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HIGH VOLTAGE TESTING
GENERATION AND MEASUREMENTS
1. INTRODUCTION
why high voltage test ?
2. HIGH VOLTAGE GENERATION
a) Generation of direct high voltages
b) Generation of alternating high voltages
c) Generation of impulse voltages
3. HIGH VOLTAGE MEASUREMENTS
a) Measurement of direct voltages
b) Measurement of alternating voltages
c) Measurement of impuls voltages
4. GENERATION OF HIGH IMPULSE CURRENTS
5. MEASUREMENT OF IMPULS CURRENTS
a) Rogo wski coil method
b) Current shunt method
Difinition : high voltage = voltage > 1 kV
Aims of HV test
i) Test HV equipment used in power systems
Non-destructive test (NTD) consist of
• Type tests • Routine tests
• Monitoring tests
Used to measure
• Loss angle • Partial disharge level
• Withstand level
ii) Study of overvoltage effects on equipment
External overvoltages (lightNing)
System overvoltages (switching, temporary)
1. INTRODUCION
HIGH VOLTAGE TESTS RELATED
STANDARDS AND ORGANISATION
IEC : International Electrotechnical Committee
BSI : British Standard Institution
i) IEC 60 (Part I and Part II) = BS 923 : high voltage testing techniques
ii) IEC 71 (Part I and Part II) = BS 5622 : insulation Co-ordination
iii) IEC 52 = BS 358 : Method for the measurement of voltage with sphere
gaps.
iv) Other bodies
CIGRE : Conférence International des Grands Réseaux Electriques
ISH : International Symposium on High Voltages Engineering
2. HIGH VOLTAGE GENERATION
a) Generation Of High Direct Voltage
Existing methods
• Rectifier circuits
• Multiplier rectifier circuits
• Cascaded transformer/rectifier circuits
• Special circuits; Engetron, Deltatron
• Electrostatic generators
V
iL (t)
RL (load)
(a)
C
c
DV~(t)
i (t)
a
b
h.t
transformer
i(t)
V(t)
V min
V max
t
V~ (t)
(b)
T = 1/f
I) Rectifier Circuits : Background definition
i) Ripple δδδδV :
which gives
To reduce ripple
1. Increase size of smoothing capacitor
2. Increase frequency
3. Increase number of phases (if possible)
ii) Amlitude V
iii) Ripple Factor
iv) Ripple Factor
Ripple factor ≤≤≤≤ 3 %
Regulation
Change / variation of voltage
1 minute tests →→→→ ≤≤≤≤ 1%
More than 1 minute tests →→→→ ≤≤≤≤ ±±±± 1%
Voltage doubler circuit
Greinacher doubler circuit = (Villard doubler + rectifier/smoothing) circuit
Loaded multipliers
If unloaded the diodes do not conduct and the ripple is
Because of charge transfer, the capacitors Ci are charged to a voltage
equal (Vci - ∆Vi)
The total voltage drop is then,
2 V
2 V
2 V1
1
1
1
2
2
2
8 V
4-stage cascade rectifier
Voltages at nodes ‘1’ are oscillating
Voltages at nodes ‘1’ are constant 9dc)
HV out is 2* 4* Vmax
2nVmax
(no load)
Vo (t) with load
Vo max
+ Vmax
t2t1
T = 1/f
V (t)t
0
∆Vo
2 δ V
Loaded cascade circuit, definitions of voltage drop ∆ Vo and ripple δV
GENERATION OF ALTERNATING
VOLTAGE
i) Test transformer ii) Casaded transformer iii) Resonant circuit
I. Test Transformer
Simple design ; usually, one side is earthed
IEC Standard Specifikations
� f = 45 – 65 Hz
� Shape :
�V (1 minute test) ≤ 1%
� Transformer ratings
* dry tests: current rating of ≥ 100mA
* wet tests: current rating of ≥ 500mA
* pollution tests: current rating ≅ 15 A
3
3 V
3
3
3P 2
2P 2P
22V
2
1
1
1
P
P
PP
I = P/V
V
Transf. I
Transf. II
Transf. III
Cascaded transformers
- Power is shared by the three units
- Voltage stress is reduced (shared along the cascade)
Basic circuit of cascaded transformers. (1) Primary widings. (2) Seconddary
h.t. widings. (3) Tertiary exciting windings.
Series Resonant Circuits
For testing large capacitive loads (cable and GIS) and inductive loads
(HV reactors)
~
R L
V1 V
2
For an RLC series circuit the resonant frequency is
The output voltage acros the test object is
At resonance, Zc = Zl
In practice Zc >> R
Which gives V2 >> V1 (20 to 50 times)
Advantages
• Better waveshape (fundamental times 50)
• Better
rkVA output
• Voltage callapse after flashover (no damage to equipment)
• Easily cascaded, lighter than transformers.
Resonant Circuits
a) Previous designs (no reactors)
~ CVi f
~ CVi f
b) Modern designs
GENERATION OF IMPULSE VOLTAGE
Why impulse voltage
To study the effect of transient overvoltages generated by lightning
or swiching operations on the system
I. Standard Definition of Lightning Surges
T1 front time 1.2 µs
T2 time to half-value 50 µs
Surge defined T1/T2 = 1.2 /50 µs
Tolerances : (IEC60, BS923)
peak value ± 3%
front time ± 30%
time to half-value ± 20%
II. Standard Definition of Switching Surges
Tp time to peak (also known as T1) 250 µs
T2 time to half-value 2500 µs
TD time above 90% is sometimes specified
Surge defined as T1 /T2 = 250/2500 µs
Tolerances : (IEC60, BS923)
peak value ± 3%
front time ± 20%
Time to half-value ±60%
C2
R2
C1
G R1
Vo
Vout(t)
Analysis of impulse generators
With β>>α
Parameters of V out (t)
-Time to peak
- Time to half peak value