin

Figure 10 - Sliding reference start up condition

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6.4.2 Check dips / interruptions in polyphase system




4.2.1.

M

Check that dips and

interruptions are properlydetected in a polyphasesystem, by applying a singletest with a 3 phase nonsynchronous disturbance thatcontains both a dip and aninterruption

P4 for frequency for at

least 15 s.

Dip threshold = 90%U din, hysteresis =2%

Udin

Interruption threshold= 10% U din, hysteresis

=2% U din

Voltage steps shouldbe made on zerocrossing for eachphase.

This test does not

require a synchronizedgenerator.

- Begin the test with allthree phases set toU din

- At t1 (synchronized tozero crossing on phase1), inject 0% U din on

phase 1

- At t1+1cycle(synchronized to zerocrossing on phase 2),inject 0% U din on

phase 2


phase 3


phase 3


phase 2


phase 1

See Figure 11, Figure12 and Figure 13

- Check, for each

channel, that thesequence of Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 9.

- Check that thepolyphase dipduration is correctlyreported as 6,5cycles (within thetiming accuracydefined in IEC61000-4-30).

- Check that the

polyphaseinterruption durationis correctly reportedas 1,5 cycles (withinthe timing accuracydefined in IEC61000-4-30).

- Check that theremaining voltagefor the dipmeasurement iscorrectly reported as0% U din (within the

magnitude accuracydefined in IEC

61000-4-30).

Interruptionthreshold

Dipthreshold

DDIPduration

t2 t3

t4

t1

DINTduration

Phase1Phase2Phase3

Dipstarts

Interruptionstarts

Figure 11 – Detail 1 of waveform for test of polyphase dips/interruptions

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IEC 62586-2 – 33 – 85/394/CD

NOTE: the figure is not drawn t o scale

Figure 12 - Detail 2 of waveform for test of polyphase dips/interruptions

Urms(1/2)N

Urms(1/2)N+1

(start of dip)

Urms(1/2)N+2

Urms(1/2)N+3

Urms(1/2)N+4

Urms(1/2)N+5

Urms(1/2)N+6

(start of interrupt.)

Urms(1/2)N+7

Phase 1 100 70 0 0 0 0 0 0

Phase 2 100 100 100 70 0 0 0 0

Phase 3 100 100 100 100 100 70 0 0

Urms(1/2)N+8

Urms(1/2)N+9

(end of interrupt.)

Urms(1/2)N+10

Urms(1/2)N+11

Urms(1/2)N+12

Urms(1/2)N+13

Urms(1/2)N+14

(end of dip)

Urms(1/2)N+15

Phase 1 0 0 0 0 0 70 100 100

Phase 2 0 0 0 70 100 100 100 100

Phase 3 0 70 100 100 100 100 100 100


Phase 1

Phase 2

Phase 3

t1 t2 t3 t4

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6.4.3 Check swells in polyphase system




4.3.1.

M

Check that swells areproperly detected in apolyphase system, byapplying a single test with a3 phase non synchronousswell injection


least 15 s.

Swell threshold =110% U din, hysteresis

=2% Udin


This test does notrequire a synchronizedgenerator.



phase 1


phase 2

- At t1+2cycles(synchronized to zerocrossing on phase 3),inject 130% U din on

phase 3

- At t1+4cycles(synchronized to zerocrossings on phase 1and phase 3), inject100% U din on both

phase 1 and phase 3


phase 2

See Figure 14 and.Figure 15

- Check, for eachchannel, that thesequence of Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 15

- Check that thepolyphase swellduration is correctlyreported as 6,5cycles (within thetiming accuracydefined in IEC61000-4-30).

- Check that the

polyphase swellamplitude iscorrectly reported as130% U din (within

the magnitudeaccuracy defined inIEC 61000-4-30).

swell threshold

Swellamplitude

t1t3

DPOLYSWL = t3- t1

Phase 1Phase 2

Phase 3

Swell starts

Figure 14 – Detail 1 of waveform for test of polyphase swells

Urms(1/2)

N

Urms(1/2)

N+1

(start of swell)

Urms(1/2)

N+2

Urms(1/2)

N+3

Urms(1/2)

N+4

Urms(1/2)

N+5

Urms(1/2)

N+6

Urms(1/2)

N+7

Phase 1 100 116 130 130 130 130 130 130

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Phase 2 100 100 100 116 130 130 130 130

Phase 3 100 100 100 100 100 127 150 150

Urms(1/2)

N+8

Urms(1/2)

N+9

Urms(1/2)

N+10

Urms(1/2)

N+11

Urms(1/2)

N+12

Urms(1/2)

N+13

Urms(1/2)

N+14

(end of swell)

Urms(1/2)

N+15

Phase 1 130 116 100 100 100 100 100 100

Phase 2 130 130 130 130 130 116 100 100

Phase 3 150 127 100 100 100 100 100 100

Figure 15 - Detail 2 of waveform for test of polyphase swells

6.5 Supply voltage unbalance

6.5.1 General

Use a 3 channel AC power source that meets or exceeds the following stability ratings under the reference conditions defined in Table 11: voltage ±0,05%

6.5.2 Measurement method, measurement uncertainty and measuring range

N° Target of the test Testing conditions Complementary testconditions


5.1.1

S

Check accuracy of unbalancemeasurement

Connect a 3 channel AC power source andadjust

Channel 1 (L1 to N) to100% of U din



--- check if u0 and u2 isbetween 0 % and0,15 %

5.1.2

S


Connect the 3 channel AC power source andadjust




--- check if u0 and u2 isbetween 4,9 % and5,2 %

5.1.3

S





Channel 3 (L3 to N) to128% of U

din


5.1.4

S

Check accuracy of unbalancemeasurement with phasedisplacement with a 4 wiressystem.


Channel 1 (L1 to N) to

--- check if u0 = 2,47%+/- 0,15%

and u2 = 4,52% +/-

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100% of U din , 0°

Channel 2 (L2 to N) to90% of U din , -122°

Channel 3 (L3 to N) to100% of U din , +118°

0,15%

6.5.3 Aggregation

Manufacturers shall provide the aggregated values for verification.

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6.6 Voltage harmonics


Each test shall last 10 seconds at least.




6.1.1.

Sameas U

Check that the 10/12-cyclemeasurement intervals aregapless and non-overlapping

A tes t shall be ach ieved according to the requirements o f Annex E

6.1.2.

M

Check that the 10/12-cyclemeasurements use theharmonic subgroupmeasurement (Usg.h) fromIEC 61000-4-7

Apply referenceconditions, plus P1 for harmonics (verify basicsubgroup measurement)

--- TC10/12(unc)-harmfor the 2

ndharmonic

(2nd

harmonic ispresent at 5%)

Apply referenceconditions, plus P1 for interharmonics

(eliminate incorrectuse of Ug,h)


ndharmonic

(no significant

content detected)

Apply referenceconditions, plus S4 for interharmonics(eliminate incorrectuse of Ug)


ndharmonic

(2nd


6.1.3.

S

Check that measurementsare made at least up to the50

thorder

--- --- Verify that at least50 harmonics areprovided by thedevice

6.1.4.

S

If total harmonic distortion iscalculated, check that it isthe subgroup total harmonic

distortion (THDS) from IEC61000-4-7

Apply referenceconditions plus P5 for harmonics

--- TC150/180(unc)-thd(significant distortiondetected)

Apply referenceconditions plus P5 for interharmonics

--- TC150/180(unc)-thd(no significantdistortion detected)

6.1.5.

S

Check that a crest factor of at least 2 is supported by thedevice

Apply referenceconditions plus S1 for harmonics (crest factor of 2)

--- TC150/180(unc)-harm for all 50harmonics

6.1.6.

M

Check that a properlydesigned anti-aliasing filter isused on the device, providing(in combination withoversampling) attenuation of all frequencies above the 50

th

harmonic exceeding 50 dB

a)Apply reference

conditions plus 10% of U din at 75,0 x the

fundamental frequency

--- TC150/180(unc)-harm for all 50harmonics (noaliasing detected)

Apply referenceconditions plus 10% of

U din at 150,0 x thefundamental frequency

--- TC150/180(unc)-harm for all 50

harmonics (noaliasing detected)

Apply referenceconditions plus 10% of U din at 501,0 x the



a)Only three mandatory anti-aliasing test points are defined here to simplify the minimum testing requirement.

However, depending on th e sampling rate and filter characteristics of the device under test, other spectral contentmay be required to properly evaluate the operation of an anti-aliasing filter. The test lab applying this proceduremay additionally choose to apply a set of broad spectrum signals as a more exhaustive test of the anti-aliasing filter,using a network analyzer or other similar equipment.


6.6.2.1 Measurement uncertainty and measuring range


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6.2.2

S

Check measuring uncertainty – s ing le even harmonic

Reference conditionsplus P1 for harmonics

--- TC150/180(unc)-harm for applicableharmonics

6.2.3

S

Check measuring uncertainty – s ing le odd harmonic



6.2.4

S

Check measuring uncertainty – s ing le high harmonic



6.2.5

S

Check measuring range – lowend



6.2.6

S

Check measuring range –high end



NOTE: The 150/180-cycle values are selected for these tests for ease of data extraction, as it will be necessary toextract measurement data for all 50 harmonics, and this is easier to do in a 3-second window than a shorter one.





to Table 4


6.3.1

M

Check influence of frequencyon measurement uncertainty

Reference conditionsplus P1 for harmonics(lowest harmonicorder)

S1 for frequency(lowest frequency)

TC150/180(unc)-harm for all 50harmonics

Reference conditionsplus P3 for harmonics(highest harmonicorder)

S5 for frequency(highest frequency)


6.3.2

M

Check influence of voltagemagnitude on measurementuncertainty


S1 for voltagemagnitude (lowestvoltage)



S3 for voltagemagnitude (highestvoltage)




Not applicable.


6.6.4.1 10/12 cycles with 10 min synchronization

Each test shall last 11 minutes at least, and shall contain at least two consecutive RTC 10

minute ticks.

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6.4.1.

L

Check aggregation overlap 1 Reference conditionsplus P2 for harmonics

f = 49,99 or 59,99 Hz(10 min tick shouldoccur in the middle of

10 or 12 cycle timeinterval number 3000)


Test the time tag,and the sequencenumber of blocks for

the 3

rd

harmonic.


59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10

6.6.4.2 150/180 cycle aggregation with 10 min synchronization

Each test shall last 11 minutes at least, and shall contain at least two consecutive RTC 10minute ticks.




6.5.1.

L

Check aggregation overlap 2 Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying harmoniccontent as described:

-Start at P2 for harmonics

-Ramp the harmoniccontent down by 1 %/suntil it reaches 0 %

-Ramp the harmoniccontent up by 1 %/suntil it reaches P2

-Repeat

f = 50,125 Hz (covering50 Hz) or 60,15 Hz(covering 60 Hz)depending onmanufacturer selection.

TC150/180(unc)-harm for the 3

rd

harmonic, withcorrect aggregationof the 10/12-cyclevalues for each of the two overlapping150/180-cycleaggregation intervals


50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180

6.6.4.3 10 min aggregation


minute ticks.




6.6.1.

L

Check 10-min aggregation Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying harmoniccontent as described:


-Ramp the harmoniccontent down by 1 %/s

until it reaches 0 %


f = 49,99 or 59,99 Hz(10 min tick shouldoccur in the middle of 10 or 12 cycle timeinterval number 3000)


TC10-min(unc)-harmfor the 3

rdharmonic,

with correctaggregation of the10/12-cycle valuesbased on the blocksequence numbers

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IEC 62586-2 – 40 – 85/394/CD

-Repeat


59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10

6.6.4.4 2 hours aggregation


Complementarytest conditions

Test criterion (if testis applicable)

6.7.1.

S (justcheckdate isprovided)

Check 2-hour aggregation It shall be checked that the 2 hours aggregated value is provided by theequipment under test.

6.7 Voltage inter-harmonics






7.1.1.

Sameas for U



7.1.2.

M

Check that the 10/12-cyclemeasurements use theinterharmonic subgroupmeasurement (Uisg.h) fromIEC 61000-4-7

Apply referenceconditions, plus P1 for harmonics

--- TC10/12(unc)-interharm for the twointerharmonicssurrounding the 2

nd

harmonic (nosignificant contenton either interharmonic)

Apply referenceconditions, plus P1 for interharmonics

--- TC10/12(unc)-interharm for theinterharmonicbetween thefundamental and the2

ndharmonic

(interharmonic is

present)

7.1.3.

S


thorder

--- --- Verify that at least50 interharmonicsare provided by thedevice







7.2.1

M

Check measuring uncertainty – no interharmonics

Reference conditions --- TC150/180(unc)-interharm for all 50interharmonics

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7.2.2

M

Check measuring uncertainty – s ing le low order interharmonic

P1 for interharmonics --- TC150/180(unc)-interharm for all 50interharmonics

7.2.3

M

Check measuring uncertainty – s ing le med ium order

interharmonic

P2 for interharmonics --- TC150/180(unc)-interharm for all 50

interharmonics7.2.4

M

Check measuring uncertainty – s ing le high order interharmonic


7.2.5

M

Check measuring range – lowend


7.2.6

M

Check measuring range –high end


NOTE: The 150/180-cycle values are selected for these tests for ease of data extraction, as it will be necessary toextract measurement data for all 50 interharmonics, and this is easier to do in a 3-second window than a shorter one.





to Table 4

Test criterion

7.3.1

M


P1 for interharmonics(lowest interharmonicorder


TC150/180(unc)-interharm for all 50interharmonics

P3 for interharmonics(highest interharmonicorder)



7.3.2

M


P2 for interharmonics S1 for voltagemagnitude (lowestvoltage)


P2 for interharmonics S3 for voltagemagnitude (highestvoltage)


NOTE: The 150/180-cycle values are selected for these tests for ease of data extraction, as it will be necessary toextract measurement data for all 50 interharmonics, and this is easier to do in a 3-second window than a shorter one.


Not applicable.




minute ticks.




7.4.1.

L

Check aggregation overlap 1 P2 for interharmonics f = 49,99 or 59,99 Hz(10 min tick shouldoccur in the middle of 10 or 12 cycle timeinterval number 3000)


Test the time tag,and the sequencenumber of blocks for the interharmonic at7,5 x thefundamentalfrequency.


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59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10






7.5.1.

L

Check aggregation overlap 2 Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying interharmoniccontent as described:

-Start at P2 for interharmonics

-Ramp theinterharmonic content

down by 1 %/s until itreaches 0 %

-Ramp theinterharmonic contentup by 1 %/s until itreaches P2

-Repeat


TC150/180(unc)-interharm for theinterharmonic at 7,5x the fundamentalfrequency, withcorrect aggregationof the 10/12-cyclevalues for each of the two overlapping150/180-cycleaggregation intervals


50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180






7.6.1.

L

Check 10-min aggregation Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying interharmoniccontent as described:

-Start at P2 for interharmonics

-Ramp the

interharmonic contentdown by 1 %/s until itreaches 0 %

-Ramp theinterharmonic contentup by 1 %/s until itreaches P2

-Repeat



TC10-min(unc)-interharm for theinterharmonic at 7,5x the fundamentalfrequency, withcorrect aggregationof t

TC150/180(unc)-interharm for all 50

interharmonics he10/12-cycle valuesbased on the blocksequence numbers


59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10

6.7.4.4 2-hour aggregation




7.7.1. Check 2-hour aggregation It shall be checked that the 2 hours aggregated value is provided by theequipment under test.

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S

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IEC 62586-2 – 44 – 85/394/CD

6.8 Mains Signalling Voltages on the supply voltage




Complementary test

conditions

Test criterion (if test

is applicable)8.1.1

S

Verify that the user canspecify the carrier frequencyto monitor, up to 3 kHz

--- --- Product allows theuser to configuremonitored carrier frequencies up to 3kHz

8.1.2

S

Verify that the user canspecify the detectionthreshold (above 0,3% U din )

and length of recordingperiod (up to 120s)

--- --- Product allows theuser to configuredetection thresholdand recording periodas specified

8.1.3

M

If method 1a)

is implemented,verify proper implementation

Configure the productto monitor a carrier frequency of 1060 Hz.

Apply the foll owingtest points for MainsSignalling, each of which apply twointerharmonicfrequenciessimultaneously on thesame signal under reference conditions:

--- ---

1060 Hz bin only(should count towardMsV):

P3 at 1060 Hz

--- TC10/12(unc ), wherethe expected value isthe r.m.s. voltage for the component at1060Hz only

Two adjacent bins(should not counttoward MsV):

P3 at 1055 Hz, and

P3 at 1065 Hz

--- TC10/12(unc ), wherethe expected value isthe r.m.s. voltage for the component at1060Hz only

8.1.4

M

If method 2b)

is implemented,verify proper implementation

Configure the productto monitor a carrier frequency of 316,67Hz.

Apply the foll owingtest points for MainsSignalling, each of which apply twointerharmonic

frequenciessimultaneously on thesame signal under reference conditions:

--- ---

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Middle two bins(should both counttoward MsV):

P3 at 315 Hz and

P3 at 320 Hz

--- TC10/12(unc ), wherethe expected value isthe root of the sum of

squares for the four bins closest to themonitored frequencyonly:

310 Hz

315 Hz

320 Hz

325 Hz

Outer two bins (shouldboth count towardMsV):

P3 at 310 Hz and

P3 at 325 Hz

--- TC10/12(unc ), wherethe expected value isthe root of the sum of squares for the four bins closest to the

monitored frequencyonly:

310 Hz

315 Hz

320 Hz

325 Hz

Two bins adjacent tothe calculation range(should not counttoward MsV):

P3 at 305 Hz and

P3 at 330 Hz

--- TC10/12(unc ), wherethe expected value isthe root of the sum of squares for the four bins closest to themonitored frequencyonly:

310 Hz

315 Hz

320 Hz

325 Hz

8.1.5

L

If method 1a)

and method 2b)

are both implemented, andthe manufacturer claims todynamically select themethod based on the user-specified frequency (IEC61000-4-30 calls this the“preferred” approach), verifythat the product uses the

appropriate method

Same tests as 8.1.3and 8.1.4, but appliedsequentially withoutmanual intervention(other than specifyingthe carrier frequency)

--- Product passes both8.1.3 and 8.1.4without manualintervention

8.1.6

S

Verify that the productindicates when a signalexceeds the detectionthreshold

Configure the productto use a detectionthreshold of 0,5%, andto monitor a carrier frequency of 316,67Hz, then apply the twotests below.

--- ---

a) Apply P1 for MainsSignalling (carrier frequency of 316,67Hz).

--- The product does notindicate that thesignal has exceededthe detectionthreshold

b) Apply P2 for Mains

Signalling (carrier frequency of 316,67Hz).

--- The product does

indicate that thesignal has exceededthe detectionthreshold

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8.1.7

S

Verify that the product canrecord the 10/12-cycle signalvoltage values during the

recording period following thedetection, to give themaximum level of the signalvoltage during this time.

Configure the productto use a recordingperiod of 120s, and

then apply the sametest as 8.1.6 b).

--- The maximum level of the signal voltageduring the 120s

recording period canbe determined fromthe recorded 10/12-cycle values.

a“Method 1” refers to the method based on “the corresponding 10/12-cycle r.m.s. value interharmonic bin”.

b)“Method 2” refers to the method based on “the root of the sum of the squares of the 4 nearest 10/12-cycle r.m.s.

value interharmonic bins”.






Complementary test

conditions

Test criterion (if test

is applicable)

8.2.1

S

Verify measurementuncertainty for a carrier frequency of 316,67 Hz

P2 for Mains Signalling(carrier frequency of 316,67 Hz)

--- TC10/12(unc) for thechosen method







8.2.2

S

Verify measurementuncertainty for a carrier frequency of 1060 Hz

P2 for Mains Signalling(carrier frequency of 1060 Hz)








8.2.3

S

Verify measurement

uncertainty for a carrier frequency of 2975 Hz

P2 for Mains Signalling

(carrier frequency of 2975 Hz)

--- TC10/12(unc) for the

chosen method









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to Table 4


8.3.1

S

Check influence of frequency on

measurement uncertainty

P3 for Mains Signalling(carrier frequency of

2975 Hz)

S1 for Frequency TC10/12(unc) for thechosen method





8.3.2

S

Check influence of voltagemagnitude on

measurement uncertainty

P3 for Mains Signalling(carrier frequency of

316,67 Hz)

S1 for Voltagemagnitude

TC10/12(unc) for thechosen method


S3 for Voltagemagnitude

TC10/12(unc) for thechosen method

8.3.4

S

Check influence of harmonics onmeasurement uncertainty


S1 for Harmonics TC10/12(unc) for thechosen method


S1 for Harmonics TC10/12(unc ) for thechosen method

6.8.2.3 Measurement evaluation

Not applicable.

6.8.3 Aggregation

Not applicable.

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6.9 Measurement of underdeviation and overdeviation parameters


Tests for the measurement method are specified in the table below for 10/12-cycle values only

(aggregation is specified in a later section).

IEC 61000-4-30 Ed. 2 describes the measurement method for Urms-under,i and Urms-over,ibased on the 10/12-cycle r.m.s. value Urms-200ms,i, where i denotes the specific 10/12-cycleinterval. However, the underdeviation (Uunder) and overdeviation (Uover) are only describedwithin the aggregation section. The table below assumes that Uunder and Uover may also becalculated for every 10/12-cycle interval, using the same formula from the aggregation sectionto aggregate a single 10/12-cycle value.

For the 10/12-cycle interval, a device shall make available at least one of Uunder and Urms-under, and at least one of Uover and Urms-over. All of the values that are made available shallcomply with the requirements stated below.





9.1.1

S

Steady-state test - check for proper calculation of Urms-

under , Uunder , Urms-over and Uover when Urms-200ms > U din

P5 for magnitude of supply voltage (voltageis 150% of U din )

For every 10/12-cycle value:

Urms-under = U din

Uunder = 0%

Urms-over = U rms-200ms

Uover = (Urms-over –U din) / U din [approx

50%]

9.1.2

S


under , Uunder , Urms-over and Uover when Urms-200ms = U din

Reference conditions(magnitude of supplyvoltage is U din +/- 1%)


Urms-under = U din or

Urms-200ms, whichever is lower

Uunder = (U din - Urms-

under ) / U din [approx

0%]

Urms-over = U din or

Urms-200ms, whichever is higher

Uover = (Urms-over –U din ) / U din [approx

0%]

9.1.3

S


under , Uunder , Urms-over and Uover when Urms-200ms < U din



Urms-under = Urms-200ms

(the magnitude of supply voltage)



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90%]

Urms-over = U din

Uover = 0%

9.1.4

M

Non-steady-state test - checkthat all 10/12-cycle valuesare calculated without gaps

10/12-cycle valueswill repeat in groupsof four:

1. Uunder = 90%, Uover = 0%

2. Uunder between0%-90% and Uover =0%, or Uunder = 0%and Uover between0%-50%

3. Uunder = 0% and

Uover = 50%


9.1.5

S

Verify number of valuesproduced

N/A On single-phasesystems, 1 value isprovided for each of Urms-under and Urms-

over .

On 3-phase 3-wiresystems, 3 valuesare provided for each of U rms-under andUrms-over .

On 3-phase 4-wiresystems, either 6values or 3 valuesare provided for each of U rms-under andUrms-over .


6.9.2.1 General

For underdeviation and overdeviation, the calculated values are dependent on the underlying10/12-cycle r.m.s. values, as specified for the magnitude of supply voltage. The relevant testsin 6.2.4.1 are considered necessary and sufficient to verify the measurement uncertainty andmeasuring range, as described below.


Covered by 6.2.4.1.

It is sufficient to verify that the underlying 10/12-cycle calculations for magnitude of supplyvoltage meet the relevant accuracy and range requirements.


Covered by 6.2.4.1.

P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

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Not applicable.


In IEC 61000-4-30 Ed. 2, equations (6) and (7) specify the aggregation method for underdeviation and overdeviation in a slightly different manner than for other parameters. Thefollowing tests are intended to verify that these aggregation methods are implemented properly.


Covered by 6.2.2

It is sufficient to verify that the underlying 10/12-cycle calculations for magnitude of supplyvoltage are properly synchronized at the 10-minute tick.





9.2.1

M

Verify proper aggregation of Uunder and Uover for the150/180-cycle interval(according to equations 6and 7 from IEC 61000-4-30Ed. 2):

1.

Frequency = 50Hz / 60Hz (or both whenapplicable)

Test shall last at least 10 seconds.

The 10/12-cycler.m.s. values willrepeat in groups of four, as per 9.1.3.

These 10/12-cycler.m.s. values shallbe recorded, and

synchronized withthe associated150/180-cyclevalues for Uunder and Uover.

The 150/180-cyclevalues must beconsistent with thetheoretical valuesderived from the10/12-cycle r.m.s.values, usingequations 6 and 7.

9.2.2

L

Verify that the 150/180-cycleaggregations for Uunder andUover are re-synchronized atthe 10-minute tick

Frequency = 50.125 Hz / 60.15 Hz (or both whenapplicable)

Test shall last at least 11 minutes, and shallcontain at least two consecutive RTC 10 minuteticks.


These 10/12-cycler.m.s. values shallbe recorded, andsynchronized withthe associated150/180-cyclevalues for Uunder and Uover.

The final 150/180-cycle value in one10-minute intervaland the first (re-

synchronized)150/180-cycle valuein the next 10-minute interval shallboth be consistentwith the theoretical

P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

P1

P5

Vr.m.s

20/24

cycles

40/48

cycles

60/72

cycles

80/96

cycles

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values derived fromthe 10/12-cycler.m.s. values, usingequations 6 and 7.


50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180






9.3.1

L

Verify proper aggregation of Uunder and Uover for the 10-minute interval (according toequations 6 and 7 from IEC

61000-4-30 Ed. 2):

2.


Test shall last at least 11 minutes, and shall

contain at least two consecutive RTC 10 minuteticks.


These 10/12-cycler.m.s. values shallbe recorded for theentire 10-minuteinterval, and lined upwith the associated10-minute values for Uunder and Uover.

The 10-minutevalues must beconsistent with thetheoretical valuesderived from the10/12-cycle r.m.s.values, using

equations 6 and 7.





9.4.1.

S


P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

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6.10 Flagging

N° Target of the test Testing points Test criterion (if test is applicable )

10.1.1

XL

Flagging in polyphase systemcaused by voltage dip

For Plt flicker

Dip: 70% of U din, 1

channel, L2, Duration:

100 ms

Each of the parameters listed below is flaggedwithin each of the corresponding measurement

intervals that contain the dip/swell/interruption(as illustrated in Figure 18):

- Flicker (2-hour Plt)

10.1.2L


a)


channel, L2, Duration:100 ms

Each of the parameters listed below is flaggedwithin each of the corresponding measurementintervals that contain the dip/swell/interruption(as illustrated in Figure 18):

- Power frequency (10-second)

- Voltage magnitude (10/12-cycle, 150/180-cycle, 10-minute)

- Flicker (10-minute Pst)

- Supply voltage unbalance (10/12-cycle,

150/180-cycle, 10-minute)

- Voltage harmonics (10/12-cycle, 150/180-cycle, 10-minute)

- Voltage interharmonics (10/12-cycle, 150/180-cycle, 10-minute)

- Mains signalling (10/12-cycle)

- Underdeviation and overdeviation (10/12-cycle, 150/180-cycle, 10-minute)”

10.1.3.

L

Flagging in polyphase systemcaused by voltage swell

a)

Swell: 120 % of U din,

2 channels, L1+L3,Duration: 100 ms

10.1.4.

L

Flagging in polyphase systemcaused by voltageinterruption

a)

Interruption: 0% of U din, 3 channels,

L1+L2+L3, Duration:100 ms

NOTE 1: the 100ms dip / swell / interruption must begin and end within the same 10/12-cycle interval, and withinthe same 10-second interval fo r frequency.

NOTE 2: the test should last 6 hours, because three 2-hours aggregation should be evaluated.

a) For instruments using the polyphase approach for data flagging, the flag is applied to all measured phases. For instruments using the channel by channel approach , the flag is applied only to the phase(s) containing the dip /swell / interruption event. The polyphase approach and t he channel by channel approach are defined in IEC 6 2586-1.

NOTE: see explanation in the below figure

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RTC10-mintick

3

10-mininterval(x)

10/12cycles

1 2

150/180cycletimeinterval(n+1)

2hourinterval(y)

150/180cycles(n)

1/2cyclerms

10/12cycles

10/12

cycles

15

10/12

cycles

1

10/12

cycles

2

10/12

cycles

……..

dip/swell/interruption

1...1011...2

0

21...3

0141...150 1...10

11...2

0

voltagemagnitudesupplyvoltageunbalance

voltageharmonicsvoltageinterharmonicsmainssignalling

underdeviationandoverdeviation

Voltagemagnitude,supplyvoltageunbalance,voltageharmonics,voltageinterharmonics,underdeviationandoverdeviation,flickerPst

FlickerPlt

10-secinterval(z)

Frequency

2-hinterval(x)

Flaggeddata

1...1213...2

4

25...3

6169...180 1...12

13...2

4

1/2cyclerms

RTC10-stick

TestsignalLegend

Figure 16 - Flagging test for Class A

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6.11 Clock uncertainty testing




11.1.1.

S

Check clock uncertainty 1) Verify that instrument is operating with clock synchronization (check

device status).

2) Inject a fixed duration interruption with a synchronized signalgenerator (note start time of interruption T1start.

3) Verify the instrument has detected an interruption and note themeasured start time (reading) T1start_mes. Check the accuracy of T1start mes shall be T1start +/- 1 cycle.

4) Disconnect or disable the synchronization and leave the instrumentmeasuring for approx 24hours.

NOTE: during that time, the device is available to be used for test notrequiring synchronization.


6) Verify the instrument has detected an interruption and note themeasured start time (reading) T2start_mes

7) Verify the clock uncertainty :Modulus(T2start-T2start_mes) < (T2start-T1start)*1/(3600*24)

NOTE 1: the injected interruption 2) and 5 ) will have an arbitrary duration (e.g. 1second)

NOTE 2: T1start_mes and T2start_mes have a resolution of +/ 20ms

Figure 17 - Clock uncertainty testing

Generator Interrupt

T1start

Instrument reading T1start_mes

Instrument reading

T2start_mes

Generator Interrupt T2start

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6.12 Variations due to external influence quantities

6.12.1 General

The variations shall only be checked for frequency measurement and for voltage measurement.

6.12.2 Influence of temperature




to Table 6


12.1.1.

XL

Check influence of lowtemperature

P1 for Frequencya)

ET1 TC10s(uie)

P2 for Frequencya)

ET1 TC10s(uie)

P3 for Frequencya)

ET1 TC10s(uie)

P1 for Voltage magn ET1 TC10s(uie)



Clock uncertainty(check drift on a 8

hours duration)

ET1 TC10s(uie)

12.1.2.

XL

Check influence of worstcase temperature

P1 for Frequencya)

ET2 TC10s(uie)

P2 for Frequencya)

ET2 TC10s(uie)

P3 for Frequencya)

ET2 TC10s(uie)




Clock uncertainty(check drift on a 8hours duration)

ET2 TC10s(uie)

12.1.3.

XL

Check influence of hightemperature

P1 for Frequencya)

ET3 TC10s(uie)

P2 for Frequencya)

ET3 TC10s(uie)

P3 for Frequency a) ET3 TC10s(uie)

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ET3 TC10s(uie)

a)Instruments intended to work at 50 Hz shall use the figures provided line “Frequency 50 Hz”. Instruments intended


6.12.3 Influence of power supply voltage



to Table 6


12.2.1.

S

Check influence of low power supply voltage

P1 for Frequencya)

EV1 TC10s(uie)

P2 for Frequencya)

EV1 TC10s(uie)

P3 for Frequencya)

EV1 TC10s(uie)

P1 for Voltage magn EV1 TC10s(uie)



12.2.2.

S

Check influence of highpower supply voltage

P1 for Frequencya)

EV2 TC10s(uie)

P2 for Frequencya)

EV2 TC10s(uie)

P3 for Frequencya)

EV2 TC10s(uie)




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7 Functional testing procedure for instruments complying with class S according toIEC 61000-4-30

7.1 Power frequency

7.1.1 General

Refer to chapter 14.


The testing procedure is identical to ‘ClassA’.

Each test shall last 2 minutes at least.




S1.1.1

S

Check that averaging intervalis 10 sec


P1-P3 triangle

Period: 5 sec

P3-P1 triangle

Period: 5 sec

Count the number of frequency readings in 2min (N)

TC10s(sam)

TC(11≤ N ≤13)

5s 10s 15s

fHz

P1

P3








1.2.1

S


1.2.2

S


1.2.3

S





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1.3.1

M

Check influence of voltage

magnitude on measurementuncertainty.

P2 for Frequencya) b)

S1 for voltage magn. TC10s(unc)

1.3.2

M


P2 for Frequency a) b) S1 for Harmonics TC10s(unc)


b) Frequency measurement is made on the reference channel.



1.4.1

S

Reference channel It shall be checked that the frequency measurement is made on thereference channel


Aggregation is not required for power frequency

7.2 Magnitude of the supply voltage





2.1.1

M

Check gapless and nonoverlapping measurement

A tes t shall be ach ieved according to the requirements of Annex E.

NOTE: the following tests are not listed here because they are covered by other tests : Check true r.m.smeasurement (covered by other tests), Check basic accuracy of 10/12 cycles measurement (covered by other tests)








2.2.1.

S

Check measuring range P1 for Voltage magn. --- TC10/12(unc)





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to Table 4


2.3.1.

S

Check influence of frequencyon measurement uncertainty.

P3 for Voltage magn. S1 for Frequency TC10/12(unc)



2.3.2.

S


P3 for Voltage magn. S1 for Harmonics TC10/12(unc) on ch1compared to areference voltage


Not applicable.



The Not required for Class S.

Note: Class S requires gapless and non overlapping 10/12 cycles blocks (test in 2.1.1), there isno further requirement on 10min synchronization.






2.5.1

L

Check gaplessimplementation



-linearly from P3 to P1for 1min

f = 50,125 Hz (covering50 Hz) and/or 60,15 Hz(covering 60 Hz)depending onmanufacturer selection.

Check 150/180cycles aggregationcomply with IEC61000-4-30

1 min 2 min 3 min

U (v)

P1

P3


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50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180





to Table 4

Test criterion

2.6.1

L

Check 10-min aggregation Loop (see schemebelow):


- linearly from P3 to P1for 1min

S2 for Frequency Check 10 minaggregation complywith IEC 61000-4-30

1 min 2 min 3 min

U (v)

P1

P3

7.2.4.4 2-hours aggregation




2.7.1

XL

Check 2-hours aggregation It shall be checked that the 2-hours aggregated value is provided by theequipment under test.

7.3 Flicker

Test shall be performed according to IEC 61000-4-15 testing requirements.

XXXL

7.4 Supply voltage interruptions, dips and swells

7.4.1 General

NOTE - further guidance for testing is provided in Annex C and Annex D.

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4.1.1.

M

Check Urms (1/2) areindependently synchronizedon each channel on zero

crossing.

P4 for frequency

a)for

at least 15 sd)

.

Voltage step should bemade on zerocrossing.


- At T1, inject 0% U din

interruption of duration2 cycles followed by astep at 90% U din and

of 2 cycles, then asteady state at 94%U din on channel 1

- At T1+10cycles + 1/3cycle, apply the sameprofile on channel 2.

-At T1+20cycles - 1/3cycle, apply the sameprofile on channel 3.

See Figure 1 andFigure 2.

- Check, for eachchannel, that thesequence of

Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 4.

- Check time tag of Urms(1/2) (N+1) onchannel 1: T1 + ½cycle. - Check thattime tag of Urms(1/2) (N+1) onchannel2 isT1+10,5cycles+/-1/2cycle

- Check that time tagof Urms(1/2) (N+1)

on channel3 isT1+20,5cycles+/-1/2cycle.

4.1.2.

S

Check amplitude andduration accuracyrequirement

d) P5 for swells.b)

P4 for Frequencya)



Test shall be achievedwith the followingdurations: 1; 1,5; 2,5;

10; 30 and 150 cycles.

See Figure 5,Figure6,Figure 7 and Figure 8

Check that alldurations andamplitudes reportedon the dips/ s wells/interruptionmeasurements arecomplying with IEC61000-4-30 §5.4.5.1(amplitude accuracyrequirement) and§5.4.5.2 (durationaccuracy

requirement)

P3 for Dips/Int.b)

P4 for Frequencya)

4.1.3.

S

Check threshold P2 for swellsb) c)

P4 for Frequencya)



Test shall be achievedwith the following

durations: 2,5 cycles.

Check the durationaccuracy complieswith IEC 61000-4-30§5.4.5.2P1 for swells

b) c)

P4 for Frequencya)


P4 for Frequencya)


P4 for Frequency a)

4.1.4.

S

Check influence of mainsfrequency.

P1 for Frequencya)

P2 for Dips/Int.b)



Test shall be achievedwith the followingdurations: 2 and 30cycles.

Check the durationaccuracy complieswith IEC 61000-4-30§5.4.5.2P3 for Frequency

a)

P2 for Dips/Int.b)

4.1.5.

S

Checkdips / interruptions /swells in a polyphase system

A tes t shall be ach ieved according to the requirements o f 6.4.2 and6.4.3.

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4.1.6.

M

Check sliding voltagereference - Steady statestate operation

1) configuration: selectsliding referencevoltage, dip threshold

set to 90%Usr,hysteresis=2% U din .

2) Inject steady statevoltage at U din for at

least 5mins. Thendecrease voltageamplitude by to 95%U din for 5mins. Then

87% U din for 5mins.

See Figure 9 No dip should bedetected.

3) Inject dip of 5cycles duration at 50% U din.

Verify thatinstrument isdetecting a dip at(57,5)%Uref.

NOTE 1: 57,5% =

50/87*100%

4.1.7.

M

Check sliding voltagereference - Sliding referencestart up condition

1) configuration :select slidingreference voltage, dipthreshold set to 90% U din, hysteresis=2%

U din.

2) Turn on theinstrument with 0Vinjected at the voltageinputs.

See Figure 10 The instrument shalldetect a interruptionstart.

3) After 5 mins +instrument boot up

time, inject voltage =

U din

NOTE 2: the purposeis to check that thesliding referencevoltage is built from aninitial value of Udin,not refreshed until thevoltage is applied.

Verify that theinstrument has

detected an end of interruption

a)Instruments intended to work at 50 Hz shall use the figures provided line “Frequency 50 Hz”. Instruments intended


b)Test points P1, P2, P3, P4 and P5 as d escribed in Table 3 and in IEC 61000-4-30 table C.1.

c) Test point P1 must not be identified as a dip/swell, and testing points P2 must be identified as a dip/swell.

d)Recommended values for threshold dip is 90%Udin, for swell threshold is 110%Udin, Hystersis =2%.

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0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150testsignalphase1

0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150testsignalphase2

0 0.1 0.2 0.3 0.4 0.5 0.6-150

-100

-50

0

50

100

150

testsignalphase3ZerocrossingatT1+10cycles

ZerocrossingatT1+20cycles

ZerocrossingatT1

Figure 18 - Overview of test for dips according to 4.1.1

0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80


0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80


0 0.1 0.2 0.3 0.4 0.5 0.60

20

40

60

80


Figure 19 – Detail 1 of waveform for test of dips according to 4.1.1

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U din

90 %2 % Hysteresis

2 % Hysteresis0 %

Vdip duration

Vdip start Vdip end


Urms(1/2)N

Urms(1/2)N+1

Urms(1/2)N+2

Urms(1/2)N+3

Urms(1/2)N+4

Urms(1/2)N+5

Urms(1/2)N+6

Urms(1/2)N+7

100 70 0 0 0 64 90 90

Urms(1/2)N+8

Urms(1/2)N+9

Urms(1/2)N+10

Urms(1/2)N+11

Urms(1/2)N+12

Urms(1/2)N+13

Urms(1/2)N+14

Urms(1/2)N+15

90 92 94 94 94 94 94 94


0 0.02 0.04 0.06 0.08 0.1 0.12-150

-100

-50

0

50

100

150

test signal: dip 60 %, 2.5 cycles

Figure 22 - Detail 1 of waveform for test of dips according to 4.1.2

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0 0.02 0.04 0.06 0.08 0.1 0.120

20

40

60

80

100

1201/2 cycle RMS


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0 0.02 0.04 0.06 0.08 0.1 0.12-300

-200

-100

0

100

200

300test signal: swell 200 %, 2.5 cycles

Figure 24 - Detail 1 of waveform for test of swells according to 4.1.2

0 0.02 0.04 0.06 0.08 0.1 0.120

20

40

60

80

100

120

140

160

180

2001/2 cycle RMS

Figure 25 - Detail 2 of waveform for tests of swells according to 4.1.2

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87%Udin

Udin

50%Udin

95%Udin

Figure 26 - Sliding reference voltage test

Udin

Figure 27 - Sliding reference start up condition

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7.4.2 Check dips / interruptions in polyphase system




4.2.1.

M

Check that dips and

interruptions are properlydetected in a polyphasesystem, by applying a singletest with a 3 phase nonsynchronous disturbance thatcontains both a dip and aninterruption


least 15 s.

Dip threshold = 90%U din, hysteresis =2%

Udin

Interruption threshold= 10% U din, hysteresis

=2% U din


This test does not

require a synchronizedgenerator.



phase 1


phase 2


phase 3


phase 3


phase 2


phase 1

See Figure 11, Figure12 and Figure 13

- Check, for each

channel, that thesequence of Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 9.

- Check that thepolyphase dipduration is correctlyreported as 6,5cycles (within thetiming accuracydefined in IEC61000-4-30).

- Check that the

polyphaseinterruption durationis correctly reportedas 1,5 cycles (withinthe timing accuracydefined in IEC61000-4-30).

- Check that theremaining voltagefor the dipmeasurement iscorrectly reported as0% U din (within the

magnitude accuracydefined in IEC

61000-4-30).

Interruptionthreshold

Dipthreshold

DDIPduration

t2 t3

t4

t1

DINTduration

Phase1Phase2Phase3

Dipstarts

Interruptionstarts

Figure 28 – Detail 1 of waveform for test of polyphase dips/interruptions

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NOTE: the figure is not drawn t o scale


Urms(1/2)N

Urms(1/2)N+1

(start of dip)

Urms(1/2)N+2

Urms(1/2)N+3

Urms(1/2)N+4

Urms(1/2)N+5

Urms(1/2)N+6

(start of interrupt.)

Urms(1/2)N+7

Phase 1 100 70 0 0 0 0 0 0

Phase 2 100 100 100 70 0 0 0 0

Phase 3 100 100 100 100 100 70 0 0

Urms(1/2)N+8

Urms(1/2)N+9

(end of interrupt.)

Urms(1/2)N+10

Urms(1/2)N+11

Urms(1/2)N+12

Urms(1/2)N+13

Urms(1/2)N+14

(end of dip)

Urms(1/2)N+15

Phase 1 0 0 0 0 0 70 100 100

Phase 2 0 0 0 70 100 100 100 100

Phase 3 0 70 100 100 100 100 100 100


Phase 1

Phase 2

Phase 3

t1 t2 t3 t4

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7.4.3 Check swells in polyphase system




4.3.1.

M

Check that swells areproperly detected in apolyphase system, byapplying a single test with a3 phase non synchronousswell injection


least 15 s.

Swell threshold =110% U din, hysteresis

=2% Udin


This test does notrequire a synchronizedgenerator.



phase 1


phase 2

- At t1+2cycles(synchronized to zerocrossing on phase 3),inject 130% U din on

phase 3

- At t1+4cycles(synchronized to zerocrossings on phase 1and phase 3), inject100% U din on both

phase 1 and phase 3


phase 2

See Figure 14 and.Figure 15

- Check, for eachchannel, that thesequence of Urms(1/2) in theinstrument compliesto the sequencedefined in Figure 15

- Check that thepolyphase swellduration is correctlyreported as 6,5cycles (within thetiming accuracydefined in IEC61000-4-30).

- Check that the

polyphase swellamplitude iscorrectly reported as130% U din (within

the magnitudeaccuracy defined inIEC 61000-4-30).

swellthreshold

Swellamplitude

t1t3

DPOLYSWL=t3- t1

Phase1Phase2

Phase3

Swellstarts

Figure 31 – Detail 1 of waveform for test of polyphase swells

Urms(1/2)N

Urms(1/2)N+1

(start of

swell)

Urms(1/2)N+2

Urms(1/2)N+3

Urms(1/2)N+4

Urms(1/2)N+5

Urms(1/2)N+6

Urms(1/2)N+7

Phase 1 100 116 130 130 130 130 130 130

Phase 2 100 100 100 116 130 130 130 130

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Phase 3 100 100 100 100 100 116 130 130

Urms(1/2)N+8

Urms(1/2)N+9

Urms(1/2)N+10

Urms(1/2)N+11

Urms(1/2)N+12

Urms(1/2)N+13

Urms(1/2)N+14

(end of swell)

Urms(1/2)N+15

Phase 1 130 116 100 100 100 100 100 100

Phase 2 130 130 130 130 130 116 100 100

Phase 3 130 116 100 100 100 100 100 100

Figure 32 - Detail 2 of waveform for test of polyphase swells

7.5 Supply voltage unbalance

7.5.1 General

This test is identical to the Class A test, except on the accuracy performance requirement. Theassessment of u0 is optional.

Use a 3 channel AC power source that meets or exceeds the following stability ratings under the reference conditions defined in Table 11: voltage ±0,05%

7.5.2 Measurement method, measurement uncertainty and measuring range

N° Target of the test Testing conditions Complementary testconditions


5.1.1

S






--- check if u0 and u2 isbetween 0 % and0,3 %

5.1.2

S



Channel 1 (L1 to N) to

73% of U din




5.1.3

S







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5.1.4

S

Check accuracy of unbalancemeasurement with phasedisplacement with a 4 wiressystem.


Channel 1 (L1 to N) to100% of U din , 0°

Channel 2 (L2 to N) to90% of U din , -122°

Channel 3 (L3 to N) to100% of U din , +118°

--- check if u0 = 2,47%+/- 0,3%

and u2 = 4,52% +/-0,3%

7.5.3 Aggregation

Manufacturers shall provide the aggregated values for verification.

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7.6 Voltage harmonics

The manufacturer shall specify if the implementation of aggregation uses gapless or gapped 10/12 cycle data intervals.

- Gapless implementation will be tested with the test described in 6.1.1.

- Gapped implementation will be tested with the test described in 6.1.2.

The manufacturer shall specify if the implementation of 10/12 cycles data uses groups(Ug.h)or subgroups of harmonics (Usg.h).

- Subgroup implementation will be tested with the test described in 6.1.3.

- Group implementation will be tested with the test described in 6.1.4.






6.1.1.

Sameas U

If the manufacturer hasimplemented a gaplessmeasurement method:



6.1.2.

L

If the manufacturer has

implemented a gappedmeasurement method:

Check that at least one10/12-cycle value iscalculated every 50/60 cycles

Apply reference

conditions (including aconstant fundamentalcomponent), and addvarying voltageharmonic content asdescribed:

-Start at P2 for harmonics (10% on the3

rdharmonic)


-Ramp the harmoniccontent up by 1 %/s

until it reaches P2

-Repeat

Apply th is tes t signalfor a minimum of 10minutes (to ensure thatlarger gaps are notseen during 10-minuteaggregationcalculations).

S2 for Frequency

(50/60Hz)

Test the time tag,

the sequencenumber and thevoltage magnitude of the 10/12-cycleblocks for the 3

rd

harmonic.

Verify that:

-10/12-cycleintervals areconsistentlyprovided at aminimum rate of oneper secondthroughout the test

-The 10/12-cycleintervals show atleast 10 uniquevalues between 0%and 10% for everyramping period

-The sequence of 10/12-cycle intervalsshow values thatrepeat every 20seconds

6.1.3.

M

If the manufacturer hasimplemented harmonicsubgroup measurement(Usg,h):

Check that the 10/12-cyclemeasurements use theharmonic subgroupmeasurement (Usg.h) from

Apply referenceconditions, plus P1 for harmonics (verify basicsubgroup measurement)


ndharmonic

(2nd


Apply referenceconditions, plus P1 for interharmonics(eliminate incorrect


ndharmonic

(no significantcontent detected)

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IEC 61000-4-7 use of Ug,h)

Apply referenceconditions, plus S4 for interharmonics(eliminate incorrectuse of Ug)


ndharmonic

(2nd


6.1.4.

M

If the manufacturer hasimplemented harmonic groupmeasurement (Ug,h):

Check that the 10/12-cyclemeasurements use harmonicgroup measurement (Ug,h)from IEC 61000-4-7.

Apply referenceconditions, plus P1 for harmonics (verify basicgroup measurement)


ndharmonic

(2nd


Apply referenceconditions, plus S4 for interharmonics(eliminate incorrectuse of Ug or Usg,h)


ndharmonic

(2nd

harmonic ispresent atapproximately 7.2%)

6.1.5.

S


thorder

--- --- Verify that at least40 harmonics areprovided by thedevice

6.1.6.

S

If total harmonic distortion iscalculated, and if themanufacturer hasimplemented harmonicsubgroup measurement(Usg,h):

Check that it is the subgrouptotal harmonic distortion(THDS) from IEC 61000-4-7

Apply referenceconditions plus P5 for harmonics

--- TC150/180(unc)-thd(significant distortiondetected)

Apply referenceconditions plus P5 for interharmonics

--- TC150/180(unc)-thd(no significantdistortion detected)

6.1.7.

S

Check that a crest factor of at least 2 is supported by thedevice

Apply referenceconditions plus S1 for harmonics (crest factor of 2)

--- TC150/180(unc)-harm for all 40harmonics

6.1.8.

M

Check that a properly

designed anti-aliasing filter isused on the device, providing(in combination withoversampling) attenuation of all frequencies above the 50

th

harmonic exceeding 50 dB

a)Apply reference

conditions plus 10% of U din at 75,0 x the


--- TC150/180(unc)-

harm for all 50harmonics (noaliasing detected)







a)Only three mandatory anti-aliasing test points are defined here to simplify the minimum testing requirement.

However, depending on th e sampling rate and filter characteristics of the device under test, other spectral content

may be required to properly evaluate the operation of an anti-aliasing filter. The test lab applying this proceduremay additionally choose to apply a set of broad spectrum signals as a more exhaustive test of the anti-aliasing filter,using a network analyzer or other similar equipment.

7.6.1.1 Measurement uncertainty and measuring range





6.2.2

S

Check measuring uncertainty – s ing le even harmonic


--- TC150/180(unc)-harm for applicable

harmonics

6.2.3

S

Check measuring uncertainty – s ing le odd harmonic



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6.2.4

S

Check measuring uncertainty – s ing le high harmonic



6.2.5

S

Check measuring range –minimum harmonic

magnitudes


--- TC150/180(unc)-harm for applicable

harmonics6.2.6

S

Check measuring range –maximum harmonicmagnitudes








to Table 4


6.3.1

M


Reference conditionsplus P1 for harmonics(lowest harmonicorder)



Reference conditionsplus P3 for harmonics(highest harmonicorder)



6.3.2

M



S1 for voltagemagnitude (lowestvoltage)



S3 for voltagemagnitude (highestvoltage)




Not applicable.




minute ticks.




6.4.1.

L

Check aggregation overlap 1 Reference conditionsplus P2 for harmonics



Test the time tag,and the sequencenumber of blocks for the 3

rdharmonic.

Resynchronizationwith the 10 minute

tick is permitted butnot required.


59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10

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6.5.1.

L

If the manufacturer hasimplemented a gaplessmeasurement method:

Check gapless 150/180-cycleaggregation

Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying harmoniccontent as described:


-Ramp the harmoniccontent down by 1 %/s

until it reaches 0 %


-Repeat



rd

harmonic, withcorrect aggregationof all of the gapless10/12-cycle values.

Resynchronizationwith the 10 minutetick is permitted butnot required.

6.5.2.

L

If the manufacturer hasimplemented a gappedmeasurement method:

Check that a minimum of three 10/12-cycle values isused in each 150/180-cycleinterval

Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying harmoniccontent as described:




-Repeat



rd

harmonic, withcorrect aggregationof all of the reported10/12-cycle values(it is already provenin Test 6.1.2 that atleast three values

are reported every150/180-cycleinterval).

Resynchronizationwith the 10 minutetick is permitted butnot required.


50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180

7.6.3.3 10 min aggregation





6.6.1.

L

Check 10-min aggregation Maintain referenceconditions (including aconstant fundamentalcomponent), and addvarying harmoniccontent as described:

-Start at P2 for

harmonics




TC10-min(unc)-harmfor the 3

rdharmonic,

with correctaggregation of the10/12-cycle valuesbased on the blocksequence numbers

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-Repeat


59,99 Hz = (2999,5/600) x 12; 49,99 Hz = (2999,5/600) x 10



Complementarytest conditions


6.7.1.

S (justcheckdate isprovid

ed)


7.7 Voltage inter-harmonics

If the manufacturer implements interharmonics, then he shall specify the method and theaccuracy performance. The test will verify the availability of the data and its accuracyaccording to the manufacturer specification.


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7.8 Mains Signalling Voltages on the supply voltage





8.1.1

S

Verify that the user canspecify the carrier frequencyto monitor, according to themanufacturer specification.

--- --- Product allows theuser to configuremonitored carrier frequencies accordingto the manufacturer specification.



7.8.2.2 The test shall verify the accuracy of the measurement as specified by themanufacturer.Variations due to single influence quantities

Not applicable for Class S.

7.8.2.3 Measurement evaluation

Not applicable.

7.8.3 Aggregation

Not applicable.

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7.9 Measurement of underdeviation and overdeviation parameters

If the underdeviation and overdeviation are implemented in the instrument, then theClass A test requirements shall apply.


Tests for the measurement method are specified in the table below for 10/12-cycle values only(aggregation is specified in a later section).

IEC 61000-4-30 Ed. 2 describes the measurement method for Urms-under,i and Urms-over,ibased on the 10/12-cycle r.m.s. value Urms-200ms,i, where i denotes the specific 10/12-cycleinterval. However, the underdeviation (Uunder) and overdeviation (Uover) are only describedwithin the aggregation section. The table below assumes that Uunder and Uover may also becalculated for every 10/12-cycle interval, using the same formula from the aggregation sectionto aggregate a single 10/12-cycle value.

For the 10/12-cycle interval, a device shall make available at least one of Uunder and Urms-under, and at least one of Uover and Urms-over. All of the values that are made available shallcomply with the requirements stated below.





9.1.1

S


under , Uunder , Urms-over and Uover when Urms-200ms > U din



Urms-under = U din

Uunder = 0%

Urms-over = U rms-200ms

Uover = (Urms-over –U din) / U din [approx

50%]

9.1.2

S


under , Uunder , Urms-over and Uover when Urms-200ms = U din

Reference conditions(magnitude of supplyvoltage is U din +/- 1%)


Urms-under = U din or

Urms-200ms, whichever

is lower



0%]

Urms-over = U din or

Urms-200ms, whichever is higher

Uover = (Urms-over –U din ) / U din [approx

0%]

9.1.3

S

Steady-state test - check for

proper calculation of Urms-under, Uunder, Urms-over and Uover when Urms-200ms< Udin

P1 for magnitude of

supply voltage (voltageis 10% of Udin )

For every 10/12-

cycle value:

Urms-under = Urms-200ms (the

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magnitude of supplyvoltage)

Uunder = (Udin -

Urms-under) / Udin[approx 90%]

Urms-over = Udin

Uover = 0%

9.1.4

M

Non-steady-state test - checkthat all 10/12-cycle valuesare calculated without gaps

10/12-cycle valueswill repeat in groupsof four:

1. Uunder = 90%, Uover = 0%

2. Uunder between0%-90% and Uover =

0%, or Uunder = 0%and Uover between0%-50%

3. Uunder = 0% andUover = 50%


9.1.5

S

Verify number of valuesproduced

N/A On single-phasesystems, 1 value isprovided for each of Urms-under and Urms-

over .

On 3-phase 3-wiresystems, 3 valuesare provided for each of U rms-under andUrms-over .

On 3-phase 4-wiresystems, either 6values or 3 valuesare provided for each of U rms-under andUrms-over .


7.9.2.1 General

For underdeviation and overdeviation, the calculated values are dependent on the underlying10/12-cycle r.m.s. values, as specified for the magnitude of supply voltage. The relevant testsin 6.2.4.1 are considered necessary and sufficient to verify the measurement uncertainty and

measuring range, as described below.


Covered by 6.2.4.1.


P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

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Covered by 6.2.4.1.

It is sufficient to verify that the underlying 10/12-cycle calculations for magnitude of supply

voltage meet the relevant accuracy and range requirements.


Not applicable.


In IEC 61000-4-30 Ed. 2, equations (6) and (7) specify the aggregation method for underdeviation and overdeviation in a slightly different manner than for other parameters. Thefollowing tests are intended to verify that these aggregation methods are implemented properly.


Covered by 6.2.2

It is sufficient to verify that the underlying 10/12-cycle calculations for magnitude of supplyvoltage are properly synchronized at the 10-minute tick.





9.2.1

M

Verify proper aggregation of Uunder and Uover for the

150/180-cycle interval(according to equations 6and 7 from IEC 61000-4-30Ed. 2):

3.


Test shall last at least 10 seconds.

The 10/12-cycler.m.s. values will

repeat in groups of four, as per 9.1.3.


The 150/180-cyclevalues must beconsistent with thetheoretical valuesderived from the

10/12-cycle r.m.s.values, usingequations 6 and 7.

9.2.2

L

Verify that the 150/180-cycleaggregations for Uunder andUover are re-synchronized atthe 10-minute tick

Frequency = 50.125 Hz / 60.15 Hz (or both whenapplicable)



The final 150/180-cycle value in one10-minute intervaland the first (re-synchronized)

P1

P5

Vr.m.s

20/24

cycles

40/48

cycles

60/72

cycles

80/96

cycles

P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

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150/180-cycle valuein the next 10-minute interval shallboth be consistentwith the theoreticalvalues derived from

the 10/12-cycler.m.s. values, usingequations 6 and 7.


50,125 Hz = (200,5/600) x 150; 60,15 Hz = (200,5/600) x 180






9.3.1

L

Verify proper aggregation of Uunder and Uover for the 10-minute interval (according toequations 6 and 7 from IEC61000-4-30 Ed. 2):

4.




These 10/12-cycler.m.s. values shallbe recorded for theentire 10-minuteinterval, and lined upwith the associated10-minute values for Uunder and Uover.

The 10-minutevalues must be

consistent with thetheoretical valuesderived from the10/12-cycle r.m.s.values, usingequations 6 and 7.





9.4.1.

S


P1

P5

Vr.m.s

20/24cycles

40/48cycles

60/72cycles

80/96cycles

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7.10 Flagging

The tests requirements are identical to the Class A test requirements, for the applicableparameters.

N° Target of the test Testing points Test criterion (if test is applicable )

10.1.1

XL


For Plt flicker




- Flicker (2-hour Plt)

10.1.2L


a)




- Power frequency (10-second)

- Voltage magnitude (10/12-cycle, 150/180-

cycle, 10-minute)- Flicker (10-minute Pst)

- Supply voltage unbalance (10/12-cycle,150/180-cycle, 10-minute)

- Voltage harmonics (10/12-cycle, 150/180-cycle, 10-minute)

- Voltage interharmonics (10/12-cycle, 150/180-cycle, 10-minute)

- Mains signalling (10/12-cycle)

- Underdeviation and overdeviation (10/12-cycle, 150/180-cycle, 10-minute)”

10.1.3.

L

Flagging in polyphase systemcaused by voltage swell

a)

Swell: 120 % of U din,

2 channels, L1+L3,Duration: 100 ms

10.1.4.

L

Flagging in polyphase systemcaused by voltageinterruption

a)

Interruption: 0% of U din, 3 channels,

L1+L2+L3, Duration:100 ms

NOTE 1: the 100ms dip / swell / interruption must begin and end within the same 10/12-cycle interval, and withinthe same 10-second interval fo r frequency.

NOTE 2: the test should last 6 hours, because three 2-hours aggregation should be evaluated.

a)For instruments using the polyphase approach according to IEC 62586-1, the flag is applied to all measured

phases. For instruments using the channel by channel approach according to IEC62586-1, the flag is applied onlyto the phase(s) containing the dip / swell / interruption event.

NOTE: see explanation in the below figure

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RTC10-mintick

3

10-mininterval(x)

10/12cycles

1 2

150/180cycletimeinterval(n+1)

2hourinterval(y)

150/180cycles(n)

1/2cyclerms

10/12cycles

10/12

cycles

15

10/12

cycles

1

10/12

cycles

2

10/12

cycles

……..

dip/swell/interruption

1...1011...2

0

21...3

0141...150 1...10

11...2

0

voltagemagnitudesupplyvoltageunbalance

voltageharmonicsvoltageinterharmonicsmainssignalling

underdeviationandoverdeviation

Voltagemagnitude,supplyvoltageunbalance,voltageharmonics,voltageinterharmonics,underdeviationandoverdeviation,flickerPst

FlickerPlt

10-secinterval(z)

Frequency

2-hinterval(x)

Flaggeddata

1...1213...2

4

25...3

6169...180 1...12

13...2

4

1/2cyclerms

RTC10-stick

TestsignalLegend

Figure 33 - Flagging test for Class S

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7.11 Clock uncertainty testing

The test requirements are identical to the Class A test requirements, except for the maximum driftallowed.




11.1.1.

S

Check clock uncertainty 1) Verify that instrument is operating with clock synchronization (check

device status).2) Inject a fixed duration interruption with a synchronized signalgenerator (note start time of interruption T1start.

3) Verify the instrument has detected an interruption and note themeasured start time (reading) T1start_mes. Check the accuracy of T1start mes shall be T1start +/- 1 cycle.

4) Disconnect or disable the synchronization and leave the instrumentmeasuring for at least hours.

NOTE: during that time, the device is available to be used for test notrequiring synchronization.


6) Verify the instrument has detected an interruption and note themeasured start time (reading) T2start_mes

7) Verify the clock uncertainty :Modulus(T2start-T2start_mes) < (T2start-T1start)*5/(3600*24)

NOTE 1: the injected interruption 2) and 5) will have an a rbitrary duration (e.g. 1second)

NOTE 2: T1start_mes and T2start_mes have a resolution of +/ 20ms

Figure 34 - Clock uncertainty testing

Generator Interrupt

T1start

Instrument reading

T1start_mesInstrument reading T2start_mes

Generator Interrupt

T2start

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7.12 Variations due to external influence quantities

7.12.1 General

The test requirements are identical to the Class A test requirements.The variations shall only be checked for frequency measurement and for voltage measurement.

7.12.2 Frequency measurement


7.12.3 Influence of temperature




to Table 6


12.1.1.

XL

Check influence of lowtemperature

P1 for Frequencya)

ET1 TC10s(uie)

P2 for Frequencya)

ET1 TC10s(uie)

P3 for Frequencya)

ET1 TC10s(uie)





ET1 TC10s(uie)

12.1.2.

XL

Check influence of worstcase temperature

P1 for Frequencya)

ET2 TC10s(uie)

P2 for Frequencya)

ET2 TC10s(uie)

P3 for Frequencya)

ET2 TC10s(uie)





ET2 TC10s(uie)

12.1.3.

XL

Check influence of hightemperature

P1 for Frequencya)

ET3 TC10s(uie)

P2 for Frequencya)

ET3 TC10s(uie)

P3 for Frequencya)

ET3 TC10s(uie)

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ET3 TC10s(uie)



7.12.4 Influence of power supply voltage



to Table 6


12.2.1.S

Check influence of low power supply voltage P1 for Frequency

a)

EV1 TC10s(uie)

P2 for Frequencya)

EV1 TC10s(uie)

P3 for Frequencya)

EV1 TC10s(uie)




12.2.2.

S

Check influence of highpower supply voltage

P1 for Frequencya)

EV2 TC10s(uie)

P2 for Frequencya)

EV2 TC10s(uie)

P3 for Frequencya)

EV2 TC10s(uie)




8 Calculation of operating uncertainty

Measurement uncertainty and operating uncertainty are defined in Annex A.

Operating uncertainty of magnitude of supply voltage, and operating uncertainty of frequency shall becalculated taking into account uncertainty test results on:

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- intrinsic uncertainty

- variations due to influence quantities

Operating uncertainty for voltage magnitude and for frequency shall not exceed the limits given in Table 9.

Table 9 – Uncertainty requirements

Class Maximum operatinguncertainty for magnitude of supplyvoltage

Maximum operatinguncertainty for frequency @ 50Hz

e)

Maximum operatinguncertainty for frequency @ 60Hz

f)

A ± 0,3%a)

± 0,06%b)

± 0,05%b)

S ± 1,5%c)

± 0,3%d)

± 0,25%d)

a)For this calculation, intrinsic uncertainty will be defined as the worst uncertainty calculated in 6.2.2.1, variations

will be defined as the worst uncertainties calculated in each of the tests specified in 6.2.2.2.

b)For this calculation, intrinsic uncertainty will be defined as the worst uncertainty calculated in 6.1.3.1, variations


c)For this calculation, intrinsic uncertainty will be defined as the worst uncertainty calculated in 7.2.2.1, variations


d)For this calculation, intrinsic uncertainty will be defined as the worst uncertainty calculated in 7.1.3.1, variations


e)For products intended to work at 50 Hz

f)For products intended to work at 60 Hz

NOTE: Further explanations for operating uncertainty calculation is given in Annex B

.

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Annex A(normative)

Intrinsic uncertainty, operating uncertainty, and overall system uncertainty

A.1 General

Figure H.1 below gives the different kind of uncertainties.

Intrinsic uncertainty

(cf IEV and IEC 60 359)

Uncertainty

under

reference

conditions

Variationsduetoexternal

influencequantities(temperature,…)

Operatinguncertainty

ofexternalsensors+

impedanceofwires

Operating u ncertainty

(cf IEV and IEC 60 359)

Overall system u ncertainty

(cf IEC 6155 7-12)

Variationsdueto

powersystem

electricalparameters

(harmonics,…)

Measurement uncertainty

(cf IEC 610 00-4-30)

Figure H.1 - Different kind of uncertainties

A.2 Measurement uncertainty

This is the uncertainty as defined in IEC 61000-4-30.

NOTE For example, it can be t he influence of other po wer system parameters (e.g. influence of flicker) on voltage measurement.

A.3 Operating uncertainty

Operating uncertainty shall include intrinsic uncertainty (under reference conditions) ,the maximumvariation value due to single influence quantities and the maximum variation value due to externalinfluence quantities.

∑ ∑= =

+

×+=

N

i

M

i1 1

22 quantity)influenceexternaltodue(variationquantity)influencesingletodue(variation

15,1yuncertaintIntrinsicyuncertaintOperating

with N =

number of relevant single influence quantities and M = number of relevant external influence quantities

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A.4 Overall system uncertainty

Overall system uncertainty shall include operating uncertainty, uncertainty due to impedance of wires and

uncertainty due to sensors.

The formula given below is a simplified approach:

∑=

++×=

N

i 1

22 y)uncertaintwiringsertainty(sensoruncy)uncertaintoperating(PQI15,1yuncertaintsystemOverall wit

h N = number of kind of external sensors (voltage or current).

NOTE N = 1 when only a current (or voltage) sensor is used, N = 2 when a current sensor and a voltage sensor are used.

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Annex B(normative)

Calculation of operating uncertainty for magnitude of the power supply andfrequency

B.1 SELECTION OF TEST POINTS TO VERIFY OPERATING UNCERTAINTY ANDUNCERTAINTY UNDER REFERENCE CONDITIONS

For each relevant parameter the manufacturer shall identify the test points with the highest uncertaintyunder reference conditions and the test points for single influence quantities with the highest variationused for the calculation according to this Annex.

To check compliance with this standard it is sufficient that external Test houses verify this documentedtest points and the connected calculation.

Aggregations shal l be tested separately.

NOTE: in case of doubt the manufacturer should present the whole summary of type tests to the Test house

B.2 EXAMPLE

Parameter : Magnitude of Supply Voltage, Udin = 230V, 50/60Hz

Test voltage levels P1, P3, and P5 according to Table 1 of Part 2 under reference conditions.

• Select the highest intrinsic uncertainty e.g. measured at Testpoint P5 = 0,092V (0.04% of Udin)

• Use Udin for further determination of influences caused by frequency and Harmonics ( See )

• Test influence of frequency on Udin at Testpoints S1, S3, and S5 according 5.2.2.2 of Part 2 andselect the highest variation e.g measured at Testpoint S5 = 0,069 V (0,03% of Udin)

• Test influence of Harmonics on Udin at Testpoints S1 acc. 5.2.2.2 of Part 2 and use the variation for calculation = 0,046 V (0,02% of Udin)

• Test influence of temperature at Testpoints ET1, ET2 and ET3 according Table 4 of Part2 and use thevariation of ET2 for further calculation = 0,23 V( 0,1% of Udin)

• Test influence of Power supply at testpoints EV1 and EV2 acc. Table 5 of Part2, result no variation

Operating uncertainty = ± [ I 0,092 I + 1,15 x √ ( 0,069)2+ ( 0,046)

2+ (0,23)

2]

= ± 0,372 ( 0,16 % of Udin)

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Annex C(informative)

Further test on dips (amplitude & phase angles changes)

C.1 Phase to phase or phase to neutral testing

70 %

70 %

70 %

IEC 274/04

NOTE Phase-to-neutral testing on three-phase systems is performed one phase at a time.

Figure A.1 – Phase-to-neutral testing on three-phase systems

70 % 70 %

(A) (B)IEC 275/04

NOTE Phase-to-phase testing on three-phase phase systems is also performed one phase at a time.Both (A) and (B) show a 70 % dip. (A) is preferred, but (B) is also acceptable.

Figure A.2 – Phase-to-phase testing on three-phase systems

C.2 Test method

Objective:

To ensure the correct measurement of parameters by the instrument during faultconditions that may typically occur at installation sites e.g. radial feeders, wheremeasurement devices may be exposed to multiple reclosures.

Successful Outcomes:

- Instrument measures parameters in accordance with IEC 61000-4-30

- No. of events are correctly identified/counted

- Instrument maintains functionality throughout the test.

Test pattern:

Time(seconds)

Red Phase(%)

White Phase(%)

Blue Phase(%)

Dip Events InterruptionEvents

0 100 100 100

1 100 100 100

2 100 100 100

3 100 100 100

4 100 100 0 Start Dip 1

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Time(seconds)

Red Phase(%)

White Phase(%)

Blue Phase(%)

Dip Events InterruptionEvents

5 100 100 0 Dip 1

6 100 100 0 Dip 1

7 0 100 0 Dip 1

8 0 100 0 Dip 1

9 0 100 0 Dip 1

10 100 100 100 End Dip 1

11 100 0 100 Start Dip 2

12 100 0 100 Dip 2

13 100 0 100 Dip 2

14 0 0 100 Dip 2

15 0 0 100 Dip 2

16 0 0 100 Dip 2

17 100 100 100 End Dip 2

18 100 100 0 Start Dip 3

19 100 100 0 Dip 3

20 100 100 0 Dip 3

21 0 100 0 Dip 3

22 0 100 0 Dip 3

23 0 100 0 Dip 3

24 100 100 100 End Dip 3

25 100 0 100 Start Dip 4

26 100 0 100 Dip 4

27 100 0 100 Dip 4

28 0 0 100 Dip 4

29 0 0 100 Dip 4

30 0 0 100 Dip 4

31 100 100 100 End Dip 4

32 100 100 0 Start Dip 5

33 100 0 0 Dip 5

34 100 0 0 Dip 5

35 0 0 0 Dip 5 Start Int 1

36 0 0 0 Dip 5 Int 1

37 0 0 0 Dip 5 Int 1

38 100 0 100 Dip 5 End Int 1

39 100 100 100 End Dip 5

40 100 100 100

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Annex D(informative)

Further tests on dips (polyphase)

D.1 Test procedure

D.1.1 General

For the following test requirements, the testing method shall be the following:

a) Prerequisites:

The equipment under test should be properly calibrated (amplitude accuracy) and its clock shall beproperly synchronized.

The manufacturer shall provide the necessary companion tools to allow access to the dips/swells/interruption information required to perform the IEC 61000-4-30 test protocol.

The ‘DSI’ test requires to verify the time tags, duration and remaining voltage or depth (dips or interruptions) and/or amplitude (for swells), expressed as a percentage of U din or in primary voltage units

(for example V or kV).

b) Test protocol:

The ‘DSI’ test will be used for each of the declared U din declared by the manufacturer, and for each of the

mains frequencies supported.

c) General:

Injection 3 phase waveform with a steady state pre-fault and post-fault of minimum 30s at U din . Pre-fault

and post-fault sections will be ‘pure’ (nominally single-frequency) sine waves f(t) = U din sin(2PI freq t+Phi)

with a maximum distortion of 2%.

Phi will be chosen so that zero crossing occurs at a reference time tREF programmed in the injection test

equipment.

The fault will start at signal zero crossing (t REF) and will terminate at zero crossing, independently for each of the 3 phases. Therefore tREF_P2 for phase 2, will be delayed by120° compared to tREF.

The injected fault duration will last a integer number of cycles. The duration will be according to the testsRMS injections described below.

Example for on phase of a typical N cycle injection:

t INJ t INJ +NCYCLES

Figure B.1 -

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IEC 62586-2 – 95 – 85/394/CD

D.1.2 Phase voltage dips and interruptions

Dip/interruption accuracy (amplitude and timing) test :

- One test for each of the following remaining voltages REMV : 85, 60, 40, 15 % U din

- Thresholds will be set above the remaining voltage tested and hysteresis is 2% U din

- 3 phase synchronous waveforms, injection reference at t INJ according to the figure below:

Threshold + hysteresis

Threshold

DDIP = 6 Cycles

D1 = 4 Cycles

t1t3

REMV

Figure B.2 -

What parameter to check Name Expected result

Time tag for beginning of dip t1 t1 (absolute UTC time tag).+ 1cycle(see latest issue of time tagging the URMS1/2 window)

Time tag for end of dip: t3 t1+ 7 cycles (absolute UTC time tag).

Dip duration DDIP t3-t1 = 6 cycles

Remaining voltage REMV within accuracy defined in IEC 61000-4-30

NOTE: The number of cycles (4 , 6) are arbitrary values

D.1.3 Phase swells

Swell accuracy (amplitude and timing) test:

- Thresholds will be below the remaining voltage tested and hysteresis is 2% U din

- 3 phase synchronous waveforms, injection reference at t INJ according to the figure below:

Threshold-hysteresis

Threshold

DDIP=6Cycles

t1 t3

AMPL

Figure B.3 -

Expected results:

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IEC 62586-2 – 96 – 85/394/CD

What parameter to check

Name Expected result

Time tag for beginning of swell: t1

t1 tINJ (absolute UTC time tag).+ 1cycle(see latest issue of time tagging the URMS1/2 window)

Time tag for end of swell: t3 t3 tINJ + 7 cycles (absolute UTC time tag).

Swell duration: DSWL DSWL t3-t1 = 6 cycles

Swell amplitude AMPL within accuracy defined in IEC 61000-4-30

NOTE: The number of cycles (4 , 6) are arbitrary values

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IEC 62586-2 – 97 – 85/394/CD

Annex E(normative)

Gapless measurements of voltage amplitude and harmonics test

E.1 Purpose of the test

The purpose of this test is to check the exact duration of the 10/12 cycles basic time window and also thegapless and non overlapping implementation of the measurements.

E.2 Test set up

The test shall not be done over a 10min boundary to avoid an eventual overlap condition due to theaggregation algorithm.

The test shall be conducted with an U din value giving the best signal to noise ratio. The manufacturer shall

indicate what is the optimal U din value for this test.

The EUT shall provide every 10/12 cycles RMS value and harmonics value with timestamp with a historydepth of at least 100 values.

NOTE 1: the EUT could either provide a log file or output the data continuously on a communication port, or any other mean thatcan achieve the required history depth.

NOTE 2: for class S device, on ly RMS values are required, because harmonic measurements are allowed to be with gap.

NOTE 3: the test can be run separately for harmonics and voltage magnitude if the device is not able to produce 10/12 cyclesvalue at the same time for harmonics and voltage magnitude.

E.3 Voltage amplitude

E.3.1 Test signal

The following test signal shall be applied to the EUT:

( ) ( )( )mmm RMS t f At f V t s ϕ π ϕ π +++= 2cos12cos2)( 111

The following requirements apply to the test signal:

Value Accuracy

Fundamental frequency (f 1) 50Hz or 60Hz

50 x 10-6

Ampli tude of fundamental component (V1) U din 0,5%

Modulating frequency (f m) 2,3Hz 100 x 10-6

Modulating amplitude (Am) 0,1 1%

Phases (ϕ1 , ϕm ) N.R N.R

NOTE : N.R stands for “No Requirement”

E.3.2 Result evaluation

The 10/12 cycles RMS values build a sequence URMS(0)…URMS(99). From this sequence, the followingquantities shall be computed:

( ) 47,46,45,250

1)(99

0

2 == ∑=

N ek U N Ak

Nk j

RMS

π

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IEC 62586-2 – 98 – 85/394/CD

( )( ) ( )22

2

4745

46

A A

AQ RMS

+=

The following requirements shall be met:

- QRMS>20

- 4.5% < A(46)/V1 < 5.5%

- timestamp(U(99))-timestamp(U(0))=20s+/-6ms

E.4 Harmonics

E.4.1 Test signal

The following test signal shall be applied to the EUT:

( ) ( )( ) ( ) N N mmm H t Nf V t f At f V t s ϕ π ϕ π ϕ π +⋅++++= 1111 2cos22cos12cos2)(

The following requirements apply to the test signal:

Value Accuracy

Fundamental frequency (f 1) 50Hz or 60Hz

50 x 10-6

Ampli tude of fundamental component (V1) U din 0,5%

Modulating frequency (f m) 2,3Hz 100 x 10-6

Modulating amplitude (Am) 0,3 1%

Harmonic number (N) Any value N.R

Ampli tude of harmonic com ponent (VN) 0,1x U din 1%

Phases (ϕ1 , ϕm , ϕN ) N.R N.R

NOTE: N.R stands for “No Requirement”

E.4.2 Result evaluation

The 10/12 cycles harmonic values for harmonic number N build a sequence H(0)…H(99). From thissequence, the following quantities shall be computed:

( ) 47,46,45,250

1)(

99

0

2== ∑

=

N ek H N Bk

Nk j π

( )( ) ( )22

2

4745

46

B B

BQ H

+=

The following requirements shall be met:

- QH > 20

- 13,5 % < B(46)/VN < 16,5 %

- timestamp(H(100)) - timestamp(H(0)) = 20 s +/-6 ms

NOTE: see Annex F for explanation about the method

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IEC 62586-2 – 99 – 85/394/CD

Annex F(informative)

Gapless measurements of voltage amplitude and harmonics

Wrong designs detection of the gapless and non overlapping measurements of 10/12 cycles RMS valuesand harmonics is a difficult task when trying to detect small gaps or overlap, or filtering effects (for

example, using a sliding window longer than 10/12 cycles with an output every 10/12 cycles).

The following results are based on simulation, with the following simulation conditions:

- Sampling frequency: 10240Hz (first well suited frequency for harmonic analysis: 2048 pts for 200ms).

- Noise: Gaussian white noise @ 0.01x U din RMS. For steady state distortion free signal, this noise

level produces 200ms RMS value in the range U din +/-0.1% U din. This noise level simulates a

device just at the limit of the allowed intrinsic uncertainty

0 100 200 300 400 500 60099.9

99.92

99.94

99.96

99.98

100

100.02

100.04

100.06

100.08

200ms RMS value sample number

2 0 0 m s R M

S v a l u e ( % U d i n )

Figure D.1 - Simulated signal under noisy conditions

The signal used for checking gapless RMS voltage measurement is a fluctuating fundamental signal withfollowing settings:

- Sine modulation

- Fundamental amplitude : 100 % of U din

- +/-10 % modulation depth

- Modulating frequency : 2,3Hz

With the above settings, the 10/12 cycles RMS values give this kind of waveform, illustrated in Figure D.2:

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IEC 62586-2 – 100 – 85/394/CD

0 5 10 15 20 25 30 35 40 45 5092

94

96

98

100

102

104

106

108

T(s)

T o t a l R M S ( % U d i n )

Figure D.2 - Waveform for checking gapless RMS voltage measurement

The frequency of the fluctuation shall be exactly 2.3Hz. Using an FFT analysis, it is quite easy to detectgaps: the spectrum in Figure D.3 is obtained with a 100 pts rectangular analysis window:

0 0.5 1 1.5 2 2.5-40

-20

0

20

40

60

80

100

Frequency (Hz)

R e l a t i v e a m p l i t u d e ( d B )

Figure D.3 - 2.3 Hz Frequency fluctuation

If there is only a missing sample between two measurements, the spectral leakage effects become visibleas shown in the following figure : in blue, the spectrum with gapless measurement, in red, the spectrumwith just one missing sample (ca 100µs…) between measurements, see Figure D.4:

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IEC 62586-2 – 101 – 85/394/CD

0 0.5 1 1.5 2 2.5-40

-20

0

20

40

60

80

100

Frequency (Hz)

R e l a t i v e a m p l i t u d e ( d B )

Withonemissingsample

Gaplessmeasurement

Figure D.4 - Spectral leakage effects for a missing sample

As an indication for the gap (or overlap) between two measurements, we can use the following equation:

22

2

)1()1(

)(

++−=

n An A

n AQ

where n is the FFT bin corresponding to the modulating frequency and A(n) the corresponding amplitude(in our case, with an analysis window of 100 RMS values and a modulating frequency of 2.3Hz, n=46,

assuming the DC component as an index of 0).

Figure D.5 shows that this indicator has a very high value for exact gapless measurements anddecreases very quickly even with small gaps between consecutive measurements (negative missing

samples means overlap between consecutive measurements):

-100 -80 -60 -40 -20 0 20 40 60 80 1000

100

200

300

400

500

600

700

800

Missing samples

Q R M S

Figure D.5 - Illustration of QRMS for missing samples

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If we take a closer look to the range [-5,5], we can see that it is possible to detect even just one missingsample, see Figure D.6:

-5 -4 -3 -2 -1 0 1 2 3 4 50

100

200

300

400

500

600

700

800

Missing samples

Q R M S

Figure D.6 - Detection of a single missing sample

These results are valid for an ideal signal, i.e with 0% deviation on the fundamental frequency as well as

the modulating frequency and also with perfectly synchronized sampling. IEC 61000-4-7 tolerates adeviation of 300 x 10

-6of the synchronisation of the 10/12 cycles time window. Should an ideal signal be

assumed which is sampled with a sampling frequency error of -300 x 10-6

, the results are shown in FigureD.7:

-100 -80 -60 -40 -20 0 20 40 60 80 1000

20

40

60

80

100

120

Missing samples

Q R M S


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IEC 62586-2 – 103 – 85/394/CD

If we add +/-100 x 10-6

deviation on the modulating frequency, the results are shown in Figure D.8 andFigure D.9:

-100 -80 -60 -40 -20 0 20 40 60 80 1000

10

20

30

40

50

60

70

Missing samples

Q R M S


-100 -80 -60 -40 -20 0 20 40 60 80 1000

50

100

150

200

250

300

Missing samples

Q R M S


The value of QRMS with perfect design could be as low as 30. In order to keep some safety margin, wechose a limit value of 20 for QRMS. Under certain conditions, we may declare conform a device that hasa gap or overlap of 1 or 2 samples, but this risk is very low.

For harmonics, the same considerations apply. With the following settings:

- Fluctuating harmonic settings (example)

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IEC 62586-2 – 104 – 85/394/CD

- Sine modulation

- 5th

harmonic

- Harmonic amplitude: 10% of U din

- +/-30% modulation depth

- Modulating frequency: 2,3Hz

Figure D.10 shows the result with an ideal test signal and perfect sampling frequency synchronization:

-100 -80 -60 -40 -20 0 20 40 60 80 1000

50

100

150

200

250

300

350

400

Missing samples

Q H

Figure D.10 - QRMS with ideal test signal and perfect sampling frequency synchronization

Figure D.11 shows the result with 300 x 10-6


modulationfrequency error:

-100 -80 -60 -40 -20 0 20 40 60 80 1000

20

40

60

80

100

120

140

Missing samples

Q H

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IEC 62586-2 – 105 – 85/394/CD

Figure D.11 - QRMS with 300 x 10-6


modulation frequencyerror

The limit QH>20 is valid for the harmonic test.

This indicator is not enough to detect filtering effects: the following Figure D.12 shows the results

obtained with a 20/24 cycles sliding window with a value output every 10/12 cycles:

-100 -80 -60 -40 -20 0 20 40 60 80 1000

50

100

150

200

250

Missing samples

Q H ( 2 0

/ 2 4 c y c l e s w i n d o w )

Figure D.12 - QRMS with a 20/24 cycles sliding window with a output every 10/12 cycles

To detect this kind of wrong design, we need to add a test on the amplitude of the fluctuating component:in

Figure D.13, in blue, the correct implementation, in red, the wrong one.

-100 -80 -60 -40 -20 0 20 40 60 80 1000

5

10

15

Missing samples

B ( 4 6 ) / V N ( % )

Figure D.13 - Amplitude test for fluctating component

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This condition on the value of A(46) for 10/12 cycles RMS value and B(46) for harmonics is a good way todetect this kind of filtering effects.

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IEC 62586-2 – 107 – 85/394/CD

Annex G(informative)

Testing equipment requirements

For compliance testing, the testing equipment should support the range of 200% U din.

NOTE 1 - For pre-compliance testing, arbitrary waveform generator can be used to inject after the attenuator.

NOTE 2 - The stability and uncertainty of the source and reference meter should be carefully considered, and should be at least 5times the one of the measured parameter.

For some class A tests, the testing equipment needs a time synchronisation with a sufficiently accuratetime source.

NOTE 3 - An alternative solution would be to use a not synchronized testing equipment along with a synchronized referencemeter, at least twice more accurate than the equipment under test.

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Annex H(informative)

Example of test report

Certification Laboratory: YYY Laboratory Inc., City, CountryManufacturer: XXX Instruments Ltd., City, Country

Model Number(s): ZZZ-1Firmware version: x.xx

This Certificate applies:

- for values of U din between xxx V and xxx V, at xx Hz.

- For a rated range of operation [xx°C – xx °C]

- For a range of power supply xxV to xxV

The instrument designated above complies with IEC 62586-2

The following 61000-4-30 Edition 2 measurement methods have been tested:

Parameter Class A Class S Implemented

Comment

Aggregati on Yes Yes Yes

Power Frequency Yes Yes Yes

Magnitude of the Supply Voltage --- --- Yes

Flicker --- --- Yes

Supply voltage dips and Swells --- Yes Yes

Supply voltage interruptions Yes Yes Yes

Supply voltage unbalance --- --- Yes

Voltage Harmonics --- --- Yes

Voltage Inter-harmonics --- --- ---

Mains Signalling Voltage --- --- Yes

Under/over deviation Yes Yes Yes

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IEC 62586-2 – 109 – 85/394/CD

Annex I(informative)

Mixed influence quantities

I.1 Variations due to mixed influence quantities for frequency


Table J.1 -



to Table 5


1.4.1. Check influence of mixedpower system influencequantities

P1 for Frequencya)

M1 TC10s(uim)

M2 TC10s(uim)

M3 TC10s(uim)


P2 for Frequencya)

M1 TC10s(uim)

M2 TC10s(uim)

M3 TC10s(uim)


P3 for Frequencya)

M1 TC10s(uim)

M2 TC10s(uim)

M3 TC10s(uim)


P4 for Frequencya)

M1 TC10s(uim)

M2 TC10s(uim)

M3 TC10s(uim)


to work at 60 Hz shall use the figures provided in line “Frequency 60 Hz”. Instruments intended to work both at 50

Hz and 60 Hz shall use the figures provided both in line “Frequency 50 Hz” and in line “Frequency 60 Hz”.

I.2 Variations due to mixed influence quantities for magnitude of voltage


Table J.2 -



to Table 5


2.4.1. Check influence of mixedpower system influence

quantities

P1 for Voltage magn M1 TC10/12(uim)

M2 TC10/12(uim)

M3 TC10/12(uim)



M2 TC10/12(uim)

M3 TC10/12(uim)



M2 TC10/12(uim)

M3 TC10/12(uim)



M2 TC10/12(uim)

M3 TC10/12(uim)



M2 TC10/12(uim)

M3 TC10/12(uim)

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IEC 62586-2 – 110 – 85/394/CD

I.3 Variations due to mixed influence quantities for dips and swells


Table J.3 -



to Table 5



P1 for Dips /Interruptions / Swells

M1 TC(uim)

M2 TC(uim)

M3 TC(uim)



M1 TC(uim)

M2 TC(uim)

M3 TC(uim)



M1 TC(uim)

M2 TC(uim)

M3 TC(uim)



M1 TC(uim)

M2 TC(uim)

M3 TC(uim)



M1 TC(uim)

M2 TC(uim)

M3 TC(uim)

I.4 Variations due to mixed influence quantities for under and over deviations

Covered by clause 6.2.2

It is sufficient to verify that the underlying 10/12-cycle calculations for magnitude of supply voltage meetthe relevant accuracy and range requirements.

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