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sabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007 Offset and angle Offset and angle studies studies with Guinea-Pig with Guinea-Pig Isabell-Alissandra Melzer-Pellmann Isabell-Alissandra Melzer-Pellmann Linear Collider Workshop Linear Collider Workshop ILC 2007 ILC 2007 May 30 May 30 th th -June 3 -June 3 rd rd , 2007 , 2007

Offset and angle studies with Guinea-Pig  

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Offset and angle studies with Guinea-Pig  . Isabell-Alissandra Melzer-Pellmann Linear Collider Workshop ILC 2007 May 30 th -June 3 rd , 2007. Offset and angle scan from TESLA TDR. Luminosity drops fast with small change of offset and/or angle. Results from beam-beam simulation with - PowerPoint PPT Presentation

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Page 1: Offset and angle studies  with Guinea-Pig  

Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset and angle studies Offset and angle studies with Guinea-Pig   with Guinea-Pig  

Isabell-Alissandra Melzer-PellmannIsabell-Alissandra Melzer-Pellmann

Linear Collider WorkshopLinear Collider Workshop

ILC 2007ILC 2007

May 30May 30thth-June 3-June 3rdrd, 2007, 2007

Page 2: Offset and angle studies  with Guinea-Pig  

2Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset and angle scanfrom TESLA TDR

Luminosity drops fast with small change of offset and/or angle

TESLA parameters: y = 5nm , y = 12 rad

How is the luminosity change for the ILC parameters?

Results frombeam-beamsimulation with GUINEA-PIGfrom TESLA TDR

Page 3: Offset and angle studies  with Guinea-Pig  

3Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan with ILC parameter set from 2005

ILC parameters: ILC 500 NOM: y = 5.7nmILC 500 LOW Q: y = 3.5nmILC 500 LARGE Y:y = 8.1nmILC 500 LOW P: y = 3.8nmILC 500 HIGH L: y = 3.5nm

ILC 1000 NOM: y = 3.5nmILC 1000 LOW Q: y = 2.5nmILC 1000 LARGE Y:y = 7.0nmILC 1000 LOW P: y = 2.7nmILC 1000 HIGH L: y = 2.5nm

Loss of luminosity falls not so steep,for y/y=±1 O(30%) (TESLA: for y/y=±1 O(40%))

Page 4: Offset and angle studies  with Guinea-Pig  

4Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan with ILC parameters

Line for no beam-beam interaction added:L/Lnom=exp(1/4 ·(y/y)2)

Loss of luminosity falls not so steep,for y/y=±1 O(25%) (TESLA: for y/y=±1 O(40%))

Page 5: Offset and angle studies  with Guinea-Pig  

5Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Angle scan with ILC parameters

ILC parameters: ILC 500 NOM: y = 14.3radILC 500 LOW Q: y = 17.5radILC 500 LARGE Y:y = 20.2radILC 500 LOW P: y = 18.9radILC 500 HIGH L: y = 17.5rad

ILC 1000 NOM: y = 11.7radILC 1000 LOW Q: y = 12.4radILC 1000 LARGE Y:y = 11.7radILC 1000 LOW P: y = 13.4radILC 1000 HIGH L: y = 12.4rad

Page 6: Offset and angle studies  with Guinea-Pig  

6Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Angle scan with ILC parameters

ILC parameters: ILC 500 NOM: y = 14.3radILC 500 LOW Q: y = 17.5radILC 500 LARGE Y:y = 20.2radILC 500 LOW P: y = 18.9radILC 500 HIGH L: y = 17.5rad

ILC 1000 NOM: y = 11.7radILC 1000 LOW Q: y = 12.4radILC 1000 LARGE Y:y = 11.7radILC 1000 LOW P: y = 13.4radILC 1000 HIGH L: y = 12.4rad

Only 10% loss for LOW Q option, largest loss of 40% for LARGE Y option!

Page 7: Offset and angle studies  with Guinea-Pig  

7Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Next step: include ‘banana effect’

Banana effect: internal bunch deformations, induced by single-bunch wakefields in the linac.

TESLA TDR: single bunch correlated emittance growth expected to be 6% in average.

Results frombeam-beamsimulation with GUINEA-PIGfrom TESLA TDR

Page 8: Offset and angle studies  with Guinea-Pig  

8Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Next step: include ‘banana effect’

For these plots a ‘banana shape’ beam needs to be feeded into Guinea-Pig• Simulated ‘banana’ from MERLIN not yet available.• Idea: just generate beam with ILC parameters and change it linearly by average of 6% (number from TESLA TDR)

y/m

z/m

y/m

z/m

Examples: Beam for ILC-NOM-500 Beam for ILC-NOM-500 with 100% correlated emittance growth (to make the effect visible)

0 @ 1z

100% off @ 1Y

Page 9: Offset and angle studies  with Guinea-Pig  

9Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 10: Offset and angle studies  with Guinea-Pig  

10Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 11: Offset and angle studies  with Guinea-Pig  

11Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 12: Offset and angle studies  with Guinea-Pig  

12Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 13: Offset and angle studies  with Guinea-Pig  

13Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 14: Offset and angle studies  with Guinea-Pig  

14Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

value

Page 15: Offset and angle studies  with Guinea-Pig  

15Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Conclusion

• Offset scan has similar effect for all parameter sets• Angle scan has smallest effect on LOWQ and largest effect on LARGEY parameter sets.

• Effect of wake fields causing banana deformation in beams is less pronounced for the ILC parameters than for the TESLA parameters (so far just tested with linear correlated emittance growth)

• Possibility to get 100% luminosity for all parameter sets when performing an offset scan followed by an angle scan

• TO DO: Feed more realistic banana beam (e.g. output from Merlin when available) into Guinea-Pig

Page 16: Offset and angle studies  with Guinea-Pig  

16Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

BACKUP transparencies

Page 17: Offset and angle studies  with Guinea-Pig  

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Offset scan followed by angle scan for best offset

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Page 18: Offset and angle studies  with Guinea-Pig  

18Isabell-A. Melzer-Pellmann ICL 2007, 30.5.-3.6.2007

Offset scan followed by angle scan for best offset

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Offset scan followed by angle scan for best offset

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Offset scan followed by angle scan for best offset

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