32
esign and Implementation of VLSI System (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 sources: Sedra/Prentice Hall, Saint/McGrawHill, Weste/Addison Wesle

Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

  • View
    228

  • Download
    0

Embed Size (px)

Citation preview

Page 1: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Design and Implementation of VLSI Systems(EN1600)lecture04

Sherief RedaDivision of Engineering, Brown University

Spring 2008

[sources: Sedra/Prentice Hall, Saint/McGrawHill, Weste/Addison Wesley]

Page 2: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Lecture 03: CMOS fabrication

http://www.appliedmaterials.com/HTMAC/animated.html

Page 3: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Fabricating one transistor

Oxidation(Field oxide)

Silicon substrate

Silicon dioxideSilicon dioxide

oxygen

PhotoresistDevelop

oxideoxide

PhotoresistCoating

photoresistphotoresist

Mask-WaferAlignment and Exposure

Mask

UV light

Exposed Photoresist

exposedphotoresistexposed

photoresist

GGS D

Active Regions

top nitridetop nitride

S DGG

silicon nitridesilicon nitride

NitrideDeposition

Contact holes

S DGG

ContactEtch

Ion Implantation

resis

t

resis

t

resis

t

resis

t

oxox D

G

Scanning ion beam

S

Metal Deposition and

Etch

drainS DGG

Metal contacts

PolysiliconDeposition

polysiliconpolysilicon

Silane gas

Dopant gas

Oxidation(Gate oxide)

gate oxidegate oxide

oxygen

PhotoresistRemove

oxideoxide

RF P

ower

RF P

ower

Ionized oxygen gas

OxideEtch

photoresistphotoresistoxideoxide

RF P

ower

RF P

ower

Ionized CF4 gas

PolysiliconMask and Etch

RF P

ower

RF P

ower

oxideoxideoxideoxide

Ionized CCl4 gas

poly

gat

e

poly

gat

e

RF P

ower

RF P

ower

Page 4: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Top view

n+

p

GateSource Drain

bulk Si

SiO2

Polysilicon

n+

SiO2

n

GateSource Drain

bulk Si

Polysilicon

p+ p+

Page 5: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Wafer preparation

Page 6: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Start with P substrate

Page 7: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Spin Resist Coating

Page 8: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

2. Expose N Well Mask

Page 9: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

3. Develop resist

Page 10: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

4. Implant N Well

Page 11: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

5. Remove Resist

Page 12: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Anneal wafer to diffuses N well (heal lattice) and grow new oxide layer

Page 13: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Remove oxide from anneal

Page 14: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Spin Resist

Page 15: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

2. Expose resist with active diffusion mask

Page 16: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

3. Develop resist

Page 17: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

4. Grow oxide on exposed surface

Page 18: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

5. Strip resist

Page 19: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Grown thin oxide over silicon surfaces

Page 20: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Deposit poly using Chemical Vapor Deposition (CVD)

Page 21: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

2. Spin resist 3. expose resist using the GATE mask 4. develop resist 5. etch poly

Page 22: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Remove thin oxide layer where exposed

Page 23: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Spin resist 2. expose with P implant mask 3. develop resist 4. implant P 5. strip resist

Page 24: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Spin resist 2. expose with N implant mask 3. develop resist 4. implant N 5. strip resist

Page 25: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Remove resist – anneal wafer – oxide etch

Page 26: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Grow oxide 1. spin resist 2. expose Contact mask 3. develop resist 4. etch contacts 5. strip resist

Page 27: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

1. Deposit metal L1 2. spin resist 3. expose metal L1 mask 4. develop resist 5. etch metal 6. strip resist

Page 28: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Rest of metal layers follow similarly

Page 29: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Printing masks

Page 30: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

The printerIlluminator optics

Beam line

Excimer laser (193 nm ArF )

Operator console

4:1 Reduction lens NA = 0.45 to 0.6

Wafer transport system

Reticle stage

Auto-alignment system

Wafer stage

Reticle library (SMIF pod interface)

Page 31: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Photolithography is used to print desired patterns on the wafer

UV light

Reticle field size20 mm 15mm,4 die per field

5:1 reduction lens

Wafer

Image exposure on wafer 1/5 of reticle field4 mm 3 mm,4 die per exposure

Serpentine stepping

pattern

The feature size directly depends on the wavelength of your lithographic system

masks

Page 32: Design and Implementation of VLSI Systems (EN1600) lecture04 Sherief Reda Division of Engineering, Brown University Spring 2008 [sources: Sedra/Prentice

Cross section of a 7-metal layer IC

Next time:How to print different gates?