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    Slide 1W. Rhett Davis NC State University ECE 546 Fall 2012

    ECE 546 - VLSI Systems Design

    Lecture 16: SRAM

    Fall 2012W. Rhett Davis

    NC State University

    with significant material from Rabaey, Chandrakasan, and Nikoli

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    Slide 2W. Rhett Davis NC State University ECE 546 Fall 2012

    Announcements

    Re-grade Requests for Midterm due in 1 week

    HW#7 Due Tuesday

    Project Introduction Tuesday

    Continue forming project groups

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    Slide 3W. Rhett Davis NC State University ECE 546 Fall 2012

    Todays Lecture

    SRAM

    Multi-Port SRAM

    CAM

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    Slide 4W. Rhett Davis NC State University ECE 546 Fall 2012

    6-transistor CMOS SRAM Cell

    WL

    BL

    VDD

    M5M

    6

    M4

    M1

    M2

    M3

    BL

    QQ

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    Slide 5W. Rhett Davis NC State University ECE 546 Fall 2012

    CMOS SRAM Analysis (Read)

    Assume bit-lines precharged high, Q=1, Q=0 What could go wrong?

    WL

    BL

    VDD

    M 5

    M 6

    M 4

    M1 V

    DDVDD VDD

    BL

    Q = 1Q = 0

    Cbit Cbit

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    Slide 6W. Rhett Davis NC State University ECE 546 Fall 2012

    Read Upset Problem

    Modified equations

    (12.2) and (12.3)(by Harun Demircioglu)

    What are the operating

    regions assumed by

    these equations? Is this valid for our

    technology?

    WL

    BL

    VDD

    M5M6

    M4

    M1 VDDVDD VDD

    BL

    Q= 1Q= 0

    Cbit Cbit

    55

    11

    LW

    LWCR

    22

    2

    01,

    2

    05,

    VVVBVVk

    VVVVBVVVk nnTDDMn

    DSATnDSATnDDnnTDDMn

    CRB

    VVCRCRVVVCRVBVn

    nTDDDSATnnTDDDSATnn

    21211

    2

    0

    22

    0

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    Slide 7W. Rhett Davis NC State University ECE 546 Fall 2012

    CMOS SRAM Analysis (Read)

    For which side of this curve does the SRAM work properly?

    0

    0

    0.2

    0.4

    0.6

    0.8

    1

    1.2

    0.5 1 1.2 1.5 2

    Cell Ratio (CR)

    2.5 3

    Volta

    geRise(V)

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    Slide 8W. Rhett Davis NC State University ECE 546 Fall 2012

    Read Static Noise Margin (SNM)

    A more robust definition is the maximum noise voltageneeded to flip the value during a read For simplicity on HW and Exams, we wont use this definition

    At low supply voltages, Read SNM is too often negative,due to Vt variation between transistors

    As a result, supply voltages have not scaled below 1V inadvanced technologies

    Source:

    Calhoun &

    Chandrakasan,

    JSSC 2007

    V from slide 6

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    Slide 9W. Rhett Davis NC State University ECE 546 Fall 2012

    CMOS SRAM Analysis (Write)

    Assume cell contains 1, try to write 0 What needs to happen for a successful write?

    BL = 1 BL = 0

    Q = 0

    Q = 1

    M1

    M4

    M5

    M6

    VDD

    VDD

    WL

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    Slide 10W. Rhett Davis NC State University ECE 546 Fall 2012

    Conditions for Successful Write

    Modified equations(12.5) and (12.6)(by Harun Demircioglu)

    What are the operating

    regions assumed bythese equations?

    Is this valid for ourtechnology?

    BL= 1 BL= 0

    Q= 0Q= 1

    M1

    M4

    M5M6

    VDD

    VDD

    WL

    66

    44

    LW

    LWPR

    22

    2

    04,

    2

    06,

    DSATp

    DSATpDDQppTDDMp

    Q

    QQnnTDDMn

    VVVVBVVk

    VVVBVVk

    n

    DSATp

    DSATppTDDp

    n

    p

    DSATppnTDDDSATppnTDD

    QB

    VVVVBPRVBVVVBVV

    V21

    212

    2

    0

    2

    00

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    Slide 11W. Rhett Davis NC State University ECE 546 Fall 2012

    CMOS SRAM Analysis (Write)

    For which side of this curve does the SRAM work properly?

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    Slide 12W. Rhett Davis NC State University ECE 546 Fall 2012

    6T-SRAM LayoutVDD

    GND

    QQ

    WL

    BLBL

    M1 M3

    M4M2

    M5 M6

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    Slide 13W. Rhett Davis NC State University ECE 546 Fall 2012

    Another Bit-Cell Layout

    This bit-cell was createdby Xi Chen, Ting Zhu,and Harun Demircioglufor the Fall 2007 project

    Best performance inclass

    See their report on lastyears web-page group 35

    see Project Results

    Will this bit-cell still work,now that we havelithographic simulations?

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    Slide 14W. Rhett Davis NC State University ECE 546 Fall 2012

    Summary

    In an SRAM

    Size NMOS larger than pass-gate to avoid read-upset

    Size PMOS small for successful write

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    Slide 15W. Rhett Davis NC State University ECE 546 Fall 2012

    Todays Lecture

    SRAM

    Multi-Port SRAM

    CAM

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    Slide 16W. Rhett Davis NC State University ECE 546 Fall 2012

    Extending the SRAM Cell

    This bit-cell supports

    a read or write to one

    location in the array

    How would we

    change it if we

    wanted to read orwrite to two

    locations?

    WL

    BL BL

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    Slide 17W. Rhett Davis NC State University ECE 546 Fall 2012

    2-Port SRAM Cell

    This bit-cell supports

    reads and/or writes to

    two locations in thearray

    How could we

    optimize the cell if thesecond port were

    read-only?

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    Slide 18W. Rhett Davis NC State University ECE 546 Fall 2012

    Read/Write + Read SRAM Cell (1)

    What is the

    advantage

    of this cell?

    What is the

    disadvantage

    of this cell?

    R/WWL

    R/WBL RBL

    RWL

    R/WBL

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    Slide 19W. Rhett Davis NC State University ECE 546 Fall 2012

    Read/Write + Read SRAM Cell (2)

    What is the

    advantage

    of this cell?

    What is the

    disadvantage

    of this cell?

    R/WWL

    R/WBL RBL

    RWL

    R/WBL

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    Slide 20W. Rhett Davis NC State University ECE 546 Fall 2012

    Another Approach to Multi-Ports

    Use two separate single-port arrays and re-direct logic to send requests to each

    When is this advantageous?

    RowD

    ecoder

    Bit line2L2 K

    Word line

    K

    K1 1

    L2 1

    A0

    M.2K

    AK2 1

    Sense amplifiers / Drivers

    Column decoder

    Input-Output(M bits)

    Storage cell

    RowD

    ecoder

    Bit line2L2 K

    Word line

    K

    K1 1

    L2 1

    A0

    M.2K

    AK2 1

    Sense amplifiers / Drivers

    Column decoder

    Input-Output(M bits)

    Storage cell

    Re-direct logic

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    Slide 21W. Rhett Davis NC State University ECE 546 Fall 2012

    Todays Lecture

    SRAM

    Multi-Port SRAM

    CAM

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    Slide 22W. Rhett Davis NC State University ECE 546 Fall 2012

    Content-Addressable Memory (CAM)

    Primary function is to look up the address of

    stored data, rather than the data itself

    Most often used in Internet Protocol Routers to

    classify & forward packets

    Similar to SRAM, but has 4 types of wires in the

    array

    Bit-line (BL) and Word-line (WL), used to write data

    into the array

    Search-Line (SL), used to drive the searched value

    Match-line (ML), used to indicate a match

    Ternary CAM (TCAM) also stores "don't care"

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    Slide 23W. Rhett Davis NC State University ECE 546 Fall 2012

    High-Level CAM Architecture

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    Slide 24W. Rhett Davis NC State University ECE 546 Fall 2012

    CAM Bit-Cells

    Source: Pagiamtzis & Sheikholeslami, JSSC '06

    NOTE: Bit-lines and access transistors removed