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Characterization of layered gallium telluride ( GaTe ). Omotayo O Olukoya (Chabot College) PI : Oscar Dubon Mentor : Jose Fonseca Vega Lawrence Berkeley National lab. 0.8 1.6 2.4 3.2 nm. adapted from D. V. Rybkovskiy et al. , PRB (2011). Layered semiconductors. - PowerPoint PPT Presentation
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2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 1
Characterization of layered gallium telluride (GaTe)
Omotayo O Olukoya (Chabot College)PI : Oscar Dubon
Mentor : Jose Fonseca VegaLawrence Berkeley National lab
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 2
Layered semiconductors• Complex structure• Manipulate band-gap.
GaTe (1.045 nm)
• Recent discovery
0.8 1.6 2.4 3.2 nm
adapted from D. V. Rybkovskiy et al., PRB (2011)
Mak, K.F., et al., Phys Rev Lett. 105, 136805 (2010).
GaSe
MoS2
Chalcogenide
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 3
GaTe
a. Monoclinic crystalline structure in bulk. parameter constant: a = 17.44 Å, b = 10.456 Å, c = 4.077
Å,ϒ = 104.4o
b. Goes from monoclinic to hexagonal in thin films
d. P - type
• What to look for?
c. Direct band gap of 1.69 eV at room temperature.
• What do we know?
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 4
Method
• 300 nm of thermally oxidized SiO2 on Si
was used.
• Ultra sonication
Isopropyl alcohol
Acetone
• Oxygen plasma
• Standard RCA cleansing method
Substrate treatment
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 5
Method cont. Scotch tape method was develop by Andre Geim
Optical microscopy
Mechanical exfoliation
Transfer
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 6
Method cont.Atomic Force microscopy (AFM)
• Tapping mode
AFM images
8 nm
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 7
Method cont.
Raman spectroscopyo A 15mW Ar ion laser (514.5 nm) was
used.
Photoluminescence spectroscopy (PL)o A 488 nm blue laser
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 8
Raman result• Raman spectra cont. a. New peaks between 140 & 280 of Raman shift
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU)
Raman’s result cont.
• Raman spectrab. Horizontal shift
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 10
PL result• Correlation between laser intensity and counts
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 11
PL result cont.• Correlation between thickness and count
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 12
Conclusion
GaTe exhibits some anisotropic features. It will take further research to know what
properties are actually isolated from bulk.Great chances of being able to cleave
down to a monolayer on SiO2 substrate.
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 13
Next step
• Cleave down to a monolayer
• Take more Raman• Take low
temperature PL• Devices and
application?
2012 Transfer-to-Excellence Research Experiences for Undergraduates Program (TTE REU) 14
Acknowledgment• Prof Oscar Dubon (PI)• Jose Fonseca Vega (mentor)• Dubon’s Group
– Alex Luce (PL)– Erick Ulin-Avila
• Dr. Sharnia Artis• Shuk H Chan• Center for Energy Efficient Electronics (E3S)• National Science Foundation (NSF)
Q & A ?