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The top documents tagged [ieee tns]
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Radiation Effects Challenges in 90nm Commercial-Density SRAMs
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SEE Mitigation Strategies for Digital Circuit Design Applicable to ASIC and FPGAs Prof. Fernanda Lima Kastensmidt, Ph.D. Instituto de Informatica Universidade
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FEE2006 Perugia
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Effects of Switched-Bias Annealing on Charge Trapping in HfO 2 high- Gate Dielectrics
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G.Poggi – EURORIB08 – June 2008 FAZIA Collaboration: recent advances and perspectives R&D Phase I of FAZIA and optimizing Z and A identification by means
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