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Slide 1W. Rhett Davis NC State University ECE 546 Fall 2012
ECE 546 - VLSI Systems Design
Lecture 16: SRAM
Fall 2012W. Rhett Davis
NC State University
with significant material from Rabaey, Chandrakasan, and Nikoli
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Slide 2W. Rhett Davis NC State University ECE 546 Fall 2012
Announcements
Re-grade Requests for Midterm due in 1 week
HW#7 Due Tuesday
Project Introduction Tuesday
Continue forming project groups
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Slide 3W. Rhett Davis NC State University ECE 546 Fall 2012
Todays Lecture
SRAM
Multi-Port SRAM
CAM
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Slide 4W. Rhett Davis NC State University ECE 546 Fall 2012
6-transistor CMOS SRAM Cell
WL
BL
VDD
M5M
6
M4
M1
M2
M3
BL
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Slide 5W. Rhett Davis NC State University ECE 546 Fall 2012
CMOS SRAM Analysis (Read)
Assume bit-lines precharged high, Q=1, Q=0 What could go wrong?
WL
BL
VDD
M 5
M 6
M 4
M1 V
DDVDD VDD
BL
Q = 1Q = 0
Cbit Cbit
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Slide 6W. Rhett Davis NC State University ECE 546 Fall 2012
Read Upset Problem
Modified equations
(12.2) and (12.3)(by Harun Demircioglu)
What are the operating
regions assumed by
these equations? Is this valid for our
technology?
WL
BL
VDD
M5M6
M4
M1 VDDVDD VDD
BL
Q= 1Q= 0
Cbit Cbit
55
11
LW
LWCR
22
2
01,
2
05,
VVVBVVk
VVVVBVVVk nnTDDMn
DSATnDSATnDDnnTDDMn
CRB
VVCRCRVVVCRVBVn
nTDDDSATnnTDDDSATnn
21211
2
0
22
0
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Slide 7W. Rhett Davis NC State University ECE 546 Fall 2012
CMOS SRAM Analysis (Read)
For which side of this curve does the SRAM work properly?
0
0
0.2
0.4
0.6
0.8
1
1.2
0.5 1 1.2 1.5 2
Cell Ratio (CR)
2.5 3
Volta
geRise(V)
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Slide 8W. Rhett Davis NC State University ECE 546 Fall 2012
Read Static Noise Margin (SNM)
A more robust definition is the maximum noise voltageneeded to flip the value during a read For simplicity on HW and Exams, we wont use this definition
At low supply voltages, Read SNM is too often negative,due to Vt variation between transistors
As a result, supply voltages have not scaled below 1V inadvanced technologies
Source:
Calhoun &
Chandrakasan,
JSSC 2007
V from slide 6
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Slide 9W. Rhett Davis NC State University ECE 546 Fall 2012
CMOS SRAM Analysis (Write)
Assume cell contains 1, try to write 0 What needs to happen for a successful write?
BL = 1 BL = 0
Q = 0
Q = 1
M1
M4
M5
M6
VDD
VDD
WL
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Slide 10W. Rhett Davis NC State University ECE 546 Fall 2012
Conditions for Successful Write
Modified equations(12.5) and (12.6)(by Harun Demircioglu)
What are the operating
regions assumed bythese equations?
Is this valid for ourtechnology?
BL= 1 BL= 0
Q= 0Q= 1
M1
M4
M5M6
VDD
VDD
WL
66
44
LW
LWPR
22
2
04,
2
06,
DSATp
DSATpDDQppTDDMp
Q
QQnnTDDMn
VVVVBVVk
VVVBVVk
n
DSATp
DSATppTDDp
n
p
DSATppnTDDDSATppnTDD
QB
VVVVBPRVBVVVBVV
V21
212
2
0
2
00
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Slide 11W. Rhett Davis NC State University ECE 546 Fall 2012
CMOS SRAM Analysis (Write)
For which side of this curve does the SRAM work properly?
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Slide 12W. Rhett Davis NC State University ECE 546 Fall 2012
6T-SRAM LayoutVDD
GND
WL
BLBL
M1 M3
M4M2
M5 M6
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Slide 13W. Rhett Davis NC State University ECE 546 Fall 2012
Another Bit-Cell Layout
This bit-cell was createdby Xi Chen, Ting Zhu,and Harun Demircioglufor the Fall 2007 project
Best performance inclass
See their report on lastyears web-page group 35
see Project Results
Will this bit-cell still work,now that we havelithographic simulations?
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Slide 14W. Rhett Davis NC State University ECE 546 Fall 2012
Summary
In an SRAM
Size NMOS larger than pass-gate to avoid read-upset
Size PMOS small for successful write
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Slide 15W. Rhett Davis NC State University ECE 546 Fall 2012
Todays Lecture
SRAM
Multi-Port SRAM
CAM
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Slide 16W. Rhett Davis NC State University ECE 546 Fall 2012
Extending the SRAM Cell
This bit-cell supports
a read or write to one
location in the array
How would we
change it if we
wanted to read orwrite to two
locations?
WL
BL BL
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Slide 17W. Rhett Davis NC State University ECE 546 Fall 2012
2-Port SRAM Cell
This bit-cell supports
reads and/or writes to
two locations in thearray
How could we
optimize the cell if thesecond port were
read-only?
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Slide 18W. Rhett Davis NC State University ECE 546 Fall 2012
Read/Write + Read SRAM Cell (1)
What is the
advantage
of this cell?
What is the
disadvantage
of this cell?
R/WWL
R/WBL RBL
RWL
R/WBL
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Slide 19W. Rhett Davis NC State University ECE 546 Fall 2012
Read/Write + Read SRAM Cell (2)
What is the
advantage
of this cell?
What is the
disadvantage
of this cell?
R/WWL
R/WBL RBL
RWL
R/WBL
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Slide 20W. Rhett Davis NC State University ECE 546 Fall 2012
Another Approach to Multi-Ports
Use two separate single-port arrays and re-direct logic to send requests to each
When is this advantageous?
RowD
ecoder
Bit line2L2 K
Word line
K
K1 1
L2 1
A0
M.2K
AK2 1
Sense amplifiers / Drivers
Column decoder
Input-Output(M bits)
Storage cell
RowD
ecoder
Bit line2L2 K
Word line
K
K1 1
L2 1
A0
M.2K
AK2 1
Sense amplifiers / Drivers
Column decoder
Input-Output(M bits)
Storage cell
Re-direct logic
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Slide 21W. Rhett Davis NC State University ECE 546 Fall 2012
Todays Lecture
SRAM
Multi-Port SRAM
CAM
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Slide 22W. Rhett Davis NC State University ECE 546 Fall 2012
Content-Addressable Memory (CAM)
Primary function is to look up the address of
stored data, rather than the data itself
Most often used in Internet Protocol Routers to
classify & forward packets
Similar to SRAM, but has 4 types of wires in the
array
Bit-line (BL) and Word-line (WL), used to write data
into the array
Search-Line (SL), used to drive the searched value
Match-line (ML), used to indicate a match
Ternary CAM (TCAM) also stores "don't care"
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Slide 23W. Rhett Davis NC State University ECE 546 Fall 2012
High-Level CAM Architecture
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Slide 24W. Rhett Davis NC State University ECE 546 Fall 2012
CAM Bit-Cells
Source: Pagiamtzis & Sheikholeslami, JSSC '06
NOTE: Bit-lines and access transistors removed